{"id":"https://openalex.org/W4412567145","doi":"https://doi.org/10.1109/jssc.2025.3578413","title":"An Adaptive Clock Duty-Cycle Controller to Mitigate Aging-Induced Clock Duty-Cycle Distortion in Automotive and IoT Processors","display_name":"An Adaptive Clock Duty-Cycle Controller to Mitigate Aging-Induced Clock Duty-Cycle Distortion in Automotive and IoT Processors","publication_year":2025,"publication_date":"2025-07-22","ids":{"openalex":"https://openalex.org/W4412567145","doi":"https://doi.org/10.1109/jssc.2025.3578413"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2025.3578413","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3578413","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038164519","display_name":"Daniel Yingling","orcid":null},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Daniel J. Yingling","raw_affiliation_strings":["Qualcomm Technologies, Inc, Raleigh, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, Raleigh, USA","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025728433","display_name":"Yimai Peng","orcid":"https://orcid.org/0000-0001-9860-0175"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yimai Peng","raw_affiliation_strings":["Qualcomm Technologies, Inc, Raleigh, USA"],"raw_orcid":"https://orcid.org/0000-0001-9860-0175","affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, Raleigh, USA","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5094136757","display_name":"Robert J. Vachon","orcid":null},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Robert J. Vachon","raw_affiliation_strings":["Qualcomm Technologies, Inc, Raleigh, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, Raleigh, USA","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029847189","display_name":"D. Pal","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dipti R. Pal","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111069791","display_name":"Sagar Jariwala","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sagar J. Jariwala","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073773221","display_name":"Felipe R. G. Cabral","orcid":"https://orcid.org/0000-0001-8602-0202"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Felipe R. G. Cabral","raw_affiliation_strings":["Qualcomm Technologies, Inc, Cork, Ireland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, Cork, Ireland","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100716832","display_name":"Shih-Hsin Hu","orcid":"https://orcid.org/0000-0002-3841-5127"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shih-Hsin Hu","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":"https://orcid.org/0000-0002-3841-5127","affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037233987","display_name":"Rajan Verma","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajan Verma","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5094136758","display_name":"Vamshidhar Chiranji","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vamshidhar Chiranji","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100703861","display_name":"Anil Kumar","orcid":"https://orcid.org/0000-0002-2261-9686"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anil Kumar","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112811520","display_name":"Santanu Sarma","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Santanu Sarma","raw_affiliation_strings":["Qualcomm Technologies, Inc, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, San Diego, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014850579","display_name":"Keith Bowman","orcid":"https://orcid.org/0000-0002-7638-9783"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Keith A. Bowman","raw_affiliation_strings":["Qualcomm Technologies, Inc, Raleigh, USA"],"raw_orcid":"https://orcid.org/0000-0002-7638-9783","affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc, Raleigh, USA","institution_ids":["https://openalex.org/I19268510"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3075,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52051047,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"61","issue":"2","first_page":"713","last_page":"723"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9652000069618225,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9652000069618225,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9641000032424927,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9417999982833862,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.7974035739898682},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5486061573028564},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5003504753112793},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4586607813835144},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.45738619565963745},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.4490431845188141},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23434144258499146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18361735343933105},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15155065059661865},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.057146668434143066}],"concepts":[{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.7974035739898682},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5486061573028564},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5003504753112793},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4586607813835144},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.45738619565963745},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.4490431845188141},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23434144258499146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18361735343933105},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15155065059661865},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.057146668434143066},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3578413","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3578413","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1999245428","https://openalex.org/W2012541386","https://openalex.org/W2092075230","https://openalex.org/W2113556928","https://openalex.org/W2220643768","https://openalex.org/W2277822878","https://openalex.org/W3134808003","https://openalex.org/W4317794295","https://openalex.org/W4392746363"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2522768275","https://openalex.org/W2352938035","https://openalex.org/W2351672553","https://openalex.org/W2373392303","https://openalex.org/W2765894405","https://openalex.org/W1884735063","https://openalex.org/W2372668238","https://openalex.org/W2900105712","https://openalex.org/W2560421750"],"abstract_inverted_index":{"An":[0],"adaptive":[1,52],"clock":[2,12,88,127,132],"duty-cycle":[3,13,44,57],"controller":[4],"(DCC)":[5],"mitigates":[6],"the":[7,17,36,63,67,73,76,84,87,104,123,126,135],"adverse":[8],"effect":[9],"of":[10,23,28,90],"aging-induced":[11,131],"distortion":[14],"(DCD)":[15],"on":[16],"minimum":[18],"supply":[19],"voltage":[20],"($V_{\\text":[21],"{MIN}}$)":[22],"high-performance":[24],"automotive":[25,114],"and":[26,134,145],"Internet":[27],"Things":[29],"(IoT)":[30],"processors.":[31],"The":[32,47,60],"all-digital":[33],"DCC":[34,85,105,124],"measures":[35],"DCD":[37,74,133],"from":[38,130],"a":[39,43,56,91,108],"clock-leaf":[40,77],"node":[41,69],"with":[42,50,107],"monitor":[45],"(DCM).":[46],"DCM":[48],"interfaces":[49],"an":[51],"control":[53],"to":[54,70,140],"configure":[55],"adjuster":[58],"(DCA).":[59],"DCA":[61],"adapts":[62],"duty":[64,128],"cycle":[65,129],"at":[66,75,142,147],"clock-root":[68],"compensate":[71],"for":[72,113],"nodes.":[78],"A":[79],"3-nm":[80],"test":[81],"chip":[82],"integrates":[83],"into":[86],"path":[89],"high-performance,":[92],"industry-level":[93],"neural":[94],"processing":[95],"unit":[96,99],"(NPU)":[97],"matrix-multiplication":[98],"(MXU).":[100],"Silicon":[101,118],"measurements":[102,121],"validate":[103],"system":[106],"self-checking":[109],"test,":[110],"as":[111],"required":[112],"processor":[115],"safety":[116],"compliance.":[117],"accelerated-stress":[119],"test-chip":[120],"demonstrate":[122],"restoring":[125],"corresponding":[136],"MXU$V_{\\text":[137],"{MIN}}$degradation,":[138],"up":[139],"10%":[141],"1.2":[143],"GHz":[144],"9%":[146],"0.6":[148],"GHz.":[149]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}