{"id":"https://openalex.org/W4414856598","doi":"https://doi.org/10.1109/jssc.2025.3613410","title":"A 4.6 \u03bcW, 133-V <sub>PP</sub> Common-Mode Interference-Tolerant Biopotential Amplifier for Two-Electrode Recording System in 110-nm CMOS","display_name":"A 4.6 \u03bcW, 133-V <sub>PP</sub> Common-Mode Interference-Tolerant Biopotential Amplifier for Two-Electrode Recording System in 110-nm CMOS","publication_year":2025,"publication_date":"2025-10-06","ids":{"openalex":"https://openalex.org/W4414856598","doi":"https://doi.org/10.1109/jssc.2025.3613410"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2025.3613410","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3613410","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086666029","display_name":"Yongjae Park","orcid":"https://orcid.org/0000-0002-6093-9330"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongjae Park","raw_affiliation_strings":["Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6093-9330","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024497234","display_name":"Yeong-Jin Mo","orcid":null},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeong-Jin Mo","raw_affiliation_strings":["Department of System Semiconductor Engineering, Sogang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0009-9836-477X","affiliations":[{"raw_affiliation_string":"Department of System Semiconductor Engineering, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101527104","display_name":"Jeong Hun Kim","orcid":"https://orcid.org/0000-0002-5984-1571"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeong-Hoon Kim","raw_affiliation_strings":["Department of Bioengineering, University of California, San Diego, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Bioengineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059013717","display_name":"Gert Cauwenberghs","orcid":"https://orcid.org/0000-0002-3166-5529"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gert Cauwenberghs","raw_affiliation_strings":["Department of Bioengineering, University of California, San Diego, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-3166-5529","affiliations":[{"raw_affiliation_string":"Department of Bioengineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100321810","display_name":"Seong\u2010Jin Kim","orcid":"https://orcid.org/0000-0002-9353-5148"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Jin Kim","raw_affiliation_strings":["Department of System Semiconductor Engineering, Sogang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-9353-5148","affiliations":[{"raw_affiliation_string":"Department of System Semiconductor Engineering, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6264,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68681787,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"60","issue":"11","first_page":"3920","last_page":"3935"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.8752999901771545,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.8752999901771545,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.8131999969482422,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.777899980545044,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6000000238418579},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5011000037193298},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.4894999861717224},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4722000062465668},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.4431000053882599},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.43470001220703125},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.4027000069618225},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4023999869823456}],"concepts":[{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6000000238418579},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5835000276565552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5203999876976013},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5011000037193298},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.4894999861717224},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4722000062465668},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4498000144958496},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.4431000053882599},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.43470001220703125},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.4027000069618225},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4023999869823456},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.3903000056743622},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.38989999890327454},{"id":"https://openalex.org/C89123640","wikidata":"https://www.wikidata.org/wiki/Q1523756","display_name":"Instrumentation amplifier","level":5,"score":0.3790999948978424},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.3630000054836273},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3619000017642975},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3504999876022339},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.3255000114440918},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.3082999885082245},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.30550000071525574},{"id":"https://openalex.org/C26262908","wikidata":"https://www.wikidata.org/wiki/Q1307489","display_name":"Input impedance","level":3,"score":0.2890999913215637},{"id":"https://openalex.org/C11722477","wikidata":"https://www.wikidata.org/wiki/Q1056298","display_name":"Differential amplifier","level":4,"score":0.2874000072479248},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.2777999937534332}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3613410","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3613410","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2213744172","display_name":null,"funder_award_id":"202410029.01","funder_id":"https://openalex.org/F4320321377","funder_display_name":"Sogang University"},{"id":"https://openalex.org/G4795916145","display_name":null,"funder_award_id":"RS-2025-02217613","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G8776792012","display_name":null,"funder_award_id":"RS-2021-NR059470","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"}],"funders":[{"id":"https://openalex.org/F4320321377","display_name":"Sogang University","ror":"https://ror.org/056tn4839"},{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1673818769","https://openalex.org/W2044673820","https://openalex.org/W2075135661","https://openalex.org/W2098179667","https://openalex.org/W2109472370","https://openalex.org/W2152776190","https://openalex.org/W2758594094","https://openalex.org/W2765737812","https://openalex.org/W2767458146","https://openalex.org/W2790931684","https://openalex.org/W2912237760","https://openalex.org/W2921055133","https://openalex.org/W2973127906","https://openalex.org/W3015426613","https://openalex.org/W3016185756","https://openalex.org/W3027812836","https://openalex.org/W3030994757","https://openalex.org/W3041789392","https://openalex.org/W3099287764","https://openalex.org/W3134746481","https://openalex.org/W3183294861","https://openalex.org/W3206588373","https://openalex.org/W4205655477","https://openalex.org/W4285182488","https://openalex.org/W4385222532","https://openalex.org/W4387130473","https://openalex.org/W4408182624","https://openalex.org/W4408182723","https://openalex.org/W4408935372"],"related_works":[],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,12,24,41,83,115,148,202],"biopotential":[4,20,119,191],"recording":[5],"analog":[6],"front-end":[7],"(AFE)":[8],"specifically":[9],"tailored":[10],"for":[11,167],"two-electrode":[13],"measurement":[14],"system,":[15],"capable":[16],"of":[17,118,124,170],"capturing":[18],"small":[19,190],"signals":[21,120,192],"while":[22,175],"tolerating":[23],"large":[25,50,84,136],"common-mode":[26,44,86,97,111],"interference":[27],"(CMI)":[28],"over":[29,179],"130":[30],"VPP.":[31],"By":[32],"leveraging":[33],"the":[34,37,60,67,72,78,109,122,152,171,185],"Miller":[35],"effect,":[36],"proposed":[38,79,186],"CMI-Follower":[39,80,165],"provides":[40],"significantly":[42,70],"low":[43,210],"input":[45,75,110],"impedance":[46,231],"($Z_{\\text":[47],"{IN-CM-C}}$),":[48],"achieving":[49],"CMI":[51,126,177],"tolerance":[52,178],"without":[53,90],"additional":[54],"noise":[55,212],"contribution.":[56],"The":[57,164,217],"low$Z_{\\text":[58],"{IN-CM-C}}$enables":[59],"isolated":[61],"chip-ground":[62],"(Chip-GND)":[63],"to":[64,107,161,208],"precisely":[65],"track":[66],"coupled":[68],"CMI,":[69],"reducing":[71],"Chip-GND":[73,142],"referred":[74],"CMI.":[76],"Furthermore,":[77],"features":[81],"inherently":[82],"total":[85,172],"rejection":[87],"ratio":[88],"(T-CMRR)":[89],"relying":[91],"on":[92],"power-hungry":[93],"techniques.":[94],"A":[95],"noise-efficient":[96],"adaptive":[98],"current-reuse":[99],"operational":[100],"transconductance":[101],"amplifier":[102],"(CMA-CR-OTA)":[103],"is":[104],"also":[105,220],"introduced":[106],"extend":[108],"range":[112],"(ICMR),":[113],"featuring":[114],"linear":[116],"amplification":[117],"in":[121,147,201],"presence":[123],"residual":[125],"exceeding":[127],"400":[128],"mVPP,":[129],"which":[130],"can":[131],"be":[132],"caused":[133],"by":[134],"unexpected":[135],"parasitic":[137],"capacitance":[138],"($C_{\\text":[139],"{GND}}$)":[140],"between":[141],"and":[143,197,223,228],"Earth-ground":[144],"(Earth-GND).":[145],"Fabricated":[146],"110-nm":[149],"CMOS":[150],"process,":[151],"prototype":[153,218],"AFE":[154,187,219],"consumes$4.6~{\\mu":[155],"}$W":[156],"per":[157],"channel":[158],"from":[159],"1":[160],"1.5-V":[162],"supplies.":[163],"accounts":[166],"only":[168],"17%":[169],"power":[173],"consumption,":[174],"supporting":[176],"130VPP.":[180],"Experimental":[181],"results":[182],"demonstrate":[183],"that":[184],"successfully":[188],"captures":[189],"such":[193],"as":[194],"electrocardiograms":[195],"(ECGs)":[196],"electroencephalograms":[198],"(EEGs),":[199],"even":[200],"real-environment":[203],"condition":[204],"with":[205,226],"76-VPPCMI,":[206],"thanks":[207],"its":[209],"input-referred":[211],"(IRN)":[213],"of$0.43~{\\mu":[214],"}$Vrms":[215],"(0.5\u2013100Hz).":[216],"achieves":[221],"90.5-dB":[222],"102-dB":[224],"T-CMRR":[225],"5%":[227],"30%":[229],"dry-electrode":[230],"mismatches,":[232],"respectively.":[233]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}