{"id":"https://openalex.org/W4319989990","doi":"https://doi.org/10.1109/jsyst.2023.3234655","title":"Using Deep Transfer Learning Technique to Protect Electrical Distribution Systems Against High-Impedance Faults","display_name":"Using Deep Transfer Learning Technique to Protect Electrical Distribution Systems Against High-Impedance Faults","publication_year":2023,"publication_date":"2023-01-24","ids":{"openalex":"https://openalex.org/W4319989990","doi":"https://doi.org/10.1109/jsyst.2023.3234655"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2023.3234655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2023.3234655","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058133166","display_name":"Amin Mohammadi","orcid":"https://orcid.org/0000-0002-9233-8070"},"institutions":[{"id":"https://openalex.org/I39268498","display_name":"University of Isfahan","ror":"https://ror.org/05h9t7759","country_code":"IR","type":"education","lineage":["https://openalex.org/I39268498"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Amin Mohammadi","raw_affiliation_strings":["Department of Electrical Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran","institution_ids":["https://openalex.org/I39268498"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032893879","display_name":"Mohsen Jannati","orcid":null},"institutions":[{"id":"https://openalex.org/I39268498","display_name":"University of Isfahan","ror":"https://ror.org/05h9t7759","country_code":"IR","type":"education","lineage":["https://openalex.org/I39268498"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohsen Jannati","raw_affiliation_strings":["Department of Electrical Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran","institution_ids":["https://openalex.org/I39268498"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054400130","display_name":"Mohammadreza Shams","orcid":null},"institutions":[{"id":"https://openalex.org/I39268498","display_name":"University of Isfahan","ror":"https://ror.org/05h9t7759","country_code":"IR","type":"education","lineage":["https://openalex.org/I39268498"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohammadreza Shams","raw_affiliation_strings":["Department of Computer Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran","institution_ids":["https://openalex.org/I39268498"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5058133166"],"corresponding_institution_ids":["https://openalex.org/I39268498"],"apc_list":null,"apc_paid":null,"fwci":4.5374,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.95131781,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"17","issue":"2","first_page":"3160","last_page":"3171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.5548495054244995},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.5512519478797913},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.532779335975647},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5177199244499207},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4794653654098511},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4762934744358063},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.4581642746925354},{"id":"https://openalex.org/keywords/data-pre-processing","display_name":"Data pre-processing","score":0.4343760013580322},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.42191535234451294},{"id":"https://openalex.org/keywords/emtp","display_name":"Emtp","score":0.4141864478588104},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38489410281181335},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3800628185272217},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.34867697954177856},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3346315026283264},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.20402002334594727},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11073148250579834}],"concepts":[{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.5548495054244995},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.5512519478797913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.532779335975647},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5177199244499207},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4794653654098511},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4762934744358063},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.4581642746925354},{"id":"https://openalex.org/C10551718","wikidata":"https://www.wikidata.org/wiki/Q5227332","display_name":"Data pre-processing","level":2,"score":0.4343760013580322},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.42191535234451294},{"id":"https://openalex.org/C2778363592","wikidata":"https://www.wikidata.org/wiki/Q5374837","display_name":"Emtp","level":4,"score":0.4141864478588104},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38489410281181335},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3800628185272217},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.34867697954177856},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3346315026283264},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.20402002334594727},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11073148250579834},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2023.3234655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2023.3234655","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W242966853","https://openalex.org/W1585912192","https://openalex.org/W1979415285","https://openalex.org/W2012264121","https://openalex.org/W2074504329","https://openalex.org/W2321674405","https://openalex.org/W2506219324","https://openalex.org/W2542145506","https://openalex.org/W2612591972","https://openalex.org/W2729249418","https://openalex.org/W2790561973","https://openalex.org/W2794062479","https://openalex.org/W2800567623","https://openalex.org/W2805867132","https://openalex.org/W2902940846","https://openalex.org/W2914467786","https://openalex.org/W2928842276","https://openalex.org/W2995926236","https://openalex.org/W3014267908","https://openalex.org/W3045568746","https://openalex.org/W3068347772","https://openalex.org/W3087971132","https://openalex.org/W3128195104","https://openalex.org/W3156205142","https://openalex.org/W3160808865","https://openalex.org/W3203203917","https://openalex.org/W3208058299","https://openalex.org/W3215167555","https://openalex.org/W3216955825","https://openalex.org/W4224292371","https://openalex.org/W4229081533"],"related_works":["https://openalex.org/W2989490741","https://openalex.org/W138569904","https://openalex.org/W2367545121","https://openalex.org/W4248881655","https://openalex.org/W2482165163","https://openalex.org/W3010890513","https://openalex.org/W3092506759","https://openalex.org/W2390914021","https://openalex.org/W2389417819","https://openalex.org/W3195278891"],"abstract_inverted_index":{"The":[0,45,150],"dependence":[1],"of":[2,12,53,59,74,79,136,153,170,178,182],"high-impedance":[3],"faults":[4],"(HIFs)":[5],"detection":[6,66,138],"methods":[7],"on":[8,33],"a":[9,18,28,50,71,179],"large":[10],"amount":[11,52,73,181],"training":[13,184],"data":[14,54,78,103,108],"has":[15],"always":[16],"been":[17],"fundamental":[19],"problem":[20],"in":[21,162],"electrical":[22,91],"distribution":[23,92,160],"systems.":[24],"This":[25],"article":[26],"proposes":[27],"novel":[29],"protection":[30,47,173],"system":[31,48,174],"based":[32],"the":[34,57,64,80,83,89,95,101,110,120,129,134,146,154,167,171,176],"transfer":[35],"learning":[36],"technique":[37],"and":[38,100,139,158,164],"GoogleNet":[39,61,121,130,147],"architecture":[40,62,122],"to":[41,55,63,106,119,127],"reduce":[42],"this":[43,69],"dependence.":[44],"proposed":[46,172],"uses":[49],"small":[51,72,180],"extend":[56],"knowledge":[58],"pretrained":[60,131,148],"HIF":[65],"problem.":[67],"In":[68],"system,":[70],"third":[75],"harmonic":[76],"angle":[77],"current":[81],"at":[82],"measurement":[84],"point":[85],"are":[86,104,117],"obtained":[87],"from":[88],"understudy":[90],"system.":[93],"Then,":[94],"preprocessing":[96],"phase":[97],"is":[98,141],"performed,":[99],"extracted":[102],"converted":[105,115],"image":[107],"using":[109],"Wigner\u2013Ville":[111],"distribution.":[112],"Afterward,":[113],"these":[114],"images":[116],"fed":[118],"as":[123],"an":[124],"input":[125,183],"dataset":[126],"update":[128],"knowledge.":[132,149],"Finally,":[133],"process":[135],"fault":[137],"classification":[140],"accomplished":[142],"only":[143],"by":[144],"transferring":[145],"simulation":[151],"results":[152],"modified":[155],"IEEE":[156],"13-bus":[157],"34-bus":[159],"systems":[161],"EMTP-RV":[163],"MATLAB":[165],"indicate":[166],"high":[168],"accuracy":[169],"despite":[175],"use":[177],"data.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":5}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}