{"id":"https://openalex.org/W4312307942","doi":"https://doi.org/10.1109/jsyst.2022.3205179","title":"Remaining Useful Life Estimation Using Fault to Failure Transformation in Process Systems","display_name":"Remaining Useful Life Estimation Using Fault to Failure Transformation in Process Systems","publication_year":2022,"publication_date":"2022-09-27","ids":{"openalex":"https://openalex.org/W4312307942","doi":"https://doi.org/10.1109/jsyst.2022.3205179"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2022.3205179","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2022.3205179","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035022151","display_name":"Rajeevan Arunthavanathan","orcid":"https://orcid.org/0000-0002-9056-2503"},"institutions":[{"id":"https://openalex.org/I130438778","display_name":"Memorial University of Newfoundland","ror":"https://ror.org/04haebc03","country_code":"CA","type":"education","lineage":["https://openalex.org/I130438778"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Rajeevan Arunthavanathan","raw_affiliation_strings":["Centre for Risk, Integrity, and Safety Engineering (C-RISE), Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, NL, Canada"],"raw_orcid":"https://orcid.org/0000-0002-9056-2503","affiliations":[{"raw_affiliation_string":"Centre for Risk, Integrity, and Safety Engineering (C-RISE), Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, NL, Canada","institution_ids":["https://openalex.org/I130438778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014307031","display_name":"Faisal Khan","orcid":"https://orcid.org/0000-0002-5638-4299"},"institutions":[{"id":"https://openalex.org/I4210129728","display_name":"Mary Kay (United States)","ror":"https://ror.org/03qxge436","country_code":"US","type":"company","lineage":["https://openalex.org/I4210129728"]},{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Faisal Khan","raw_affiliation_strings":["Mary Kay O'Connor Process Safety Center, Artie McFerrin Department of Chemical Engineering, Texas A&M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mary Kay O'Connor Process Safety Center, Artie McFerrin Department of Chemical Engineering, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I4210129728","https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080110227","display_name":"Salim Ahmed","orcid":"https://orcid.org/0000-0002-2279-1603"},"institutions":[{"id":"https://openalex.org/I130438778","display_name":"Memorial University of Newfoundland","ror":"https://ror.org/04haebc03","country_code":"CA","type":"education","lineage":["https://openalex.org/I130438778"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Salim Ahmed","raw_affiliation_strings":["Centre for Risk, Integrity, and Safety Engineering (C-RISE), Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, NL, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre for Risk, Integrity, and Safety Engineering (C-RISE), Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, NL, Canada","institution_ids":["https://openalex.org/I130438778"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056369146","display_name":"Syed Imtiaz","orcid":"https://orcid.org/0000-0002-2715-9084"},"institutions":[{"id":"https://openalex.org/I130438778","display_name":"Memorial University of Newfoundland","ror":"https://ror.org/04haebc03","country_code":"CA","type":"education","lineage":["https://openalex.org/I130438778"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Syed Imtiaz","raw_affiliation_strings":["Centre for Risk, Integrity, and Safety Engineering (C-RISE), Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, NL, Canada"],"raw_orcid":"https://orcid.org/0000-0002-2715-9084","affiliations":[{"raw_affiliation_string":"Centre for Risk, Integrity, and Safety Engineering (C-RISE), Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, NL, Canada","institution_ids":["https://openalex.org/I130438778"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2195,"currency":"USD","value_usd":2195},"apc_paid":null,"fwci":0.7924,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.6883158,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"17","issue":"2","first_page":"2512","last_page":"2522"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6976590156555176},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6823141574859619},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5515841245651245},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.5425205826759338},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5347159504890442},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.48684161901474},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4687162935733795},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.45430052280426025},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4317339360713959},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.32674625515937805},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2945537269115448}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6976590156555176},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6823141574859619},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5515841245651245},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.5425205826759338},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5347159504890442},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.48684161901474},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4687162935733795},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.45430052280426025},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4317339360713959},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32674625515937805},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2945537269115448},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2022.3205179","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2022.3205179","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1982275278","https://openalex.org/W1997385464","https://openalex.org/W2004186751","https://openalex.org/W2014685668","https://openalex.org/W2055873761","https://openalex.org/W2056494619","https://openalex.org/W2058304220","https://openalex.org/W2061659083","https://openalex.org/W2102636708","https://openalex.org/W2132029223","https://openalex.org/W2175143722","https://openalex.org/W2195660543","https://openalex.org/W2522747841","https://openalex.org/W2765296483","https://openalex.org/W2772084711","https://openalex.org/W2804880936","https://openalex.org/W2896653736","https://openalex.org/W2904460913","https://openalex.org/W2913243025","https://openalex.org/W2913494600","https://openalex.org/W2950377663","https://openalex.org/W2995450656","https://openalex.org/W2997519437","https://openalex.org/W3000665539","https://openalex.org/W3010795489","https://openalex.org/W3022112205","https://openalex.org/W3025626355","https://openalex.org/W3031774428","https://openalex.org/W3040694753","https://openalex.org/W3042756942","https://openalex.org/W3093893113","https://openalex.org/W3096852947","https://openalex.org/W3104794984","https://openalex.org/W3111588349","https://openalex.org/W3116907792","https://openalex.org/W3122095456","https://openalex.org/W3135639577","https://openalex.org/W3139340856","https://openalex.org/W3152900149","https://openalex.org/W3197391102","https://openalex.org/W6759220098","https://openalex.org/W6788767059"],"related_works":["https://openalex.org/W3021922568","https://openalex.org/W107791777","https://openalex.org/W2351058141","https://openalex.org/W1954252360","https://openalex.org/W4283525651","https://openalex.org/W2351568193","https://openalex.org/W2522130324","https://openalex.org/W4293518553","https://openalex.org/W3132400407","https://openalex.org/W4312307942"],"abstract_inverted_index":{"The":[0,81,126,155],"remaining":[1],"useful":[2],"life":[3],"(RUL)":[4],"plays":[5],"a":[6,30,63,107,122,135],"significant":[7],"role":[8],"in":[9,72],"the":[10,26,45,67,77,90,145,161],"predictive":[11],"maintenance":[12],"of":[13,33,69,92],"process":[14,34,48,70],"systems.":[15,49],"In":[16],"recent":[17],"years,":[18],"data-driven":[19],"approaches":[20],"have":[21],"been":[22],"used":[23],"to":[24,43,65,94,143],"estimate":[25,44,66],"RUL.":[27],"However,":[28],"without":[29],"deeper":[31],"understanding":[32],"systems":[35,71],"and":[36,121,148],"their":[37],"failure":[38,95,149,153],"mechanisms,":[39],"it":[40],"is":[41,83,96,131,141,158],"challenging":[42],"RUL":[46,68,128],"for":[47,151],"This":[50,60],"demands":[51],"an":[52],"approach":[53,157],"that":[54],"integrates":[55],"data":[56],"with":[57,117],"mechanistic":[58,99],"understanding.":[59,100],"article":[61],"proposes":[62],"model":[64,110],"real":[73],"time":[74],"by":[75],"monitoring":[76],"system's":[78],"fault":[79,82,93,115,139,146],"condition.":[80],"modeled":[84,97],"using":[85,98,106,160],"real-time":[86],"observed":[87],"data,":[88],"while":[89],"progression":[91],"These":[101],"steps":[102],"are":[103],"carried":[104],"out":[105],"novel":[108],"mixed":[109],"combining":[111],"machine":[112],"learning-based":[113],"autonomous":[114,127],"diagnosis":[116],"root":[118],"cause":[119],"analysis":[120],"statistical":[123],"degradation":[124],"model.":[125,137],"estimation":[129],"method":[130],"then":[132],"developed":[133,142],"as":[134],"self-learning":[136],"A":[138],"dictionary":[140],"store":[144],"patterns":[147],"margin":[150],"different":[152],"conditions.":[154],"proposed":[156],"benchmarked":[159],"Tennessee":[162],"Eastman":[163],"process.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}