{"id":"https://openalex.org/W3018973156","doi":"https://doi.org/10.1109/jsyst.2020.2983376","title":"Degradation Modeling and Uncertainty Quantification for System-Level Prognostics","display_name":"Degradation Modeling and Uncertainty Quantification for System-Level Prognostics","publication_year":2020,"publication_date":"2020-04-20","ids":{"openalex":"https://openalex.org/W3018973156","doi":"https://doi.org/10.1109/jsyst.2020.2983376","mag":"3018973156"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2020.2983376","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2020.2983376","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058936834","display_name":"Ferhat Tamssaouet","orcid":"https://orcid.org/0000-0003-2664-3138"},"institutions":[{"id":"https://openalex.org/I17866349","display_name":"Universit\u00e9 F\u00e9d\u00e9rale de Toulouse Midi-Pyr\u00e9n\u00e9es","ror":"https://ror.org/004raaa70","country_code":"FR","type":"education","lineage":["https://openalex.org/I17866349"]},{"id":"https://openalex.org/I205747304","display_name":"Institut National Polytechnique de Toulouse","ror":"https://ror.org/033p9g875","country_code":"FR","type":"education","lineage":["https://openalex.org/I205747304"]},{"id":"https://openalex.org/I4210130517","display_name":"Laboratoire G\u00e9nie de Production","ror":"https://ror.org/039aqbp11","country_code":"FR","type":"facility","lineage":["https://openalex.org/I4210130517","https://openalex.org/I4405260803"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ferhat Tamssaouet","raw_affiliation_strings":["Laboratoire G\u00e9nie de Production, Universit\u00e9 de Toulouse, INP-ENIT, Tarbes, France"],"raw_orcid":"https://orcid.org/0000-0003-2664-3138","affiliations":[{"raw_affiliation_string":"Laboratoire G\u00e9nie de Production, Universit\u00e9 de Toulouse, INP-ENIT, Tarbes, France","institution_ids":["https://openalex.org/I17866349","https://openalex.org/I205747304","https://openalex.org/I4210130517"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013628132","display_name":"Khanh T.P. Nguyen","orcid":"https://orcid.org/0000-0001-8184-8238"},"institutions":[{"id":"https://openalex.org/I17866349","display_name":"Universit\u00e9 F\u00e9d\u00e9rale de Toulouse Midi-Pyr\u00e9n\u00e9es","ror":"https://ror.org/004raaa70","country_code":"FR","type":"education","lineage":["https://openalex.org/I17866349"]},{"id":"https://openalex.org/I205747304","display_name":"Institut National Polytechnique de Toulouse","ror":"https://ror.org/033p9g875","country_code":"FR","type":"education","lineage":["https://openalex.org/I205747304"]},{"id":"https://openalex.org/I4210130517","display_name":"Laboratoire G\u00e9nie de Production","ror":"https://ror.org/039aqbp11","country_code":"FR","type":"facility","lineage":["https://openalex.org/I4210130517","https://openalex.org/I4405260803"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Khanh T. P. Nguyen","raw_affiliation_strings":["Laboratoire G\u00e9nie de Production, Universit\u00e9 de Toulouse, INP-ENIT, Tarbes, France"],"raw_orcid":"https://orcid.org/0000-0001-8184-8238","affiliations":[{"raw_affiliation_string":"Laboratoire G\u00e9nie de Production, Universit\u00e9 de Toulouse, INP-ENIT, Tarbes, France","institution_ids":["https://openalex.org/I17866349","https://openalex.org/I205747304","https://openalex.org/I4210130517"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078493275","display_name":"Kamal Medjaher","orcid":"https://orcid.org/0000-0001-7895-5569"},"institutions":[{"id":"https://openalex.org/I17866349","display_name":"Universit\u00e9 F\u00e9d\u00e9rale de Toulouse Midi-Pyr\u00e9n\u00e9es","ror":"https://ror.org/004raaa70","country_code":"FR","type":"education","lineage":["https://openalex.org/I17866349"]},{"id":"https://openalex.org/I205747304","display_name":"Institut National Polytechnique de Toulouse","ror":"https://ror.org/033p9g875","country_code":"FR","type":"education","lineage":["https://openalex.org/I205747304"]},{"id":"https://openalex.org/I4210130517","display_name":"Laboratoire G\u00e9nie de Production","ror":"https://ror.org/039aqbp11","country_code":"FR","type":"facility","lineage":["https://openalex.org/I4210130517","https://openalex.org/I4405260803"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Kamal Medjaher","raw_affiliation_strings":["Laboratoire G\u00e9nie de Production, Universit\u00e9 de Toulouse, INP-ENIT, Tarbes, France"],"raw_orcid":"https://orcid.org/0000-0001-7895-5569","affiliations":[{"raw_affiliation_string":"Laboratoire G\u00e9nie de Production, Universit\u00e9 de Toulouse, INP-ENIT, Tarbes, France","institution_ids":["https://openalex.org/I17866349","https://openalex.org/I205747304","https://openalex.org/I4210130517"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035859358","display_name":"Marcos E. Orchard","orcid":"https://orcid.org/0000-0003-4778-2719"},"institutions":[{"id":"https://openalex.org/I69737025","display_name":"University of Chile","ror":"https://ror.org/047gc3g35","country_code":"CL","type":"education","lineage":["https://openalex.org/I69737025"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Marcos E. Orchard","raw_affiliation_strings":["Department of Electrical Engineering, University of Chile, Santiago, Chile"],"raw_orcid":"https://orcid.org/0000-0003-4778-2719","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Chile, Santiago, Chile","institution_ids":["https://openalex.org/I69737025"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2045,"currency":"USD","value_usd":2045},"apc_paid":null,"fwci":1.5338,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.79939837,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"15","issue":"2","first_page":"1628","last_page":"1639"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.9898022413253784},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7399414777755737},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.7219668626785278},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6208000779151917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44332408905029297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39339959621429443},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.34836214780807495}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.9898022413253784},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7399414777755737},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.7219668626785278},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6208000779151917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44332408905029297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39339959621429443},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.34836214780807495},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jsyst.2020.2983376","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2020.2983376","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-04775717v1","is_oa":false,"landing_page_url":"https://hal.science/hal-04775717","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Systems Journal, 2021, 15 (2), pp.1628-1639. ⟨10.1109/JSYST.2020.2983376⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W67012386","https://openalex.org/W269977059","https://openalex.org/W296311487","https://openalex.org/W340263924","https://openalex.org/W1567451721","https://openalex.org/W1977856930","https://openalex.org/W1988117495","https://openalex.org/W2000743683","https://openalex.org/W2007655149","https://openalex.org/W2019732711","https://openalex.org/W2033800551","https://openalex.org/W2058817067","https://openalex.org/W2061060631","https://openalex.org/W2107940281","https://openalex.org/W2124128849","https://openalex.org/W2126736494","https://openalex.org/W2145769223","https://openalex.org/W2160337655","https://openalex.org/W2166748451","https://openalex.org/W2405322854","https://openalex.org/W2417319048","https://openalex.org/W2514683513","https://openalex.org/W2524288124","https://openalex.org/W2546933409","https://openalex.org/W2587872487","https://openalex.org/W2593912973","https://openalex.org/W2624573431","https://openalex.org/W2762060515","https://openalex.org/W2795099492","https://openalex.org/W2888331298","https://openalex.org/W2890234630","https://openalex.org/W2894508122","https://openalex.org/W2896845388","https://openalex.org/W2914073730","https://openalex.org/W2944364052","https://openalex.org/W2980476806","https://openalex.org/W3148480311","https://openalex.org/W4288279880","https://openalex.org/W6602692331","https://openalex.org/W6609909086","https://openalex.org/W6634018776","https://openalex.org/W6725857639","https://openalex.org/W6756078123","https://openalex.org/W6840270702"],"related_works":["https://openalex.org/W2557573737","https://openalex.org/W2383842997","https://openalex.org/W2143585755","https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2758516947"],"abstract_inverted_index":{"Modern":[0],"systems,":[1],"that":[2],"are":[3,77,115],"often":[4],"constituted":[5],"of":[6,38,94,103,126,133],"different":[7,54],"interacting":[8],"components,":[9],"have":[10],"increasing":[11],"requirements":[12],"for":[13,160],"improving":[14],"availability":[15],"and":[16,30,40,48,52,65,92,109,131],"safety":[17],"when":[18],"suffering":[19],"unanticipated":[20],"failures.":[21],"Therefore,":[22],"one":[23],"needs":[24],"to":[25,72,88,181,185],"continuously":[26],"monitor":[27],"them,":[28],"estimate":[29],"predict":[31],"their":[32],"health":[33,41],"states":[34],"through":[35],"the":[36,58,61,66,95,101,123,127,139,149,155,164,173],"implementation":[37],"prognostics":[39,96,114],"management":[42],"processes.":[43],"To":[44],"make":[45],"this":[46,99,118],"estimation":[47],"prediction":[49],"more":[50,78],"relevant":[51],"accurate,":[53],"issues,":[55],"such":[56],"as":[57],"component":[59,73,104],"interactions,":[60,105],"profile":[62,106],"mission":[63,107],"impacts,":[64,108],"uncertainties,":[67],"should":[68],"be":[69],"considered.":[70],"Compared":[71],"level,":[74],"these":[75],"issues":[76],"challenging":[79],"in":[80,112],"system-level":[81,113],"prognostics.":[82],"Their":[83],"resolution":[84],"is":[85,136,142,158,169,179],"then":[86],"essential":[87],"improve":[89],"reliability,":[90],"accuracy,":[91],"precision":[93],"results.":[97],"In":[98],"article,":[100],"problems":[102],"uncertainty":[110],"quantification":[111],"addressed.":[116],"For":[117],"purpose,":[119],"a":[120,182],"method":[121],"using":[122,144],"modeling":[124],"framework":[125],"inoperability":[128,141,157],"input-output":[129],"model":[130],"composed":[132],"three":[134],"steps":[135],"proposed.":[137],"First,":[138],"system":[140,165,174,184],"estimated":[143,156],"particle":[145],"filtering":[146],"while":[147],"considering":[148],"interactions":[150],"between":[151],"its":[152,187],"components.":[153],"Then,":[154],"propagated":[159],"long-term":[161],"predictions.":[162],"Finally,":[163],"remaining":[166],"useful":[167],"life":[168],"calculated":[170],"depending":[171],"on":[172],"configuration.":[175],"The":[176],"proposed":[177],"methodology":[178],"applied":[180],"mechatronic":[183],"show":[186],"effectiveness.":[188]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}