{"id":"https://openalex.org/W2149474337","doi":"https://doi.org/10.1109/jsyst.2014.2363384","title":"Component Risk Trending Based on Systems Thinking Incorporating Markov and Weibull Inferences","display_name":"Component Risk Trending Based on Systems Thinking Incorporating Markov and Weibull Inferences","publication_year":2014,"publication_date":"2014-11-05","ids":{"openalex":"https://openalex.org/W2149474337","doi":"https://doi.org/10.1109/jsyst.2014.2363384","mag":"2149474337"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2014.2363384","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2014.2363384","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025630473","display_name":"Burnet Mkandawire","orcid":"https://orcid.org/0000-0002-9898-3724"},"institutions":[{"id":"https://openalex.org/I157591606","display_name":"University of Malawi","ror":"https://ror.org/04vtx5s55","country_code":"MW","type":"education","lineage":["https://openalex.org/I157591606"]}],"countries":["MW"],"is_corresponding":false,"raw_author_name":"Burnet O'Brien Mkandawire","raw_affiliation_strings":["School of Engineering, University of KwaZulu-Natal, University of Malawi, Blantyre, Malawi"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of KwaZulu-Natal, University of Malawi, Blantyre, Malawi","institution_ids":["https://openalex.org/I157591606"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089440331","display_name":"N.M. Ijumba","orcid":"https://orcid.org/0000-0002-6194-7084"},"institutions":[{"id":"https://openalex.org/I4210087849","display_name":"University of Rwanda","ror":"https://ror.org/00286hs46","country_code":"RW","type":"education","lineage":["https://openalex.org/I4210087849"]}],"countries":["RW"],"is_corresponding":false,"raw_author_name":"Nelson Mutatina Ijumba","raw_affiliation_strings":["School of Engineering, University of KwaZulu-Natal, University of Rwanda, Kigali, Rwanda"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of KwaZulu-Natal, University of Rwanda, Kigali, Rwanda","institution_ids":["https://openalex.org/I4210087849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027538775","display_name":"Akshay Kumar Saha","orcid":"https://orcid.org/0000-0002-3523-9455"},"institutions":[{"id":"https://openalex.org/I95023434","display_name":"University of KwaZulu-Natal","ror":"https://ror.org/04qzfn040","country_code":"ZA","type":"education","lineage":["https://openalex.org/I95023434"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Akshay Kumar Saha","raw_affiliation_strings":["School of Engineering, University of KwaZulu-Natal, Durban, South Africa"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of KwaZulu-Natal, Durban, South Africa","institution_ids":["https://openalex.org/I95023434"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7439,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.78731124,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"9","issue":"4","first_page":"1185","last_page":"1196"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.7931951284408569},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6095550060272217},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5797552466392517},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.574663519859314},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5054786205291748},{"id":"https://openalex.org/keywords/risk-management","display_name":"Risk management","score":0.49998044967651367},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.42584702372550964},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.4159850478172302},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.41483935713768005},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.3280279040336609},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3235723376274109},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3109685778617859},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2634579837322235},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.24058809876441956},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2206856906414032},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11522045731544495}],"concepts":[{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.7931951284408569},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6095550060272217},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5797552466392517},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.574663519859314},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5054786205291748},{"id":"https://openalex.org/C32896092","wikidata":"https://www.wikidata.org/wiki/Q189447","display_name":"Risk management","level":2,"score":0.49998044967651367},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.42584702372550964},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.4159850478172302},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.41483935713768005},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.3280279040336609},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3235723376274109},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3109685778617859},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2634579837322235},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.24058809876441956},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2206856906414032},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11522045731544495},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2014.2363384","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2014.2363384","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W15393452","https://openalex.org/W602489364","https://openalex.org/W1495048553","https://openalex.org/W1533879000","https://openalex.org/W1546042872","https://openalex.org/W1569916870","https://openalex.org/W1995865560","https://openalex.org/W2026036801","https://openalex.org/W2045715349","https://openalex.org/W2057035272","https://openalex.org/W2058217958","https://openalex.org/W2074760023","https://openalex.org/W2094635700","https://openalex.org/W2130179507","https://openalex.org/W2137120092","https://openalex.org/W2145224695","https://openalex.org/W2161003500","https://openalex.org/W2185733976","https://openalex.org/W2331743298","https://openalex.org/W2503613079","https://openalex.org/W2750176725","https://openalex.org/W2988934653","https://openalex.org/W4205188686","https://openalex.org/W4243861613","https://openalex.org/W4300435617","https://openalex.org/W4300993416","https://openalex.org/W6683820332","https://openalex.org/W6686473614","https://openalex.org/W6702315853"],"related_works":["https://openalex.org/W2053233382","https://openalex.org/W2905557273","https://openalex.org/W2013589921","https://openalex.org/W2013801244","https://openalex.org/W2777536921","https://openalex.org/W4285250964","https://openalex.org/W1481926687","https://openalex.org/W2014884629","https://openalex.org/W4247945096","https://openalex.org/W3189051998"],"abstract_inverted_index":{"This":[0,180],"paper":[1],"uses":[2],"systems":[3,136],"thinking":[4,137],"to":[5,34,47,61,80,86,98,155,184],"present":[6],"a":[7,14,36,49,102],"power":[8],"utility":[9],"asset":[10],"management":[11],"system":[12,15],"as":[13],"in":[16,88,187,196],"spatial":[17],"transition.":[18],"Next,":[19],"it":[20,130,146,191],"integrates":[21],"inferences":[22],"from":[23,101],"Markov":[24],"processes,":[25],"the":[26,30,63,74,84,89,95,106,112,135,150,156],"Weibull":[27,68],"distribution,":[28],"and":[29,94,178],"bathtub":[31],"curve":[32],"analysis":[33,175],"develop":[35],"quantitative":[37,50],"risk":[38,42,119,122,188],"trending":[39,121],"model.":[40],"A":[41,54],"factor":[43],"(RF)":[44],"is":[45,59,147,181],"used":[46,79,142,186],"define":[48],"measure":[51],"of":[52,56,67,83,91,114,158,167,176],"risk.":[53,179],"set":[55,157],"failure":[57,118],"data":[58],"applied":[60,195],"compute":[62],"maximum":[64],"likelihood":[65],"estimates":[66],"parameters":[69,152,161],"that":[70,171],"are":[71,78,153,172],"fitted":[72],"into":[73],"RF.":[75],"MATLAB":[76],"algorithms":[77],"simulate":[81],"sensitivities":[82],"RF":[85],"changes":[87],"number":[90,96],"components":[92],"renewed":[93],"admitted":[97],"or":[99],"relieved":[100],"high-operating-load":[103],"regime":[104],"during":[105],"life":[107],"cycle.":[108],"The":[109],"model":[110],"determines":[111],"impacts":[113],"renewal":[115],"strategies":[116],"on":[117],"by":[120],"profiles":[123],"associated":[124],"with":[125],"these":[126],"sensitivities.":[127],"In":[128],"addition,":[129],"provides":[131],"modeling":[132],"equations":[133],"for":[134,174,200],"approach":[138],"which":[139],"has,":[140],"traditionally,":[141],"qualitative":[143],"models.":[144],"Furthermore,":[145],"flexible":[148],"since":[149],"computed":[151],"unique":[154,165],"data.":[159],"These":[160],"thus":[162],"generate":[163],"equally":[164],"plots":[166],"probability":[168],"distribution":[169],"functions":[170],"required":[173],"reliability":[177],"primarily":[182],"intended":[183],"be":[185,194],"management,":[189],"but":[190],"can":[192],"also":[193],"performance-based":[197],"compensation":[198],"schemes":[199],"workers.":[201]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}