{"id":"https://openalex.org/W7141661499","doi":"https://doi.org/10.1109/jssc.2026.3673972","title":"A 16 MHz <i>RC</i> Frequency Reference With \u00b1450 ppm Inaccuracy From \u201345 <sup>\u00b0</sup> C to 85 <sup>\u00b0</sup> C After Accelerated Aging","display_name":"A 16 MHz <i>RC</i> Frequency Reference With \u00b1450 ppm Inaccuracy From \u201345 <sup>\u00b0</sup> C to 85 <sup>\u00b0</sup> C After Accelerated Aging","publication_year":2026,"publication_date":"2026-03-27","ids":{"openalex":"https://openalex.org/W7141661499","doi":"https://doi.org/10.1109/jssc.2026.3673972"},"language":null,"primary_location":{"id":"doi:10.1109/jssc.2026.3673972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2026.3673972","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029802889","display_name":"K Metwaly Mohamed","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Karimeldeen Mohamed","raw_affiliation_strings":["Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0009-0007-7461-9411","affiliations":[{"raw_affiliation_string":"Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070447612","display_name":"Nandor G. Toth","orcid":"https://orcid.org/0009-0009-7546-3257"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Nandor G. Toth","raw_affiliation_strings":["Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0009-0009-7546-3257","affiliations":[{"raw_affiliation_string":"Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5130753165","display_name":"Hui Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140624","display_name":"United Monolithic Semiconductor (France)","ror":"https://ror.org/034zb3z40","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140624"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Hui Jiang","raw_affiliation_strings":["Monolithic Power Systems Inc., Nijmegen, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0003-0918-5948","affiliations":[{"raw_affiliation_string":"Monolithic Power Systems Inc., Nijmegen, The Netherlands","institution_ids":["https://openalex.org/I4210140624"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036549439","display_name":"\u00c7a\u011fr\u0131 G\u00fcrley\u00fck","orcid":"https://orcid.org/0000-0001-5793-462X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u00c7a\u011fr\u0131 G\u00fcrley\u00fck","raw_affiliation_strings":["Optiver, Amsterdam, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optiver, Amsterdam, The Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A. A. Makinwa","raw_affiliation_strings":["Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-2992-5467","affiliations":[{"raw_affiliation_string":"Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.26849688,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"61","issue":"7","first_page":"3274","last_page":"3282"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","score":0.2639000117778778,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","score":0.2639000117778778,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10217","display_name":"Cardiac electrophysiology and arrhythmias","score":0.05700000002980232,"subfield":{"id":"https://openalex.org/subfields/2705","display_name":"Cardiology and Cardiovascular Medicine"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11878","display_name":"Solid-state spectroscopy and crystallography","score":0.048700001090765,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.6754000186920166},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.296999990940094},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.29589998722076416},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.24560000002384186},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.2353000044822693}],"concepts":[{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.6754000186920166},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5566999912261963},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.296999990940094},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.29589998722076416},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.24560000002384186},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.2353000044822693},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21739999949932098},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.21559999883174896},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.21490000188350677},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.21449999511241913}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2026.3673972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2026.3673972","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320330618","display_name":"Infineon Technologies","ror":"https://ror.org/005kw6t15"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2048289646","https://openalex.org/W2050152244","https://openalex.org/W2106894133","https://openalex.org/W2109256542","https://openalex.org/W2122904090","https://openalex.org/W2122984288","https://openalex.org/W2143042017","https://openalex.org/W2148114249","https://openalex.org/W2523775370","https://openalex.org/W2533675480","https://openalex.org/W2892393788","https://openalex.org/W2921210746","https://openalex.org/W3135661566","https://openalex.org/W3139595164","https://openalex.org/W3179440573","https://openalex.org/W3211036016","https://openalex.org/W4206592536","https://openalex.org/W4210581110","https://openalex.org/W4312924853","https://openalex.org/W4387546424","https://openalex.org/W4388469844","https://openalex.org/W4399310790","https://openalex.org/W4407403645","https://openalex.org/W4408183482","https://openalex.org/W4412444642","https://openalex.org/W4415934344"],"related_works":[],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,10,19,29,39,100],"high-accuracy,":[4],"low-drift":[5],"16MHzRCfrequency":[6],"reference":[7],"implemented":[8,71],"in":[9],"standard":[11],"180":[12],"nm":[13],"CMOS":[14],"process.":[15],"It":[16],"consists":[17],"of":[18,28,38,54,63],"frequency-locked":[20],"loop":[21,56],"(FLL),":[22],"which":[23,103],"locks":[24],"the":[25,35,51,55,60,64,88],"output":[26],"frequency":[27],"digitally":[30],"controlled":[31],"oscillator":[32],"(DCO)":[33],"to":[34,57,105],"time":[36],"constant":[37],"Wien":[40],"Bridge":[41],"(WB)":[42],"filter.":[43,66],"A":[44],"PNP-based":[45],"temperature":[46,61],"sensor":[47],"(TS)":[48],"then":[49],"adjusts":[50],"set":[52],"point":[53],"compensate":[58],"for":[59],"dependence":[62],"WB":[65],"Three":[67],"different":[68],"filters":[69],"were":[70],"by":[72],"combining":[73],"metal-insulator-metal":[74],"(MIM)":[75],"capacitors":[76],"with":[77],"metal,":[78],"via-metal,":[79],"and":[80],"silicided":[81],"n-poly":[82],"resistors,":[83],"respectively.":[84],"The":[85],"latter":[86],"achieved":[87],"best":[89],"results:":[90],"\u00b1350":[91],"ppm":[92,108],"inaccuracy":[93],"from$-":[94],"45~^{\\circ":[95],"}$C":[96,98],"to$85~^{\\circ":[97],"after":[99,109],"2-point":[101],"trim,":[102],"increases":[104],"only":[106],"\u00b1450":[107],"accelerated":[110],"aging.":[111]},"counts_by_year":[],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2026-03-28T00:00:00"}