{"id":"https://openalex.org/W4417003574","doi":"https://doi.org/10.1109/jssc.2025.3635146","title":"A 92.1-dB SNDR Easy-Driving Two-Step NS-SAR-Based Incremental ADC With Concurrent Gain-Error Plus Noise Suppression","display_name":"A 92.1-dB SNDR Easy-Driving Two-Step NS-SAR-Based Incremental ADC With Concurrent Gain-Error Plus Noise Suppression","publication_year":2025,"publication_date":"2025-12-04","ids":{"openalex":"https://openalex.org/W4417003574","doi":"https://doi.org/10.1109/jssc.2025.3635146"},"language":null,"primary_location":{"id":"doi:10.1109/jssc.2025.3635146","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3635146","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100436378","display_name":"Chenyang Li","orcid":"https://orcid.org/0000-0001-8631-6708"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Chenyang Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043712410","display_name":"Tzu-Han Wang","orcid":"https://orcid.org/0000-0003-2733-0555"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tzu-Han Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0003-2733-0555","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045938866","display_name":"Dong Suk Kang","orcid":"https://orcid.org/0000-0002-3024-9240"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dongsuk Kang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-3024-9240","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044599754","display_name":"Ken Li","orcid":"https://orcid.org/0000-0001-5349-4006"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ken Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0001-5349-4006","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013134150","display_name":"Xitie Zhang","orcid":"https://orcid.org/0000-0002-3054-6587"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xitie Zhang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-3054-6587","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010818400","display_name":"Wei-En Lee","orcid":"https://orcid.org/0000-0001-6554-3362"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wei-En Lee","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0001-6554-3362","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021172765","display_name":"Visvesh Sathe","orcid":"https://orcid.org/0000-0001-7950-4495"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Visvesh S. Sathe","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0001-7950-4495","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030597298","display_name":"Shaolan Li","orcid":"https://orcid.org/0000-0002-2736-5451"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shaolan Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-2736-5451","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology (GT), Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5100436378"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.35419617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"61","issue":"3","first_page":"884","last_page":"897"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.0044999998062849045,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6909000277519226},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4903999865055084},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4724999964237213},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4514999985694885},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43630000948905945},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.3734999895095825},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.3718999922275543},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3716000020503998}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6909000277519226},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5530999898910522},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5212000012397766},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4903999865055084},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4724999964237213},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4514999985694885},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43630000948905945},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3734999895095825},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.3718999922275543},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3716000020503998},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.36079999804496765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3506999909877777},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.34279999136924744},{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.33169999718666077},{"id":"https://openalex.org/C198386975","wikidata":"https://www.wikidata.org/wiki/Q117785","display_name":"Finite impulse response","level":2,"score":0.3305000066757202},{"id":"https://openalex.org/C143931264","wikidata":"https://www.wikidata.org/wiki/Q5932986","display_name":"Open-loop gain","level":5,"score":0.3264999985694885},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.3075000047683716},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.3010999858379364},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.29490000009536743},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.28619998693466187},{"id":"https://openalex.org/C38858127","wikidata":"https://www.wikidata.org/wiki/Q5441228","display_name":"Feed forward","level":2,"score":0.2680000066757202},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.2574000060558319}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3635146","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3635146","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2111445361","display_name":null,"funder_award_id":"2133106","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G607991461","display_name":null,"funder_award_id":"2239033","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,29,77,81,87,108],"two-step":[4],"incremental":[5],"analog-to-digital":[6],"converter":[7],"(ADC)":[8],"that":[9],"achieves":[10,80],"high":[11],"resolution":[12],"and":[13,23,67,124,130],"energy":[14],"efficiency":[15],"while":[16],"substantially":[17],"easing":[18],"the":[19,38,47,50,94],"input":[20,42,51],"driving":[21],"constraints":[22],"interstage":[24,62],"gain":[25,63],"variation.":[26],"By":[27],"employing":[28],"level-shifted":[30],"sub-ranging":[31],"architecture":[32],"with":[33],"an":[34],"input-tracking":[35],"(IT)":[36],"feature,":[37],"design":[39],"obviates":[40],"direct":[41],"sampling,":[43],"thereby":[44],"significantly":[45],"relaxing":[46],"demands":[48],"on":[49],"driver.":[52],"A":[53],"gain-error-and-noise":[54],"suppression":[55],"(GENS)":[56],"technique":[57],"further":[58],"enhances":[59],"robustness":[60],"to":[61],"variation":[64],"through":[65],"compact":[66],"hardware-efficient":[68],"switched-capacitor":[69],"(SC)":[70],"operations.":[71],"The":[72,115],"prototype":[73],"ADC":[74,117],"fabricated":[75],"in":[76,107,127],"65-nm":[78],"CMOS":[79],"92.1-dB":[82],"signal-to-noise-and-distortion":[83],"ratio":[84],"(SNDR)":[85],"over":[86],"50-kHz":[88],"bandwidth.":[89],"With":[90],"fully":[91],"dynamic":[92],"operation,":[93],"power":[95],"consumption":[96],"is":[97],"only":[98],"<inline-formula":[99],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[100],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[101],"<tex-math":[102],"notation=\"LaTeX\">$44.8~{\\mu":[103],"}$</tex-math>":[104],"</inline-formula>W,":[105],"resulting":[106],"Schreier":[109],"figure-of-merit":[110],"(FoM)":[111],"of":[112],"182.6":[113],"dB.":[114],"proposed":[116],"demonstrates":[118],"competitive":[119],"performance":[120],"for":[121],"low-power,":[122],"high-precision,":[123],"multiplexable":[125],"sensing":[126],"wearable,":[128],"implantable,":[129],"edge":[131],"AI":[132],"applications.":[133]},"counts_by_year":[],"updated_date":"2026-02-26T06:29:33.603293","created_date":"2025-12-04T00:00:00"}