{"id":"https://openalex.org/W4412623486","doi":"https://doi.org/10.1109/jssc.2025.3589523","title":"A Spike Sorting SoC With \u0394-Based Spike Detection and End-to-End Implementation of Autoencoder Feature Extraction Using Analog CIM","display_name":"A Spike Sorting SoC With \u0394-Based Spike Detection and End-to-End Implementation of Autoencoder Feature Extraction Using Analog CIM","publication_year":2025,"publication_date":"2025-07-24","ids":{"openalex":"https://openalex.org/W4412623486","doi":"https://doi.org/10.1109/jssc.2025.3589523"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2025.3589523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3589523","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065408994","display_name":"Vincent Lukito","orcid":"https://orcid.org/0000-0002-3642-0600"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Vincent Lukito","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3642-0600","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055738906","display_name":"Edward Choi","orcid":"https://orcid.org/0000-0002-3809-9734"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Edward Jongyoon Choi","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3809-9734","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045028723","display_name":"Ik\u2010Joon Chang","orcid":"https://orcid.org/0000-0002-8871-8695"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ik-Joon Chang","raw_affiliation_strings":["Department of Electronics, Kyung Hee University, Yongin, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-8871-8695","affiliations":[{"raw_affiliation_string":"Department of Electronics, Kyung Hee University, Yongin, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034621834","display_name":"Sohmyung Ha","orcid":"https://orcid.org/0000-0003-3589-086X"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Sohmyung Ha","raw_affiliation_strings":["Division of Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"],"raw_orcid":"https://orcid.org/0000-0003-3589-086X","affiliations":[{"raw_affiliation_string":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023245534","display_name":"Minkyu Je","orcid":"https://orcid.org/0000-0003-4580-2771"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minkyu Je","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4580-2771","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7467,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.86338859,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"61","issue":"4","first_page":"1710","last_page":"1721"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9473999738693237,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spike","display_name":"Spike (software development)","score":0.8728066682815552},{"id":"https://openalex.org/keywords/spike-sorting","display_name":"Spike sorting","score":0.8620390892028809},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.7581218481063843},{"id":"https://openalex.org/keywords/end-to-end-principle","display_name":"End-to-end principle","score":0.7292603850364685},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.5764786005020142},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5659173130989075},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5506479740142822},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5269371271133423},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.514528214931488},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4691171944141388},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11297425627708435},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.10911256074905396}],"concepts":[{"id":"https://openalex.org/C2781390188","wikidata":"https://www.wikidata.org/wiki/Q25203449","display_name":"Spike (software development)","level":2,"score":0.8728066682815552},{"id":"https://openalex.org/C2777613131","wikidata":"https://www.wikidata.org/wiki/Q2003571","display_name":"Spike sorting","level":3,"score":0.8620390892028809},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.7581218481063843},{"id":"https://openalex.org/C74296488","wikidata":"https://www.wikidata.org/wiki/Q2527392","display_name":"End-to-end principle","level":2,"score":0.7292603850364685},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.5764786005020142},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5659173130989075},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5506479740142822},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5269371271133423},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.514528214931488},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4691171944141388},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11297425627708435},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.10911256074905396},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3589523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3589523","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G356959881","display_name":null,"funder_award_id":"IITP-2025-RS-2020-II201461","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G8444715637","display_name":null,"funder_award_id":"2022-0-01030","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"}],"funders":[{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1968361507","https://openalex.org/W3136143059","https://openalex.org/W3178771700","https://openalex.org/W3035015922","https://openalex.org/W2037099207","https://openalex.org/W4399305221","https://openalex.org/W2124872530","https://openalex.org/W2097405940","https://openalex.org/W2366422659","https://openalex.org/W4377004198"],"abstract_inverted_index":{"To":[0],"process":[1],"the":[2,48,88,92,133,141,148,165,205],"substantial":[3],"data":[4],"generated":[5],"from":[6],"on-chip":[7,50,208],"neural":[8,59],"recordings,":[9],"a":[10,37,98,113,160,190],"robust":[11],"spike":[12,134],"sorting":[13],"(SS)":[14],"system-on-chip":[15],"(SoC)":[16],"with":[17,171],"minimal":[18],"latency":[19],"is":[20],"essential":[21],"to":[22,64,105,119,122,140,211],"ensure":[23],"timely":[24],"response":[25],"in":[26,82,117,154],"closed-loop":[27],"brain\u2013computer":[28],"interface":[29],"(BCI)":[30],"applications.":[31],"In":[32],"this":[33,83],"article,":[34],"we":[35],"report":[36],"<inline-formula":[38,75,197],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[39,76,173,198],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[40,77,174,199],"<tex-math":[41,78,175,200],"notation=\"LaTeX\">$\\Delta":[42,79],"$</tex-math>":[43,80,177],"</inline-formula>-based":[44],"SS":[45,93],"SoC":[46],"featuring":[47],"first":[49],"incorporation":[51],"of":[52,74,91,110,193],"analog":[53,142],"computing-in-memory":[54],"(CIM)":[55],"end-to-end":[56],"binary":[57],"autoencoder":[58],"network":[60],"(B-AENN)":[61],"feature":[62,102,137],"extraction":[63,138],"lower":[65],"computation":[66],"energy":[67],"while":[68,195],"maintaining":[69],"high":[70],"accuracy.":[71,107],"The":[72,108],"use":[73],"</inline-formula>-spike-signals":[81],"work":[84],"not":[85],"only":[86],"improves":[87],"noise":[89],"resilience":[90],"system":[94,146],"but":[95],"also":[96],"provides":[97],"better":[99],"foundation":[100],"for":[101,126,184],"extraction,":[103],"leading":[104],"enhanced":[106],"integration":[109],"B-AENN":[111],"enables":[112],"more":[114],"adaptive":[115],"approach,":[116],"comparison":[118],"predefined":[120],"methods,":[121],"extract":[123],"features,":[124],"especially":[125],"closely":[127],"resembling":[128],"spikes.":[129],"Furthermore,":[130],"by":[131],"relocating":[132],"detection":[135],"and":[136,188],"processes":[139],"domain,":[143],"our":[144],"proposed":[145],"overcomes":[147],"analog-to-digital":[149],"converter":[150],"(ADC)":[151],"conversion":[152],"bottlenecks":[153],"increasingly":[155],"dense":[156],"channels.":[157],"Fabricated":[158],"using":[159],"65-nm":[161],"CMOS":[162],"technology":[163],"process,":[164],"prototype":[166],"chip":[167],"facilitates":[168],"exceptional":[169],"performance":[170],"5.1-<inline-formula":[172],"notation=\"LaTeX\">$\\mu":[176],"</inline-formula>s":[178],"computational":[179],"latency,":[180],"making":[181],"it":[182],"ideal":[183],"closed-loop,":[185],"real-time":[186],"applications":[187],"achieving":[189],"classification":[191,209],"accuracy":[192,210],"94.54%":[194],"consuming":[196],"notation=\"LaTeX\">$3.11~{\\mu":[201],"}$</tex-math>":[202],"</inline-formula>W/ch,":[203],"representing":[204],"highest":[206],"reported":[207],"date.":[212]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2025-10-10T00:00:00"}