{"id":"https://openalex.org/W2805788092","doi":"https://doi.org/10.1109/jsyst.2018.2837748","title":"DC Ring Bus Microgrid Protection Using the Oscillation Frequency and Transient Power","display_name":"DC Ring Bus Microgrid Protection Using the Oscillation Frequency and Transient Power","publication_year":2018,"publication_date":"2018-06-05","ids":{"openalex":"https://openalex.org/W2805788092","doi":"https://doi.org/10.1109/jsyst.2018.2837748","mag":"2805788092"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2018.2837748","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2018.2837748","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102884253","display_name":"Rabindra Mohanty","orcid":"https://orcid.org/0000-0003-3514-850X"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Rabindra Mohanty","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India"],"raw_orcid":"https://orcid.org/0000-0003-3514-850X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063136321","display_name":"Ashok Kumar Pradhan","orcid":"https://orcid.org/0000-0001-8438-9911"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ashok Kumar Pradhan","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India"],"raw_orcid":"https://orcid.org/0000-0001-8438-9911","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102884253"],"corresponding_institution_ids":["https://openalex.org/I145894827"],"apc_list":null,"apc_paid":null,"fwci":6.7427,"has_fulltext":false,"cited_by_count":99,"citation_normalized_percentile":{"value":0.9723434,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"13","issue":"1","first_page":"875","last_page":"884"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microgrid","display_name":"Microgrid","score":0.8956907987594604},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7817445397377014},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6794334053993225},{"id":"https://openalex.org/keywords/relay","display_name":"Relay","score":0.6771671772003174},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5746344327926636},{"id":"https://openalex.org/keywords/busbar","display_name":"Busbar","score":0.5601718425750732},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.527355968952179},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47113293409347534},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.46799013018608093},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.46406111121177673},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45452773571014404},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4096857011318207},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35239917039871216},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3161976933479309},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3120988607406616}],"concepts":[{"id":"https://openalex.org/C2776784348","wikidata":"https://www.wikidata.org/wiki/Q5762595","display_name":"Microgrid","level":3,"score":0.8956907987594604},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7817445397377014},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6794334053993225},{"id":"https://openalex.org/C2778156585","wikidata":"https://www.wikidata.org/wiki/Q174053","display_name":"Relay","level":3,"score":0.6771671772003174},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5746344327926636},{"id":"https://openalex.org/C192690417","wikidata":"https://www.wikidata.org/wiki/Q1030817","display_name":"Busbar","level":2,"score":0.5601718425750732},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.527355968952179},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47113293409347534},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.46799013018608093},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.46406111121177673},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45452773571014404},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4096857011318207},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35239917039871216},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3161976933479309},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3120988607406616},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2018.2837748","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2018.2837748","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320326272","display_name":"Department of Science and Technology, Philippines","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W408694221","https://openalex.org/W637565114","https://openalex.org/W1560064566","https://openalex.org/W1849484999","https://openalex.org/W2036302375","https://openalex.org/W2049447438","https://openalex.org/W2055090962","https://openalex.org/W2056194767","https://openalex.org/W2069032722","https://openalex.org/W2073887634","https://openalex.org/W2080326549","https://openalex.org/W2081321884","https://openalex.org/W2089212322","https://openalex.org/W2090416666","https://openalex.org/W2092826219","https://openalex.org/W2094964660","https://openalex.org/W2100650888","https://openalex.org/W2109428143","https://openalex.org/W2115556004","https://openalex.org/W2140620003","https://openalex.org/W2146827717","https://openalex.org/W2148895869","https://openalex.org/W2157729707","https://openalex.org/W2158017035","https://openalex.org/W2162771329","https://openalex.org/W2163373876","https://openalex.org/W2296221482","https://openalex.org/W2304131693","https://openalex.org/W2339766197","https://openalex.org/W2619571475","https://openalex.org/W2738399088"],"related_works":["https://openalex.org/W4210780382","https://openalex.org/W2057975886","https://openalex.org/W4308700935","https://openalex.org/W1574359403","https://openalex.org/W2356033827","https://openalex.org/W2391138633","https://openalex.org/W4206134051","https://openalex.org/W2907234787","https://openalex.org/W4285503559","https://openalex.org/W4383747562"],"abstract_inverted_index":{"A":[0,19],"fast":[1],"and":[2,14,44,60,138],"accurate":[3],"protection":[4,101],"scheme":[5,74,102],"for":[6,57,77,127],"a":[7,25,37,71,83,91,149],"dc":[8,26,84],"microgrid":[9,27],"enhances":[10],"the":[11,16,49,53,67,78,95,99,108,117,154],"service":[12],"reliability":[13],"improves":[15],"power":[17,47,132],"quality.":[18],"fault":[20,40,58,136,140],"in":[21,29,31,82,98,153],"any":[22],"section":[23,62,80],"of":[24,39,48,52,90,116],"results":[28],"oscillation":[30,54],"current,":[32],"where":[33],"its":[34],"frequency":[35,43],"is":[36,75,119,145],"function":[38],"position.":[41],"The":[42,88,114,142],"associated":[45],"transient":[46,69],"first":[50],"cycle":[51],"are":[55],"used":[56],"detection":[59],"faulted":[61,79],"identification,":[63],"respectively.":[64],"Based":[65],"on":[66,148],"inverse-time":[68],"power,":[70],"relay":[72,92],"coordination":[73],"proposed":[76,109,143],"isolation":[81],"ring":[85],"bus":[86],"microgrid.":[87],"maloperation":[89],"due":[93],"to":[94],"communication":[96],"failure":[97],"unit":[100],"can":[103],"be":[104],"averted":[105],"by":[106],"applying":[107],"method":[110,118],"using":[111,121],"local":[112],"data.":[113],"performance":[115],"tested":[120],"data":[122],"obtained":[123],"from":[124],"PSCAD/EMTDC":[125],"simulations":[126],"numerous":[128],"cases":[129],"including":[130],"bidirectional":[131],"flow":[133],"situation,":[134],"high":[135],"resistance,":[137],"different":[139],"types.":[141],"algorithm":[144],"also":[146],"validated":[147],"scaled-down":[150],"hardware":[151],"setup":[152],"laboratory.":[155]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":19},{"year":2022,"cited_by_count":20},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":17},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":1}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}