{"id":"https://openalex.org/W4412171132","doi":"https://doi.org/10.1109/jssc.2025.3586235","title":"An 8b 1-GS/s SAR ADC With Comparison Time Quantizer, Metastability Reduction, and On-Chip Self-Tuning Delay Achieving 47.2-dB SNDR at Nyquist Input","display_name":"An 8b 1-GS/s SAR ADC With Comparison Time Quantizer, Metastability Reduction, and On-Chip Self-Tuning Delay Achieving 47.2-dB SNDR at Nyquist Input","publication_year":2025,"publication_date":"2025-07-10","ids":{"openalex":"https://openalex.org/W4412171132","doi":"https://doi.org/10.1109/jssc.2025.3586235"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2025.3586235","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3586235","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092354462","display_name":"Jie Li","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jie Li","raw_affiliation_strings":["School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0000-5972-3092","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035971279","display_name":"Siyuan Ye","orcid":"https://orcid.org/0000-0003-0595-4682"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyuan Ye","raw_affiliation_strings":["School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076376895","display_name":"Zhuoyi Chen","orcid":"https://orcid.org/0000-0002-2781-2346"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuoyi Chen","raw_affiliation_strings":["School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079518120","display_name":"Jihang Gao","orcid":"https://orcid.org/0009-0000-7306-5428"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jihang Gao","raw_affiliation_strings":["School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0000-7306-5428","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108666285","display_name":"Xinhang Xu","orcid":"https://orcid.org/0009-0003-7381-5286"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinhang Xu","raw_affiliation_strings":["School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0003-7381-5286","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085075194","display_name":"Linxiao Shen","orcid":"https://orcid.org/0000-0001-7933-3673"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linxiao Shen","raw_affiliation_strings":["School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-7933-3673","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5092354462"],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14640388,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"61","issue":"3","first_page":"1153","last_page":"1163"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6652107238769531},{"id":"https://openalex.org/keywords/metastability","display_name":"Metastability","score":0.6173738241195679},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.5809521079063416},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5797770619392395},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.5601558685302734},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46386900544166565},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4534854292869568},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.4164007604122162},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3796501159667969},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.2949428856372833},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.25679337978363037},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22791561484336853},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.2172091007232666},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20671823620796204},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.169020414352417},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.15354791283607483},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14930909872055054},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14159861207008362}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6652107238769531},{"id":"https://openalex.org/C89464430","wikidata":"https://www.wikidata.org/wiki/Q849516","display_name":"Metastability","level":2,"score":0.6173738241195679},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.5809521079063416},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5797770619392395},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.5601558685302734},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46386900544166565},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4534854292869568},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.4164007604122162},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3796501159667969},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.2949428856372833},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25679337978363037},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22791561484336853},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.2172091007232666},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20671823620796204},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.169020414352417},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.15354791283607483},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14930909872055054},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14159861207008362},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3586235","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3586235","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5199999809265137}],"awards":[{"id":"https://openalex.org/G6243786647","display_name":null,"funder_award_id":"62474004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4242173009","https://openalex.org/W2019293713","https://openalex.org/W2556387197","https://openalex.org/W2103898286","https://openalex.org/W2889282859","https://openalex.org/W3135590747","https://openalex.org/W2981337968","https://openalex.org/W2963311259","https://openalex.org/W2056235298","https://openalex.org/W1524628891"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,9,118],"1-GS/s":[4],"8-bit":[5],"SAR":[6],"ADC":[7],"incorporating":[8],"comparison":[10],"time":[11,79],"quantizer":[12],"(<inline-formula":[13,35,60],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[14,36,61,106,137],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[15,37,62,138],"<tex-math":[16,38,63,139],"notation=\"LaTeX\">$t_{\\text":[17,39,64],"{comp}}$</tex-math>":[18,40,65],"</inline-formula>":[19,41,66,142],"quantizer)":[20,42,67],"and":[21,32,71,92,108],"an":[22],"on-chip":[23],"self-tuning":[24,75],"delay":[25,76],"to":[26],"mitigate":[27],"metastability":[28,58,129,133],"while":[29],"enhancing":[30],"resolution":[31,53],"speed.":[33,56],"The":[34,57,74],"extracts":[43],"additional":[44],"bit":[45],"information":[46],"by":[47],"quantizing":[48],"the":[49,100,126],"comparator":[50],"delay,":[51],"improving":[52],"without":[54],"sacrificing":[55],"from":[59],"is":[68],"also":[69],"analyzed":[70],"effectively":[72],"suppressed.":[73],"dynamically":[77],"adjusts":[78],"thresholds":[80],"based":[81],"on":[82],"hit":[83],"ratio":[84,112],"detection,":[85],"ensuring":[86],"robust":[87],"operation":[88],"across":[89],"process,":[90],"voltage,":[91],"temperature":[93],"(PVT)":[94],"variations.":[95],"Fabricated":[96],"in":[97,135],"22-nm":[98],"CMOS,":[99],"prototype":[101],"occupies":[102],"only":[103],"0.0032":[104],"mm<sup":[105],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[107],"achieves":[109],"47.2-dB":[110],"signal-to-noise-and-distortion":[111],"(SNDR)":[113],"at":[114],"1":[115],"GS/s":[116],"with":[117,131],"Nyquist":[119],"input,":[120],"consuming":[121],"4.15":[122],"mW.":[123],"Measurements":[124],"confirm":[125],"effectiveness":[127],"of":[128],"suppression,":[130],"no":[132],"observed":[134],"<inline-formula":[136],"notation=\"LaTeX\">$2\\times":[140],"10^{11}$</tex-math>":[141],"data":[143],"points.":[144]},"counts_by_year":[],"updated_date":"2026-02-26T06:29:33.603293","created_date":"2025-10-10T00:00:00"}