{"id":"https://openalex.org/W4285166851","doi":"https://doi.org/10.1109/jstars.2022.3180159","title":"An Improved Lightweight RetinaNet for Ship Detection in SAR Images","display_name":"An Improved Lightweight RetinaNet for Ship Detection in SAR Images","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285166851","doi":"https://doi.org/10.1109/jstars.2022.3180159"},"language":"en","primary_location":{"id":"doi:10.1109/jstars.2022.3180159","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2022.3180159","pdf_url":"https://ieeexplore.ieee.org/ielx7/4609443/4609444/09788025.pdf","source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/4609443/4609444/09788025.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081624037","display_name":"Tian Miao","orcid":"https://orcid.org/0000-0002-5888-2064"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tian Miao","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China","School of Electronic and Information Engineering, Beihang University, Beijing 100191, China, and also with CETC key laboratory of aerospace information applications, Shijiazhuang 050081, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China, and also with CETC key laboratory of aerospace information applications, Shijiazhuang 050081, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041138969","display_name":"Hongcheng Zeng","orcid":"https://orcid.org/0000-0002-4727-9980"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"HongCheng Zeng","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China","School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047073083","display_name":"Wei Yang","orcid":"https://orcid.org/0000-0001-8935-294X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Yang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China","School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085710189","display_name":"Boce Chu","orcid":"https://orcid.org/0000-0002-5231-0620"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Boce Chu","raw_affiliation_strings":["CETC Key Laboratory of Aerospace Information Applications, Shijiazhuang, China","CETC key laboratory of aerospace information applications, Shijiazhuang 050081, China"],"affiliations":[{"raw_affiliation_string":"CETC Key Laboratory of Aerospace Information Applications, Shijiazhuang, China","institution_ids":[]},{"raw_affiliation_string":"CETC key laboratory of aerospace information applications, Shijiazhuang 050081, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005425560","display_name":"Fei Zou","orcid":"https://orcid.org/0000-0002-8088-6045"},"institutions":[{"id":"https://openalex.org/I4210166112","display_name":"State Key Laboratory of Remote Sensing Science","ror":"https://ror.org/05wzjqa24","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210166112"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Zou","raw_affiliation_strings":["Beijing Institute of Remote Sensing Information, Beijing, China","Beijing Institute of Remote Sensing Information, Beijing 100192, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Remote Sensing Information, Beijing, China","institution_ids":["https://openalex.org/I4210166112"]},{"raw_affiliation_string":"Beijing Institute of Remote Sensing Information, Beijing 100192, China","institution_ids":["https://openalex.org/I4210166112"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113746805","display_name":"Weijia Ren","orcid":null},"institutions":[{"id":"https://openalex.org/I198357462","display_name":"Changsha University","ror":"https://ror.org/011d8sm39","country_code":"CN","type":"education","lineage":["https://openalex.org/I198357462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weijia Ren","raw_affiliation_strings":["Spacety Company, Ltd. (Changsha), Changsha, China","Spacety Co., Ltd. (Changsha), Changsha 410221, China"],"affiliations":[{"raw_affiliation_string":"Spacety Company, Ltd. (Changsha), Changsha, China","institution_ids":["https://openalex.org/I198357462"]},{"raw_affiliation_string":"Spacety Co., Ltd. (Changsha), Changsha 410221, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100332980","display_name":"Jie Chen","orcid":"https://orcid.org/0000-0002-9370-3965"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Chen","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China","School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5081624037"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1250,"currency":"USD","value_usd":1250},"apc_paid":{"value":1250,"currency":"USD","value_usd":1250},"fwci":8.0488,"has_fulltext":true,"cited_by_count":84,"citation_normalized_percentile":{"value":0.98381302,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"15","issue":null,"first_page":"4667","last_page":"4679"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7190648913383484},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.48846808075904846},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.4480948746204376},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.40907925367355347},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.36971768736839294},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1192488968372345}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7190648913383484},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.48846808075904846},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.4480948746204376},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.40907925367355347},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36971768736839294},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1192488968372345}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jstars.2022.3180159","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2022.3180159","pdf_url":"https://ieeexplore.ieee.org/ielx7/4609443/4609444/09788025.pdf","source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:551968674c1940e6a7fecd923c20b59f","is_oa":true,"landing_page_url":"https://doaj.org/article/551968674c1940e6a7fecd923c20b59f","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Vol 15, Pp 4667-4679 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/jstars.2022.3180159","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2022.3180159","pdf_url":"https://ieeexplore.ieee.org/ielx7/4609443/4609444/09788025.pdf","source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3545292666","display_name":null,"funder_award_id":"62101014","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320309590","display_name":"Universit\u00e0 degli Studi di Napoli Federico II","ror":"https://ror.org/05290cv24"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4285166851.pdf","grobid_xml":"https://content.openalex.org/works/W4285166851.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W2039761052","https://openalex.org/W2079299474","https://openalex.org/W2090991102","https://openalex.org/W2094236270","https://openalex.org/W2102605133","https://openalex.org/W2108349280","https://openalex.org/W2119391693","https://openalex.org/W2127611757","https://openalex.org/W2130661716","https://openalex.org/W2171422795","https://openalex.org/W2194775991","https://openalex.org/W2501210789","https://openalex.org/W2534798644","https://openalex.org/W2551083396","https://openalex.org/W2604844733","https://openalex.org/W2733271701","https://openalex.org/W2772352260","https://openalex.org/W2774244034","https://openalex.org/W2783266131","https://openalex.org/W2884561390","https://openalex.org/W2884585870","https://openalex.org/W2895165409","https://openalex.org/W2919011445","https://openalex.org/W2963420686","https://openalex.org/W2969367550","https://openalex.org/W3004629235","https://openalex.org/W3013341635","https://openalex.org/W3013423277","https://openalex.org/W3018757597","https://openalex.org/W3035414587","https://openalex.org/W3107474049","https://openalex.org/W3164113393","https://openalex.org/W3165629794","https://openalex.org/W3166561508","https://openalex.org/W3180954604","https://openalex.org/W4297775537","https://openalex.org/W6637373629","https://openalex.org/W6737664043","https://openalex.org/W6777046832"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"The":[0,91,119],"rapid":[1],"development":[2],"of":[3,16,36,73,84,116,123,143,161],"remote":[4,28],"sensing":[5,29],"technology":[6],"has":[7,43],"led":[8],"to":[9,102,110,184],"a":[10,46,139],"sharp":[11],"increase":[12],"in":[13,59,188],"the":[14,66,69,74,82,85,100,112,117,124,150,156,159,165,172,177,182],"amount":[15],"Synthetic":[17],"Aperture":[18],"Radar":[19],"(SAR)":[20],"measurements,":[21],"which":[22],"put":[23],"forward":[24],"higher":[25],"requirements":[26],"for":[27,56],"image":[30,142],"processing.":[31],"As":[32],"an":[33,52],"important":[34],"application":[35],"SAR,":[37],"fast":[38],"and":[39,81,93,121,138,158,168,181],"accurate":[40],"ship":[41,57,186],"detection":[42,58,166],"always":[44],"been":[45],"research":[47],"hotspot.":[48],"In":[49],"this":[50],"paper,":[51],"improved":[53],"lightweight":[54],"RetinaNet":[55],"SAR":[60,141],"images":[61],"is":[62,89,108,127,147],"proposed.":[63],"Compared":[64],"with":[65,132],"standard":[67],"RetinaNet,":[68],"shallow":[70],"convolutional":[71,87],"layers":[72,88],"backbone":[75],"are":[76,97],"replaced":[77],"by":[78,129],"ghost":[79],"modules":[80,96],"number":[83,160],"deep":[86],"reduced.":[90],"spatial":[92],"channel":[94],"attention":[95],"embedded":[98],"into":[99],"model":[101],"enhance":[103],"detectability.":[104],"K-Means":[105],"clustering":[106],"algorithm":[107],"applied":[109],"adjust":[111],"initial":[113],"aspect":[114],"ratios":[115],"model.":[118],"effectiveness":[120],"robustness":[122,180],"proposed":[125,151,178],"method":[126,152],"demonstrated":[128],"numerical":[130],"experiments":[131],"SSDD":[133],"dataset,":[134,137],"Gaofen-3":[135],"mini":[136],"large-scale":[140],"Hisea-1":[144],"satellite,":[145],"it":[146],"shown":[148],"that":[149],"can":[153],"significantly":[154],"reduce":[155],"FLOPs":[157],"parameters":[162],"without":[163],"decreasing":[164],"accuracy":[167],"recall":[169],"ratio.":[170],"Moreover,":[171],"experimental":[173],"results":[174],"also":[175],"show":[176],"model's":[179],"ability":[183],"detect":[185],"targets":[187],"small":[189],"datasets.":[190]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":28},{"year":2024,"cited_by_count":32},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":5}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}