{"id":"https://openalex.org/W4416922282","doi":"https://doi.org/10.1109/jssc.2025.3635266","title":"A Galvanic Isolator Achieving 117-Mb/s Forward Data Transfer in the Presence of 181-kV/\u03bcs Common-Mode Transient Interference","display_name":"A Galvanic Isolator Achieving 117-Mb/s Forward Data Transfer in the Presence of 181-kV/\u03bcs Common-Mode Transient Interference","publication_year":2025,"publication_date":"2025-12-02","ids":{"openalex":"https://openalex.org/W4416922282","doi":"https://doi.org/10.1109/jssc.2025.3635266"},"language":null,"primary_location":{"id":"doi:10.1109/jssc.2025.3635266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3635266","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109304508","display_name":"Lu Jie","orcid":"https://orcid.org/0009-0003-6478-8298"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Lu","raw_affiliation_strings":["School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China"],"raw_orcid":"https://orcid.org/0009-0003-6478-8298","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100947599","display_name":"Junyi Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyi Sun","raw_affiliation_strings":["School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103249134","display_name":"Bo Li","orcid":"https://orcid.org/0000-0001-9712-9561"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Li","raw_affiliation_strings":["School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Quanrong Zhuang","orcid":null},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quanrong Zhuang","raw_affiliation_strings":["School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025243022","display_name":"Yi Shi","orcid":"https://orcid.org/0000-0002-1082-0315"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Shi","raw_affiliation_strings":["School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-1082-0315","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036693137","display_name":"Hao Qiu","orcid":"https://orcid.org/0000-0002-3944-9740"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Qiu","raw_affiliation_strings":["School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-3944-9740","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Engineering Research Center of Opto-Electro Materials and Chip Techniques, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I36399199"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I36399199"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.31317306,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"61","issue":"7","first_page":"3524","last_page":"3534"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.39259999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.39259999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.2071000039577484,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.16619999706745148,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.6179999709129333},{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.5716999769210815},{"id":"https://openalex.org/keywords/isolator","display_name":"Isolator","score":0.5339000225067139},{"id":"https://openalex.org/keywords/data-transmission","display_name":"Data transmission","score":0.5090000033378601},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.4982999861240387},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.49390000104904175},{"id":"https://openalex.org/keywords/galvanic-isolation","display_name":"Galvanic isolation","score":0.4794999957084656},{"id":"https://openalex.org/keywords/frequency-shift-keying","display_name":"Frequency-shift keying","score":0.46950000524520874}],"concepts":[{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.6179999709129333},{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.5716999769210815},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5382000207901001},{"id":"https://openalex.org/C54888747","wikidata":"https://www.wikidata.org/wiki/Q962002","display_name":"Isolator","level":2,"score":0.5339000225067139},{"id":"https://openalex.org/C557945733","wikidata":"https://www.wikidata.org/wiki/Q389772","display_name":"Data transmission","level":2,"score":0.5090000033378601},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.4982999861240387},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.49390000104904175},{"id":"https://openalex.org/C70234604","wikidata":"https://www.wikidata.org/wiki/Q780813","display_name":"Galvanic isolation","level":4,"score":0.4794999957084656},{"id":"https://openalex.org/C163996819","wikidata":"https://www.wikidata.org/wiki/Q1166054","display_name":"Frequency-shift keying","level":4,"score":0.46950000524520874},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.45559999346733093},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.4327999949455261},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42250001430511475},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40529999136924744},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.38100001215934753},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3596999943256378},{"id":"https://openalex.org/C29633239","wikidata":"https://www.wikidata.org/wiki/Q209440","display_name":"Galvanic cell","level":2,"score":0.3296000063419342},{"id":"https://openalex.org/C186378180","wikidata":"https://www.wikidata.org/wiki/Q4874866","display_name":"Phase-shift keying","level":4,"score":0.325300008058548},{"id":"https://openalex.org/C2777973058","wikidata":"https://www.wikidata.org/wiki/Q477284","display_name":"Amplitude-shift keying","level":5,"score":0.323199987411499},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3222000002861023},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.3037000000476837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2711000144481659},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.26460000872612},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.2542000114917755},{"id":"https://openalex.org/C2776542216","wikidata":"https://www.wikidata.org/wiki/Q6398306","display_name":"Keying","level":2,"score":0.25130000710487366}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3635266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3635266","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4767787467","display_name":null,"funder_award_id":"62374082","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G505992543","display_name":null,"funder_award_id":"T2221003","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5354445887","display_name":null,"funder_award_id":"62341408","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Targeting":[0],"a":[1,132,170,186,194,201],"high":[2,187],"data":[3,81,89],"rate":[4,205],"(DR)":[5],"in":[6,14,125,131,166,229,238],"the":[7,15,38,53,76,80,85,93,115,126,146,167,183,216,219],"presence":[8,168],"of":[9,29,41,60,87,169,174,189,198,207,218],"common-mode":[10],"transient":[11],"(CMT)":[12],"interference":[13,173],"isolated":[16],"gate":[17],"driver":[18],"application":[19],"scenario,":[20],"we":[21,83],"presented":[22],"an":[23,44,66],"inductively":[24],"galvanic":[25],"isolator":[26],"(GI)":[27],"consisting":[28],"transmitter":[30],"(TX)":[31],"and":[32,63,122,231],"receiver":[33],"(RX)":[34],"dies.":[35],"To":[36],"eliminate":[37],"destructive":[39],"effects":[40],"CMT":[42,61,151,172],"interference,":[43],"adaptive":[45],"transconductance":[46],"enhancement":[47],"(ATE)":[48],"technique":[49],"was":[50,112],"proposed":[51,116,127,147],"on":[52],"TX":[54,121],"side,":[55],"which":[56,99],"enables":[57],"real-time":[58],"detection":[59],"events":[62],"contributes":[64],"to":[65,74,102,155,193],"enhanced":[67],"<inline-formula":[68,208,222,232],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[69,134,158,177,209,223,233],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[70,135,159,178,210,224,234],"<tex-math":[71,136,160,179,211,225,235],"notation=\"LaTeX\">$g_{m}$</tex-math>":[72],"</inline-formula>":[73,228,237],"stabilize":[75],"oscillator\u2019s":[77],"operation.":[78],"For":[79],"transfer,":[82],"observed":[84],"problem":[86,111],"unequal":[88],"symbol":[90],"durations":[91],"using":[92],"conventional":[94],"frequency-shift":[95],"keying":[96],"(FSK)":[97],"demodulator,":[98],"can":[100],"lead":[101],"shoot-through":[103],"current":[104],"or":[105],"large":[106],"reverse":[107],"conduction":[108],"loss.":[109],"This":[110,214],"solved":[113],"by":[114,221],"compensated":[117],"FSK":[118],"demodulator.":[119],"Both":[120],"RX":[123],"dies":[124],"GI":[128,148,184],"were":[129],"fabricated":[130],"0.18-<inline-formula":[133],"notation=\"LaTeX\">$\\mu":[137,161,180],"$</tex-math>":[138,162,181,227],"</inline-formula>m":[139],"BCD":[140],"process.":[141],"Experimental":[142],"results":[143],"verified":[144],"that":[145],"demonstrates":[149],"static":[150],"immunity":[152],"(CMTI)":[153],"up":[154],"299":[156],"kV/<inline-formula":[157,176],"</inline-formula>s.":[163],"Furthermore,":[164],"even":[165],"severe":[171],"181":[175],"</inline-formula>s,":[182],"supports":[185],"DR":[188,195],"117":[190],"Mb/s,":[191],"corresponding":[192],"ratio":[196],"(DRC)":[197],"67%,":[199],"with":[200],"low":[202],"bit":[203],"error":[204],"(BER)":[206],"notation=\"LaTeX\">$10^{-8}$</tex-math>":[212],"</inline-formula>.":[213],"extends":[215],"state":[217],"art":[220],"notation=\"LaTeX\">$3.72\\times":[226],"DRC":[230],"notation=\"LaTeX\">$1.13\\times$</tex-math>":[236],"dynamic":[239],"CMTI.":[240]},"counts_by_year":[],"updated_date":"2026-07-01T06:00:48.157686","created_date":"2025-12-02T00:00:00"}