{"id":"https://openalex.org/W3133402591","doi":"https://doi.org/10.1109/jsyst.2021.3056536","title":"Fault Diagnosis of Power Systems Using Visualized Similarity Images and Improved Convolution Neural Networks","display_name":"Fault Diagnosis of Power Systems Using Visualized Similarity Images and Improved Convolution Neural Networks","publication_year":2021,"publication_date":"2021-02-23","ids":{"openalex":"https://openalex.org/W3133402591","doi":"https://doi.org/10.1109/jsyst.2021.3056536","mag":"3133402591"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2021.3056536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2021.3056536","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051404294","display_name":"Ji Han","orcid":"https://orcid.org/0000-0003-2579-5463"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ji Han","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-2579-5463","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074301087","display_name":"Shihong Miao","orcid":"https://orcid.org/0000-0001-8676-3292"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shihong Miao","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-8676-3292","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032165634","display_name":"Yaowang Li","orcid":"https://orcid.org/0000-0002-4100-0774"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaowang Li","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-4100-0774","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003529966","display_name":"Weichen Yang","orcid":"https://orcid.org/0000-0002-3175-3799"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weichen Yang","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000494052","display_name":"Haoran Yin","orcid":"https://orcid.org/0000-0002-3648-9712"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoran Yin","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5051404294"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":4.9376,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.95645307,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"16","issue":"1","first_page":"185","last_page":"196"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6305298209190369},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6153104305267334},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5672330260276794},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5376758575439453},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5287922024726868},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4634333550930023},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.43778663873672485},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3890185058116913},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3313971161842346},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.324207603931427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1959238052368164},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.08181026577949524}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6305298209190369},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6153104305267334},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5672330260276794},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5376758575439453},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5287922024726868},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4634333550930023},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.43778663873672485},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3890185058116913},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3313971161842346},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.324207603931427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1959238052368164},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.08181026577949524},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2021.3056536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2021.3056536","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W805140329","https://openalex.org/W2062184241","https://openalex.org/W2109255472","https://openalex.org/W2134514757","https://openalex.org/W2468457481","https://openalex.org/W2513676771","https://openalex.org/W2604220782","https://openalex.org/W2734927467","https://openalex.org/W2763583057","https://openalex.org/W2766843420","https://openalex.org/W2768866948","https://openalex.org/W2801991210","https://openalex.org/W2885999677","https://openalex.org/W2911027487","https://openalex.org/W2920852583","https://openalex.org/W2940908842","https://openalex.org/W2946375525","https://openalex.org/W2953109280","https://openalex.org/W2955362251","https://openalex.org/W2965147845","https://openalex.org/W2965875348","https://openalex.org/W2978717497","https://openalex.org/W2981344804","https://openalex.org/W3020745304","https://openalex.org/W3024280684","https://openalex.org/W3045163438","https://openalex.org/W3091704112","https://openalex.org/W4244148623","https://openalex.org/W4244516622"],"related_works":["https://openalex.org/W2748454020","https://openalex.org/W3181746755","https://openalex.org/W3016958897","https://openalex.org/W4283379348","https://openalex.org/W4312417841","https://openalex.org/W2735477435","https://openalex.org/W3045739591","https://openalex.org/W2767651786","https://openalex.org/W2912288872","https://openalex.org/W564581980"],"abstract_inverted_index":{"Fault":[0],"diagnosis":[1],"is":[2,100,199],"important":[3],"to":[4,32,59,64,113,121,209],"stable":[5],"operation":[6],"of":[7,19,35,73,148,156,177],"power":[8,36,87,171],"systems,":[9],"and":[10,50,54,97,102,134,151,204,207],"the":[11,25,33,44,51,65,103,107,114,122,129,141,146,149,154,157,170,175,178,193,210],"machine-learning-based":[12],"fault-diagnosis":[13,74,84,158,183],"models":[14,52,75,184],"were":[15],"widely":[16],"studied":[17],"because":[18],"their":[20],"strong":[21],"generalization":[22],"ability.":[23],"However,":[24],"model":[26,85,159,195],"structures":[27],"are":[28,40,56,111,119,138,166,185],"generally":[29],"designed":[30],"according":[31],"topology":[34,78],"systems.":[37,67,88,172],"Once":[38],"there":[39,165],"changes":[41,168],"in":[42,140,169,202],"topology,":[43],"system":[45,77],"fault":[46],"characteristics":[47],"might":[48],"change,":[49],"structure":[53,155,198],"parameters":[55,211],"often":[57],"required":[58],"be":[60],"adjusted":[61],"for":[62,86,125,187],"applying":[63],"new":[66,91],"To":[68,173],"avoid":[69],"frequent":[70],"adjustment":[71],"work":[72],"when":[76],"changes,":[79],"we":[80],"propose":[81],"a":[82,90],"novel":[83],"First,":[89],"data":[92],"preprocessing":[93],"using":[94],"gradient":[95,104],"calculation":[96],"similarity":[98,116],"assessment":[99],"presented,":[101],"similarities":[105],"among":[106],"multichannel":[108],"electrical":[109],"signals":[110],"converted":[112],"visualized":[115],"images,":[117],"which":[118],"fed":[120],"neural":[123,143],"network":[124],"further":[126],"processing.":[127],"Second,":[128],"spatial":[130],"pyramid":[131],"pooling":[132],"(SPP)":[133],"hashing":[135],"classifier":[136],"(HC)":[137],"used":[139,186],"convolution":[142],"network.":[144],"With":[145],"aid":[147],"SPP":[150],"HC":[152],"techniques,":[153],"can":[160],"maintain":[161],"unchanged":[162,197],"even":[163],"though":[164],"topological":[167],"validate":[174],"effectiveness":[176],"proposed":[179,194],"model,":[180],"several":[181],"state-of-the-art":[182],"comparison.":[188],"The":[189],"results":[190],"show":[191],"that":[192],"with":[196],"well":[200],"performed":[201],"accuracy":[203],"noise":[205],"immunity,":[206],"friendly":[208],"setting.":[212]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}