{"id":"https://openalex.org/W4408840214","doi":"https://doi.org/10.1109/jssc.2025.3551156","title":"A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC With On-Chip Bit-Weight Calibration","display_name":"A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC With On-Chip Bit-Weight Calibration","publication_year":2025,"publication_date":"2025-03-26","ids":{"openalex":"https://openalex.org/W4408840214","doi":"https://doi.org/10.1109/jssc.2025.3551156"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2025.3551156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3551156","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Chao Chen","orcid":"https://orcid.org/0009-0002-3988-4360"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Chen","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0002-3988-4360","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034764005","display_name":"Yuan Zhu","orcid":"https://orcid.org/0000-0003-4641-2847"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhu Yuan","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072148138","display_name":"Peng Cao","orcid":"https://orcid.org/0000-0001-8735-2989"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Cao","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8735-2989","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089070385","display_name":"Jiawei Xu","orcid":"https://orcid.org/0000-0002-4150-0971"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Xu","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-4150-0971","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082092557","display_name":"Zhiliang Hong","orcid":"https://orcid.org/0000-0002-9968-5964"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Hong","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9968-5964","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.9253,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.73513186,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"60","issue":"10","first_page":"3707","last_page":"3719"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6857330799102783},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.6271706223487854},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5938206911087036},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5510044693946838},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4624936878681183},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40039968490600586},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.38183459639549255},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2281675934791565},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19716984033584595},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1551809310913086},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1468646228313446},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08080393075942993},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08067446947097778},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.0708824098110199},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.06079551577568054}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6857330799102783},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.6271706223487854},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5938206911087036},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5510044693946838},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4624936878681183},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40039968490600586},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.38183459639549255},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2281675934791565},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19716984033584595},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1551809310913086},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1468646228313446},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08080393075942993},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08067446947097778},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0708824098110199},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.06079551577568054}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3551156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3551156","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1586057131","https://openalex.org/W1981756115","https://openalex.org/W1986817445","https://openalex.org/W1987574711","https://openalex.org/W2007472976","https://openalex.org/W2012136225","https://openalex.org/W2029539778","https://openalex.org/W2032844593","https://openalex.org/W2082486400","https://openalex.org/W2101004723","https://openalex.org/W2101468035","https://openalex.org/W2111752868","https://openalex.org/W2132406028","https://openalex.org/W2144216554","https://openalex.org/W2144429965","https://openalex.org/W2159346009","https://openalex.org/W2159900105","https://openalex.org/W2164251692","https://openalex.org/W2167728023","https://openalex.org/W2175250124","https://openalex.org/W2180407616","https://openalex.org/W2286453822","https://openalex.org/W2903551423","https://openalex.org/W2908158279","https://openalex.org/W2910052007","https://openalex.org/W2921258117","https://openalex.org/W2963976731","https://openalex.org/W2981076955","https://openalex.org/W2988320438","https://openalex.org/W3081064382","https://openalex.org/W3090442715","https://openalex.org/W3130882026","https://openalex.org/W4206136496","https://openalex.org/W4239486830","https://openalex.org/W4383503616","https://openalex.org/W4386432168","https://openalex.org/W4390421986","https://openalex.org/W4392745796","https://openalex.org/W4392746565","https://openalex.org/W4401881131"],"related_works":["https://openalex.org/W4327546585","https://openalex.org/W2411923897","https://openalex.org/W4394546135","https://openalex.org/W4285347720","https://openalex.org/W4200259850","https://openalex.org/W2333831899","https://openalex.org/W2484894494","https://openalex.org/W2367385042","https://openalex.org/W4381186982","https://openalex.org/W2040781570"],"abstract_inverted_index":{"This":[0,52],"article":[1],"presents":[2],"a":[3,18,68,82,91,101],"single-channel":[4],"13-bit":[5],"pipelined":[6],"successive-approximation":[7],"register":[8],"(SAR)":[9],"analog-to-digital":[10],"converter":[11,36],"(ADC).":[12],"To":[13],"achieve":[14],"energy-efficient":[15],"residue":[16],"amplification,":[17],"ring":[19],"amplifier":[20],"(ringamp)":[21],"with":[22],"optimized":[23],"biasing":[24],"and":[25,34,49,80,100],"common-mode":[26],"feedback":[27],"(CMFB)":[28],"is":[29],"utilized.":[30],"The":[31],"inter-stage":[32],"gain":[33],"digital-to-analog":[35],"(DAC)":[37],"mismatch":[38],"are":[39],"calibrated":[40],"by":[41],"leveraging":[42],"the":[43,72],"proposed":[44],"auxiliary-latch-based":[45],"comparison-threshold":[46],"dithering":[47],"(CTD)":[48],"separate-averaging":[50],"algorithm.":[51],"calibration":[53],"achieves":[54,81],"fast":[55],"convergence,":[56],"requiring":[57],"only":[58],"4096":[59],"dither-injected":[60],"samples":[61],"for":[62],"background":[63],"gain-error":[64],"correction.":[65],"Fabricated":[66],"in":[67],"22-nm":[69],"CMOS":[70],"process,":[71],"ADC":[73],"consumes":[74],"9.93":[75],"mW":[76],"at":[77],"475":[78],"MS/s":[79],"peak":[83],"signal-to-noise-and-distortion":[84],"ratio":[85],"(SNDR)":[86],"of":[87,94,97,104,107],"71.5":[88],"dB,":[89],"yielding":[90],"Schreier":[92],"figure":[93,103],"merit":[95,105],"(FoMS)":[96],"175.3":[98],"dB":[99],"Walden":[102],"(FoMW)":[106],"6.8":[108],"fJ/conversion-step.":[109]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}