{"id":"https://openalex.org/W4384787736","doi":"https://doi.org/10.1109/jsyst.2023.3293119","title":"A Real-Time Application-Oriented Cyber-Physical Systems for Surface Defects Detection","display_name":"A Real-Time Application-Oriented Cyber-Physical Systems for Surface Defects Detection","publication_year":2023,"publication_date":"2023-07-18","ids":{"openalex":"https://openalex.org/W4384787736","doi":"https://doi.org/10.1109/jsyst.2023.3293119"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2023.3293119","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2023.3293119","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031953093","display_name":"Xiliang Tong","orcid":"https://orcid.org/0000-0002-3894-2525"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiliang Tong","raw_affiliation_strings":["Hubei Key Laboratory of Mechanical Transmission and Manufacturing Engineering, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Hubei Key Laboratory of Mechanical Transmission and Manufacturing Engineering, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003734998","display_name":"Zhenyu Zhu","orcid":"https://orcid.org/0000-0002-4594-8802"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenyu Zhu","raw_affiliation_strings":["Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018774195","display_name":"Dongxu Bai","orcid":"https://orcid.org/0000-0002-1137-2737"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongxu Bai","raw_affiliation_strings":["Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035197459","display_name":"Bo Tao","orcid":"https://orcid.org/0000-0002-5886-1992"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Tao","raw_affiliation_strings":["Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016257935","display_name":"Juntong Yun","orcid":"https://orcid.org/0000-0003-3210-9257"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juntong Yun","raw_affiliation_strings":["Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100352148","display_name":"Xin Liu","orcid":"https://orcid.org/0000-0001-8156-2782"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Liu","raw_affiliation_strings":["Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102918414","display_name":"Guojun Zhao","orcid":"https://orcid.org/0000-0003-4336-1431"},"institutions":[{"id":"https://openalex.org/I43922553","display_name":"Wuhan University of Science and Technology","ror":"https://ror.org/00e4hrk88","country_code":"CN","type":"education","lineage":["https://openalex.org/I43922553"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guojun Zhao","raw_affiliation_strings":["Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Metallurgical Equipment and Control Technology, Wuhan University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I43922553"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5031953093"],"corresponding_institution_ids":["https://openalex.org/I43922553"],"apc_list":null,"apc_paid":null,"fwci":0.4153,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67439591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"17","issue":"4","first_page":"5335","last_page":"5345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9728999733924866,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6926815509796143},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5963156223297119},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5760045051574707},{"id":"https://openalex.org/keywords/pyramid","display_name":"Pyramid (geometry)","score":0.5595859885215759},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5090038776397705},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.49087101221084595},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4566468596458435},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.34826821088790894}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6926815509796143},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5963156223297119},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5760045051574707},{"id":"https://openalex.org/C142575187","wikidata":"https://www.wikidata.org/wiki/Q3358290","display_name":"Pyramid (geometry)","level":2,"score":0.5595859885215759},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5090038776397705},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.49087101221084595},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4566468596458435},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.34826821088790894},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2023.3293119","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2023.3293119","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5899999737739563,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W1975089519","https://openalex.org/W2133564696","https://openalex.org/W2193145675","https://openalex.org/W2194775991","https://openalex.org/W2302086703","https://openalex.org/W2324965078","https://openalex.org/W2508741746","https://openalex.org/W2549139847","https://openalex.org/W2565639579","https://openalex.org/W2603986758","https://openalex.org/W2884585870","https://openalex.org/W2922509574","https://openalex.org/W2948300571","https://openalex.org/W2955058313","https://openalex.org/W2963495494","https://openalex.org/W2963544187","https://openalex.org/W2982220924","https://openalex.org/W3016719260","https://openalex.org/W3034552520","https://openalex.org/W3106250896","https://openalex.org/W3118639016","https://openalex.org/W3119943851","https://openalex.org/W3166728591","https://openalex.org/W3201057920","https://openalex.org/W4214666412","https://openalex.org/W4280526090","https://openalex.org/W4285111235","https://openalex.org/W4297810817","https://openalex.org/W4309825916","https://openalex.org/W4312443924","https://openalex.org/W4312830493","https://openalex.org/W4313485531","https://openalex.org/W6637373629","https://openalex.org/W6679434410","https://openalex.org/W6684191040","https://openalex.org/W6753038380"],"related_works":["https://openalex.org/W4206776094","https://openalex.org/W3121197456","https://openalex.org/W4386159726","https://openalex.org/W2601157893","https://openalex.org/W2131735617","https://openalex.org/W2373006798","https://openalex.org/W2056912418","https://openalex.org/W2123759770","https://openalex.org/W2033213769","https://openalex.org/W2811390910"],"abstract_inverted_index":{"The":[0,77,183],"new":[1],"generation":[2],"of":[3,29,37,48,72,147,160,172],"industrial":[4,38,74],"productions":[5],"is":[6],"digitized,":[7],"adaptable,":[8],"flexible,":[9],"and":[10,17,32,50,60,88,94,113,141,166,180],"intelligent.":[11],"Product":[12],"inspection":[13,36],"uses":[14],"multisourced":[15],"information":[16],"intelligent":[18,89],"algorithm":[19],"to":[20,45,54,68,118,144,156,189],"recognize":[21],"anomalies.":[22],"Cyber-physical":[23],"systems":[24],"(CPSs)":[25],"are":[26,43,52,164],"fundamental":[27],"parts":[28],"smart":[30],"production":[31],"inspection.":[33,76],"In":[34],"surface":[35,75],"products,":[39],"some":[40],"defects,":[41],"which":[42],"sensitive":[44],"the":[46,70,116,130,170,173],"direction":[47],"light":[49,97],"viewer,":[51],"difficult":[53],"be":[55,187],"recognized":[56],"under":[57,103],"fixed":[58],"illumination":[59,104],"observation.":[61],"This":[62],"article":[63],"presents":[64],"a":[65,80,92,120,125,152],"novel":[66],"approach":[67],"solve":[69],"problem":[71],"general":[73],"solution":[78],"includes":[79],"lighting":[81],"scheme,":[82],"multichannel":[83,148,177],"image":[84,86],"capture,":[85],"splitting,":[87],"classification.":[90],"Using":[91],"flexible":[93],"controllable":[95],"hemispherical":[96],"source,":[98],"we":[99,109,123,137],"capture":[100],"photometric":[101,178],"images":[102,117,179],"at":[105],"specified":[106],"elevations.":[107],"Then,":[108],"conduct":[110],"slice":[111],"splitting":[112],"labeling":[114],"on":[115,129],"build":[119,124],"dataset.":[121],"Next,":[122],"classification":[126,181],"network":[127,155],"based":[128],"ResNet":[131],"backbone.":[132],"To":[133],"achieve":[134],"better":[135],"performance,":[136],"embed":[138],"global":[139],"squeeze":[140],"excitation":[142],"module":[143],"aggregate":[145],"features":[146],"images.":[149],"Simultaneously":[150],"add":[151],"feature":[153,158],"pyramid":[154],"yield":[157],"fusion":[159],"multiscales.":[161],"Comparative":[162],"experiments":[163],"conducted":[165],"experimental":[167],"results":[168],"highlight":[169],"superiority":[171],"proposed":[174],"scheme":[175],"combining":[176],"model.":[182],"CPSs":[184],"can":[185],"also":[186],"applied":[188],"other":[190],"defect":[191],"diagnostics\u2019":[192],"scenarios.":[193]},"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}