{"id":"https://openalex.org/W4401991175","doi":"https://doi.org/10.1109/jstars.2024.3452033","title":"Ultra-Wideband RF-Photonics Technology for Microwave Spectrometry","display_name":"Ultra-Wideband RF-Photonics Technology for Microwave Spectrometry","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401991175","doi":"https://doi.org/10.1109/jstars.2024.3452033"},"language":"en","primary_location":{"id":"doi:10.1109/jstars.2024.3452033","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2024.3452033","pdf_url":null,"source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/jstars.2024.3452033","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048545217","display_name":"Janusz Murakowski","orcid":"https://orcid.org/0000-0003-2535-3075"},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Murakowski","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0000-0003-2535-3075","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109632000","display_name":"Amjed Hallak","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amjed Hallak","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0009-0001-2793-0705","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091879890","display_name":"Andrew Mercante","orcid":"https://orcid.org/0000-0002-3887-9781"},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew Mercante","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0000-0002-3887-9781","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007865608","display_name":"Mathew J. Zablocki","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mathew J. Zablocki","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113840256","display_name":"Timothy Creazzo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Timothy Creazzo","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0009-0009-4757-5833","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017018546","display_name":"Shouyuan Shi","orcid":"https://orcid.org/0000-0001-6126-071X"},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shouyuan Shi","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0000-0001-6126-071X","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003836896","display_name":"Kevin Shreve","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin Shreve","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0009-0002-8159-1350","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106866286","display_name":"Matthew Gallion","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Gallion","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0009-0001-6866-1556","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091977537","display_name":"Connor Creavin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Connor Creavin","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0009-0005-5282-0187","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015362076","display_name":"Charles Harrity","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Charles E. Harrity","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0009-0001-6284-5055","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027384906","display_name":"Michael Gehl","orcid":"https://orcid.org/0000-0002-2967-8507"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Gehl","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"raw_orcid":"https://orcid.org/0000-0002-2967-8507","affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065550868","display_name":"Mehmet \u00d6\u011f\u00fct","orcid":"https://orcid.org/0000-0002-7142-6899"},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mehmet Ogut","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-7142-6899","affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032985552","display_name":"Shannon Brown","orcid":"https://orcid.org/0000-0002-7566-8537"},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shannon T. Brown","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-7566-8537","affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032640922","display_name":"Sidharth Misra","orcid":"https://orcid.org/0000-0003-1738-6635"},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sidharth Misra","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1738-6635","affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112228194","display_name":"Pekka Kangaslahti","orcid":null},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pekka Kangaslahti","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058853254","display_name":"Eric A. Kittlaus","orcid":"https://orcid.org/0000-0002-4878-7805"},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric Kittlaus","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-4878-7805","affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029068526","display_name":"Dennis W. Prather","orcid":"https://orcid.org/0000-0002-1363-1333"},"institutions":[{"id":"https://openalex.org/I4210128350","display_name":"Phase Sensitive Innovations (United States)","ror":"https://ror.org/03q1hhd84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210128350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dennis W. Prather","raw_affiliation_strings":["Phase Sensitive Innovations, Inc., Newark, DE, USA"],"raw_orcid":"https://orcid.org/0000-0002-1363-1333","affiliations":[{"raw_affiliation_string":"Phase Sensitive Innovations, Inc., Newark, DE, USA","institution_ids":["https://openalex.org/I4210128350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":17,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1250,"currency":"USD","value_usd":1250},"apc_paid":{"value":1250,"currency":"USD","value_usd":1250},"fwci":0.6034,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66667236,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"17","issue":null,"first_page":"16100","last_page":"16107"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.6194265484809875},{"id":"https://openalex.org/keywords/photonics","display_name":"Photonics","score":0.5377504825592041},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5304003953933716},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.5297387838363647},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3775731921195984},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37521541118621826},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3111976981163025},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2293725311756134},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21568948030471802},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14291295409202576}],"concepts":[{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6194265484809875},{"id":"https://openalex.org/C20788544","wikidata":"https://www.wikidata.org/wiki/Q467054","display_name":"Photonics","level":2,"score":0.5377504825592041},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5304003953933716},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5297387838363647},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3775731921195984},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37521541118621826},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3111976981163025},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2293725311756134},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21568948030471802},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14291295409202576}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/jstars.2024.3452033","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2024.3452033","pdf_url":null,"source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b51ee7c15934487a84649d38742bb605","is_oa":true,"landing_page_url":"https://doaj.org/article/b51ee7c15934487a84649d38742bb605","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Vol 17, Pp 16100-16107 (2024)","raw_type":"article"},{"id":"pmh:oai:osti.gov:2447182","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2447182","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:osti.gov:2447183","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2447183","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"doi:10.1109/jstars.2024.3452033","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2024.3452033","pdf_url":null,"source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6000000238418579,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3648211085","display_name":null,"funder_award_id":"80NM0018D0004","funder_id":"https://openalex.org/F4320306101","funder_display_name":"National Aeronautics and Space Administration"},{"id":"https://openalex.org/G5774498929","display_name":null,"funder_award_id":"80NSSC-21-K-0618","funder_id":"https://openalex.org/F4320306101","funder_display_name":"National Aeronautics and Space Administration"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1988535792","https://openalex.org/W1999089965","https://openalex.org/W2009206859","https://openalex.org/W2042793787","https://openalex.org/W2111828925","https://openalex.org/W2157300067","https://openalex.org/W2159986849","https://openalex.org/W2160337042","https://openalex.org/W2166440844","https://openalex.org/W2592849555","https://openalex.org/W2803638347","https://openalex.org/W2906004478","https://openalex.org/W3015464909","https://openalex.org/W4386025833","https://openalex.org/W4387743439","https://openalex.org/W4390591056"],"related_works":["https://openalex.org/W3112081258","https://openalex.org/W1480343695","https://openalex.org/W2315892906","https://openalex.org/W4384026382","https://openalex.org/W2392214114","https://openalex.org/W2792514479","https://openalex.org/W1978532702","https://openalex.org/W169484559","https://openalex.org/W1973326588","https://openalex.org/W2535067752"],"abstract_inverted_index":{"We":[0,68],"describe":[1],"an":[2,37],"RF-photonic":[3],"system":[4,98],"architecture":[5],"to":[6,27,123],"measure":[7],"microwave":[8],"spectrum":[9],"over":[10],"a":[11,32,58,64],"wide":[12],"bandwidth":[13],"with":[14,89],"high":[15],"resolution.":[16],"The":[17,44,97],"approach":[18],"relies":[19],"on":[20],"the":[21,24,28,52,55,81,87,90,102,108,116,119,129],"up-conversion":[22],"of":[23,57,77,86,94,104,118,131],"electronic":[25],"signal":[26],"optical":[29],"domain":[30],"using":[31],"high-speed":[33],"electro-optic":[34],"modulator,":[35,82],"and":[36,83,110,128],"arrayed-waveguide":[38],"grating":[39],"(AWG)":[40],"for":[41,80,101,115],"spectral":[42,92],"analysis.":[43],"modulator":[45],"is":[46,99],"implemented":[47],"in":[48,63,75,125],"lithium":[49],"niobate":[50],"whereas":[51],"AWG":[53,88],"takes":[54],"form":[56],"photonic":[59],"integrated":[60],"circuit":[61],"fabricated":[62],"silicon-on-insulator":[65],"material":[66],"platform.":[67],"present":[69],"experimental":[70],"results":[71],"showing":[72],"high-frequency":[73],"response,":[74],"excess":[76],"200":[78],"GHz,":[79],"broadband":[84],"response":[85],"free":[91],"range":[93],"81":[95],"GHz.":[96],"suitable":[100],"measurement":[103],"atmospheric":[105],"radiation":[106],"between":[107],"oxygen":[109],"water":[111],"vapor":[112],"absorption":[113],"lines":[114],"monitoring":[117],"planetary":[120],"boundary":[121],"layer":[122],"aid":[124],"weather":[126],"prediction":[127],"modeling":[130],"climate":[132],"dynamics.":[133]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}