{"id":"https://openalex.org/W4206033477","doi":"https://doi.org/10.1109/jsyst.2021.3132657","title":"Composite Reliability Impacts of Synchrophasor-Based DTR and SIPS Cyber\u2013Physical Systems","display_name":"Composite Reliability Impacts of Synchrophasor-Based DTR and SIPS Cyber\u2013Physical Systems","publication_year":2022,"publication_date":"2022-01-05","ids":{"openalex":"https://openalex.org/W4206033477","doi":"https://doi.org/10.1109/jsyst.2021.3132657"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2021.3132657","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2021.3132657","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025406913","display_name":"Bilkisu Jimada-Ojuolape","orcid":"https://orcid.org/0000-0001-8592-8438"},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]},{"id":"https://openalex.org/I98243723","display_name":"Kwara State University","ror":"https://ror.org/05np2xn95","country_code":"NG","type":"education","lineage":["https://openalex.org/I98243723"]}],"countries":["MY","NG"],"is_corresponding":false,"raw_author_name":"Bilkisu Jimada-Ojuolape","raw_affiliation_strings":["School of Electrical and Electronic Engineering Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia","Department of Electrical and Computer Engineering, Kwara State University, Malete, Nigeria"],"raw_orcid":"https://orcid.org/0000-0001-8592-8438","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia","institution_ids":["https://openalex.org/I139322472"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Kwara State University, Malete, Nigeria","institution_ids":["https://openalex.org/I98243723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042023563","display_name":"Jiashen Teh","orcid":"https://orcid.org/0000-0001-9741-6245"},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Jiashen Teh","raw_affiliation_strings":["School of Electrical and Electronic Engineering Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-9741-6245","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.3107,"has_fulltext":false,"cited_by_count":59,"citation_normalized_percentile":{"value":0.97252926,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"16","issue":"3","first_page":"3927","last_page":"3938"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/smart-grid","display_name":"Smart grid","score":0.7126322984695435},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6236146092414856},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6040146350860596},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.6026328802108765},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.5649802088737488},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.555852472782135},{"id":"https://openalex.org/keywords/cyber-physical-system","display_name":"Cyber-physical system","score":0.5125958323478699},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4854634404182434},{"id":"https://openalex.org/keywords/phasor","display_name":"Phasor","score":0.46100303530693054},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44472774863243103},{"id":"https://openalex.org/keywords/telecommunications-network","display_name":"Telecommunications network","score":0.43967851996421814},{"id":"https://openalex.org/keywords/cascading-failure","display_name":"Cascading failure","score":0.42940741777420044},{"id":"https://openalex.org/keywords/phasor-measurement-unit","display_name":"Phasor measurement unit","score":0.42001938819885254},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.21254515647888184},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.20419400930404663},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11184442043304443}],"concepts":[{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.7126322984695435},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6236146092414856},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6040146350860596},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.6026328802108765},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.5649802088737488},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.555852472782135},{"id":"https://openalex.org/C179768478","wikidata":"https://www.wikidata.org/wiki/Q1120057","display_name":"Cyber-physical system","level":2,"score":0.5125958323478699},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4854634404182434},{"id":"https://openalex.org/C176605952","wikidata":"https://www.wikidata.org/wiki/Q827674","display_name":"Phasor","level":4,"score":0.46100303530693054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44472774863243103},{"id":"https://openalex.org/C192126672","wikidata":"https://www.wikidata.org/wiki/Q1068715","display_name":"Telecommunications network","level":2,"score":0.43967851996421814},{"id":"https://openalex.org/C119323957","wikidata":"https://www.wikidata.org/wiki/Q5048226","display_name":"Cascading failure","level":4,"score":0.42940741777420044},{"id":"https://openalex.org/C2778229166","wikidata":"https://www.wikidata.org/wiki/Q8290","display_name":"Phasor measurement unit","level":5,"score":0.42001938819885254},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.21254515647888184},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.20419400930404663},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11184442043304443},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2021.3132657","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2021.3132657","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":62,"referenced_works":["https://openalex.org/W208605634","https://openalex.org/W1171226771","https://openalex.org/W1486460655","https://openalex.org/W1828314293","https://openalex.org/W1886161614","https://openalex.org/W1981619817","https://openalex.org/W1993733868","https://openalex.org/W1997080377","https://openalex.org/W2002619227","https://openalex.org/W2006989034","https://openalex.org/W2008283137","https://openalex.org/W2020786402","https://openalex.org/W2020798599","https://openalex.org/W2032535610","https://openalex.org/W2041851681","https://openalex.org/W2044245157","https://openalex.org/W2048318707","https://openalex.org/W2056636551","https://openalex.org/W2063725349","https://openalex.org/W2087768126","https://openalex.org/W2090181170","https://openalex.org/W2106424475","https://openalex.org/W2116279256","https://openalex.org/W2124588089","https://openalex.org/W2144734347","https://openalex.org/W2167012864","https://openalex.org/W2335049294","https://openalex.org/W2342958323","https://openalex.org/W2344407715","https://openalex.org/W2344903959","https://openalex.org/W2554152365","https://openalex.org/W2739462569","https://openalex.org/W2741617857","https://openalex.org/W2763834107","https://openalex.org/W2767867947","https://openalex.org/W2795678459","https://openalex.org/W2805275493","https://openalex.org/W2822569858","https://openalex.org/W2855059504","https://openalex.org/W2886315178","https://openalex.org/W2897016432","https://openalex.org/W2903986087","https://openalex.org/W2917582391","https://openalex.org/W2922198256","https://openalex.org/W2927922269","https://openalex.org/W2944211354","https://openalex.org/W2955002187","https://openalex.org/W2964782836","https://openalex.org/W2970989911","https://openalex.org/W2973828582","https://openalex.org/W3003724466","https://openalex.org/W3026928397","https://openalex.org/W3039302968","https://openalex.org/W3041849698","https://openalex.org/W3049708287","https://openalex.org/W3097008880","https://openalex.org/W3125669433","https://openalex.org/W3126009018","https://openalex.org/W3130179520","https://openalex.org/W4238810961","https://openalex.org/W4251374310","https://openalex.org/W4293860495"],"related_works":["https://openalex.org/W2564500233","https://openalex.org/W2028471916","https://openalex.org/W2008779876","https://openalex.org/W2027377403","https://openalex.org/W2096980798","https://openalex.org/W1538400183","https://openalex.org/W2547260311","https://openalex.org/W2154842468","https://openalex.org/W1589114377","https://openalex.org/W1963750642"],"abstract_inverted_index":{"The":[0,139],"integration":[1],"of":[2,21,57,62,66,103,137,155,194],"smart":[3,68],"infrastructures":[4],"that":[5,160],"facilitate":[6],"two-way":[7],"communication":[8,12],"via":[9],"information":[10],"and":[11,19,34,47,82,100,116],"technology":[13],"(ICT)":[14],"has":[15,76],"enhanced":[16],"the":[17,22,54,58,63,101,131,135,149,153,166,175],"efficiency":[18],"sustainability":[20],"power":[23,74],"network.":[24,59],"However,":[25],"technologies,":[26],"such":[27],"as":[28],"dynamic":[29],"thermal":[30],"rating":[31],"(DTR)":[32],"systems":[33],"system":[35,84],"integrity":[36],"protection":[37],"schemes":[38],"(SIPS),":[39],"have":[40],"disadvantages,":[41],"including":[42],"infrastructure":[43],"failures,":[44],"cyber\u2013physical":[45],"interdependencies,":[46],"cyber":[48],"intrusions.":[49],"These":[50],"disadvantages":[51],"contribute":[52],"to":[53,133,182,192],"reduced":[55],"reliability":[56,64,108],"Comprehensive":[60],"exploration":[61],"impacts":[65],"multiple":[67],"grid":[69],"technologies":[70],"on":[71,106,130],"a":[72,117,161],"single":[73],"network":[75,107,145,179],"not":[77],"been":[78],"conducted.":[79],"A":[80,111],"DTR":[81],"SIPS":[83,163],"integrating":[85],"wide":[86],"area":[87],"monitoring":[88],"functions":[89],"using":[90],"phasor":[91],"measurement":[92],"units":[93],"(PMUs)":[94],"is":[95,109,128,141],"presented":[96],"in":[97,123,147,152,177,188],"this":[98,124],"study,":[99],"effect":[102],"ICT":[104],"contingencies":[105],"investigated.":[110],"Monte":[112],"Carlo":[113],"simulation":[114],"approach":[115,127,140],"scenario":[118],"reduction":[119],"technique":[120],"are":[121],"utilized":[122],"article.":[125],"This":[126],"evaluated":[129],"IEEE-RTS":[132],"demonstrate":[134,159],"advantages":[136],"ICTs.":[138],"suitable":[142],"for":[143],"different":[144],"topologies,":[146],"which":[148],"difference":[150],"lies":[151],"number":[154],"required":[156],"PMUs.":[157],"Results":[158],"reliable":[162],"can":[164],"minimize":[165],"aging":[167,180],"process":[168],"while":[169],"slightly":[170],"influencing":[171],"load":[172,189],"curtailment":[173],"despite":[174,196],"increase":[176],"overall":[178],"due":[181,191],"DTR.":[183],"PMU":[184],"functional":[185],"failures":[186],"result":[187],"loss":[190,193],"observability":[195],"their":[197],"high":[198],"availability.":[199]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":12},{"year":2024,"cited_by_count":20},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}