{"id":"https://openalex.org/W4226053543","doi":"https://doi.org/10.1109/jstars.2022.3165168","title":"Technology Maturation Efforts for the Next Generation of Grating Spectrometer Hyperspectral Infrared Sounders","display_name":"Technology Maturation Efforts for the Next Generation of Grating Spectrometer Hyperspectral Infrared Sounders","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4226053543","doi":"https://doi.org/10.1109/jstars.2022.3165168"},"language":"en","primary_location":{"id":"doi:10.1109/jstars.2022.3165168","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2022.3165168","pdf_url":"https://ieeexplore.ieee.org/ielx7/4609443/9656571/09754357.pdf","source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/4609443/9656571/09754357.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046664920","display_name":"Thomas S. Pagano","orcid":"https://orcid.org/0000-0003-4738-442X"},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Thomas S. Pagano","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":"https://orcid.org/0000-0003-4738-442X","affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108770313","display_name":"Dean Johnson","orcid":null},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dean L. Johnson","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107234406","display_name":"James P. McGuire","orcid":null},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James P. McGuire","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109902151","display_name":"Mark A. Schwochert","orcid":null},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark A. Schwochert","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065432007","display_name":"David Z. Ting","orcid":"https://orcid.org/0000-0001-8313-6963"},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Z. Ting","raw_affiliation_strings":["Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA"],"raw_orcid":"https://orcid.org/0000-0001-8313-6963","affiliations":[{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA","institution_ids":["https://openalex.org/I1334627681"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5046664920"],"corresponding_institution_ids":["https://openalex.org/I1334627681"],"apc_list":{"value":1250,"currency":"USD","value_usd":1250},"apc_paid":{"value":1250,"currency":"USD","value_usd":1250},"fwci":5.0934,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.94883102,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"15","issue":null,"first_page":"2929","last_page":"2943"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hyperspectral-imaging","display_name":"Hyperspectral imaging","score":0.898956298828125},{"id":"https://openalex.org/keywords/spectrometer","display_name":"Spectrometer","score":0.6867833137512207},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.5601285696029663},{"id":"https://openalex.org/keywords/diffraction-grating","display_name":"Diffraction grating","score":0.5492706894874573},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.5234148502349854},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.4540468454360962},{"id":"https://openalex.org/keywords/imaging-spectrometer","display_name":"Imaging spectrometer","score":0.4235707223415375},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.42198026180267334},{"id":"https://openalex.org/keywords/chemical-imaging","display_name":"Chemical imaging","score":0.41777247190475464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3339279294013977},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.3221508264541626},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.32051485776901245},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20230633020401},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08524221181869507}],"concepts":[{"id":"https://openalex.org/C159078339","wikidata":"https://www.wikidata.org/wiki/Q959005","display_name":"Hyperspectral imaging","level":2,"score":0.898956298828125},{"id":"https://openalex.org/C33390570","wikidata":"https://www.wikidata.org/wiki/Q188463","display_name":"Spectrometer","level":2,"score":0.6867833137512207},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.5601285696029663},{"id":"https://openalex.org/C126753812","wikidata":"https://www.wikidata.org/wiki/Q653294","display_name":"Diffraction grating","level":3,"score":0.5492706894874573},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.5234148502349854},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.4540468454360962},{"id":"https://openalex.org/C183852935","wikidata":"https://www.wikidata.org/wiki/Q6002848","display_name":"Imaging spectrometer","level":3,"score":0.4235707223415375},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.42198026180267334},{"id":"https://openalex.org/C65597285","wikidata":"https://www.wikidata.org/wiki/Q5090469","display_name":"Chemical imaging","level":3,"score":0.41777247190475464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3339279294013977},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3221508264541626},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32051485776901245},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20230633020401},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08524221181869507}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jstars.2022.3165168","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2022.3165168","pdf_url":"https://ieeexplore.ieee.org/ielx7/4609443/9656571/09754357.pdf","source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b1ff48df91d8483e9e97eafb5202cdba","is_oa":false,"landing_page_url":"https://doaj.org/article/b1ff48df91d8483e9e97eafb5202cdba","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Vol 15, Pp 2929-2943 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/jstars.2022.3165168","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jstars.2022.3165168","pdf_url":"https://ieeexplore.ieee.org/ielx7/4609443/9656571/09754357.pdf","source":{"id":"https://openalex.org/S117727964","display_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","issn_l":"1939-1404","issn":["1939-1404","2151-1535"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"},{"id":"https://openalex.org/F4320309398","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055"},{"id":"https://openalex.org/F4320332375","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4226053543.pdf","grobid_xml":"https://content.openalex.org/works/W4226053543.grobid-xml"},"referenced_works_count":56,"referenced_works":["https://openalex.org/W86176026","https://openalex.org/W1654023286","https://openalex.org/W1657104744","https://openalex.org/W1927512309","https://openalex.org/W1961069449","https://openalex.org/W1977564923","https://openalex.org/W1980170273","https://openalex.org/W2003716786","https://openalex.org/W2004620449","https://openalex.org/W2011218519","https://openalex.org/W2013472772","https://openalex.org/W2018656931","https://openalex.org/W2054622155","https://openalex.org/W2060859281","https://openalex.org/W2062383959","https://openalex.org/W2070794236","https://openalex.org/W2091627445","https://openalex.org/W2122380404","https://openalex.org/W2135577552","https://openalex.org/W2166181281","https://openalex.org/W2237779634","https://openalex.org/W2285027303","https://openalex.org/W2473237683","https://openalex.org/W2475285551","https://openalex.org/W2518635848","https://openalex.org/W2567628229","https://openalex.org/W2587262823","https://openalex.org/W2612326841","https://openalex.org/W2859873067","https://openalex.org/W2890081293","https://openalex.org/W2901212625","https://openalex.org/W2912885931","https://openalex.org/W2940084384","https://openalex.org/W2942620465","https://openalex.org/W2946219286","https://openalex.org/W2963615413","https://openalex.org/W2964110264","https://openalex.org/W2966500800","https://openalex.org/W2970444446","https://openalex.org/W2977208710","https://openalex.org/W2991059515","https://openalex.org/W2995975458","https://openalex.org/W3014231765","https://openalex.org/W3018196816","https://openalex.org/W3082567802","https://openalex.org/W3094818105","https://openalex.org/W3094894919","https://openalex.org/W3104851350","https://openalex.org/W3115191390","https://openalex.org/W3154242146","https://openalex.org/W3173240999","https://openalex.org/W3192394998","https://openalex.org/W4241194710","https://openalex.org/W6726537714","https://openalex.org/W6733843376","https://openalex.org/W6903900524"],"related_works":["https://openalex.org/W4386427838","https://openalex.org/W2746742660","https://openalex.org/W163927463","https://openalex.org/W2082586825","https://openalex.org/W2125664143","https://openalex.org/W4233747689","https://openalex.org/W2561005839","https://openalex.org/W2474469778","https://openalex.org/W2944460852","https://openalex.org/W2119473622"],"abstract_inverted_index":{"As":[0],"we":[1],"look":[2],"forward":[3],"to":[4,224,227,239],"the":[5,32,37,42,46,57,65,96,134,149,159,180,207,225],"next":[6,208],"generation":[7,209],"of":[8,36,67,95,100,117,133,162,182,186,210],"hyperspectral":[9],"infrared":[10,192],"(IR)":[11],"atmospheric":[12],"sounders,":[13],"grating":[14,101,118],"spectrometers":[15,214],"hold":[16],"promise":[17],"for":[18,206],"improved":[19],"performance":[20],"(e.g.,":[21],"horizontal":[22],"and":[23,26,34,59,73,86,98,194,247],"spectral":[24,125],"resolutions)":[25],"more":[27,124],"rapid":[28],"revisit":[29,41],"while":[30],"reducing":[31],"size":[33],"complexity":[35],"instrument.":[38],"We":[39],"briefly":[40],"technology":[43,93],"used":[44,140,176,205],"in":[45,56,64,107,137,148,177],"Atmospheric":[47,152],"Infrared":[48,151],"Sounder":[49,153],"(AIRS),":[50],"recognizing":[51],"that":[52,122,139,202],"it":[53],"was":[54],"developed":[55,157],"1990\u2019s":[58],"has":[60,76],"matured":[61],"key":[62],"technologies":[63],"areas":[66],"IR":[68,103,120,211],"detectors,":[69],"optical":[70],"coatings,":[71],"gratings,":[72],"cryocoolers.":[74],"AIRS":[75,138],"been":[77,146],"an":[78],"unqualified":[79],"success":[80],"not":[81],"only":[82],"as":[83,91],"a":[84,92,114,128,183,189,195],"science":[85],"operational":[87],"mission":[88],"but":[89],"also":[90],"demonstration":[94],"reliability":[97],"simplicity":[99],"spectrometer":[102,119],"sounding":[104],"instruments.":[105],"Advancements":[106],"focal":[108],"plane":[109],"arrays":[110],"(FPAs)":[111],"have":[112,145],"enabled":[113],"new":[115,184],"class":[116,185],"sounders":[121],"offer":[123],"channels":[126],"on":[127],"single":[129],"FPA,":[130],"mitigating":[131],"some":[132],"issues":[135],"seen":[136],"linear":[141],"arrays.":[142],"These":[143],"improvements":[144],"manifested":[147],"CubeSat":[150],"(CIRAS)":[154],"brassboard":[155],"instrument,":[156],"at":[158],"California":[160],"Institute":[161],"Technology":[163],"Jet":[164],"Propulsion":[165],"Laboratory":[166],"with":[167,188],"industry":[168],"partner":[169],"Ball":[170],"Aerospace.":[171],"Further":[172],"enhancements":[173],"beyond":[174],"those":[175],"CIRAS":[178],"enable":[179],"development":[181],"instruments":[187],"very":[190,196],"long-wavelength":[191],"response":[193],"high":[197],"spatial":[198],"resolution":[199],"(<2":[200],"km)":[201],"can":[203],"be":[204],"sounders.":[212],"Grating":[213],"provide":[215],"advantages":[216],"over":[217],"other":[218],"methods,":[219],"including":[220],"smaller":[221],"apertures":[222],"due":[223],"ability":[226],"use":[228],"larger":[229],"FPAs,":[230],"having":[231],"no":[232],"moving":[233],"parts":[234],"or":[235],"laser":[236],"metrology":[237],"systems":[238],"produce":[240],"spectra,":[241],"lower":[242,248],"internal":[243],"FPA":[244],"readout":[245],"rates,":[246],"overall":[249],"system":[250],"data":[251],"rates.":[252]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}