{"id":"https://openalex.org/W4406983396","doi":"https://doi.org/10.1109/jssc.2025.3531911","title":"A 25\u201331-GHz Compact True Power Detector With &gt;33-dB Dynamic Range and Intrinsic Phase Offset Compensation in 40-nm Bulk CMOS","display_name":"A 25\u201331-GHz Compact True Power Detector With &gt;33-dB Dynamic Range and Intrinsic Phase Offset Compensation in 40-nm Bulk CMOS","publication_year":2025,"publication_date":"2025-01-30","ids":{"openalex":"https://openalex.org/W4406983396","doi":"https://doi.org/10.1109/jssc.2025.3531911"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2025.3531911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3531911","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053876473","display_name":"Haoqi Qin","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haoqi Qin","raw_affiliation_strings":["State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0004-2949-7716","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111556869","display_name":"Junjie Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junjie Gu","raw_affiliation_strings":["State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036851370","display_name":"Hao Xu","orcid":"https://orcid.org/0000-0002-0044-1231"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Xu","raw_affiliation_strings":["State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-0044-1231","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061181973","display_name":"Zhiwei Xu","orcid":"https://orcid.org/0000-0003-2279-0632"},"institutions":[{"id":"https://openalex.org/I31847773","display_name":"Zhejiang Ocean University","ror":"https://ror.org/03mys6533","country_code":"CN","type":"education","lineage":["https://openalex.org/I31847773"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwei Xu","raw_affiliation_strings":["Institute of Marine Electronics and Intelligent Systems, Ocean College Engineering Research Center of Oceanic Sensing Technology and Equipment, Ministry of Education, Key Laboratory of Ocean Observation-Imaging Testbed of Zhejiang Province, Zhejiang University, Zhoushan, China","Ocean College, Engineering Research Center of Oceanic Sensing Technology and Equipment, Ministry of Education, Key Laboratory of Ocean Observation-Imaging Testbed of Zhejiang Province, Institute of Marine Electronics and Intelligent Systems, Zhejiang University, Zhoushan, China"],"raw_orcid":"https://orcid.org/0000-0003-2279-0632","affiliations":[{"raw_affiliation_string":"Institute of Marine Electronics and Intelligent Systems, Ocean College Engineering Research Center of Oceanic Sensing Technology and Equipment, Ministry of Education, Key Laboratory of Ocean Observation-Imaging Testbed of Zhejiang Province, Zhejiang University, Zhoushan, China","institution_ids":["https://openalex.org/I31847773"]},{"raw_affiliation_string":"Ocean College, Engineering Research Center of Oceanic Sensing Technology and Equipment, Ministry of Education, Key Laboratory of Ocean Observation-Imaging Testbed of Zhejiang Province, Institute of Marine Electronics and Intelligent Systems, Zhejiang University, Zhoushan, China","institution_ids":["https://openalex.org/I31847773"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053341136","display_name":"Pengcheng Jia","orcid":"https://orcid.org/0000-0001-5166-4921"},"institutions":[{"id":"https://openalex.org/I4210096908","display_name":"Fujian Star-net (China)","ror":"https://ror.org/00vn8k536","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210096908"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengcheng Jia","raw_affiliation_strings":["Starway Communication Inc., Guangzhou, Guangdong, China","Starway Communication Inc, Guangzhou, Guangdong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Starway Communication Inc., Guangzhou, Guangdong, China","institution_ids":["https://openalex.org/I4210096908"]},{"raw_affiliation_string":"Starway Communication Inc, Guangzhou, Guangdong, China","institution_ids":["https://openalex.org/I4210096908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083182163","display_name":"Na Yan","orcid":"https://orcid.org/0000-0001-7012-404X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Na Yan","raw_affiliation_strings":["State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7012-404X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chip and Systems, Institute of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics, State Key Laboratory of Integrated Chip and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4210119392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5053876473"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210119392","https://openalex.org/I4210132426"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01293372,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"60","issue":"5","first_page":"1570","last_page":"1583"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7097159028053284},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6798310279846191},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5750094652175903},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5387324690818787},{"id":"https://openalex.org/keywords/phase-compensation","display_name":"Phase compensation","score":0.5219494700431824},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5101411938667297},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49635082483291626},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4849848747253418},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4039629101753235},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38193678855895996},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33130478858947754},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.20227214694023132},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1355063021183014},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.13249951601028442}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7097159028053284},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6798310279846191},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5750094652175903},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5387324690818787},{"id":"https://openalex.org/C2984249346","wikidata":"https://www.wikidata.org/wiki/Q185553","display_name":"Phase compensation","level":3,"score":0.5219494700431824},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5101411938667297},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49635082483291626},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4849848747253418},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4039629101753235},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38193678855895996},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33130478858947754},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.20227214694023132},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1355063021183014},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.13249951601028442},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2025.3531911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2025.3531911","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.800000011920929,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G8995563456","display_name":null,"funder_award_id":"2020YFB1806300","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W2020195524","https://openalex.org/W2026781900","https://openalex.org/W2052693955","https://openalex.org/W2062477349","https://openalex.org/W2091445772","https://openalex.org/W2104074482","https://openalex.org/W2108397269","https://openalex.org/W2119129637","https://openalex.org/W2123233947","https://openalex.org/W2763292674","https://openalex.org/W2912583863","https://openalex.org/W2929383960","https://openalex.org/W2941952695","https://openalex.org/W2949047240","https://openalex.org/W2965082075","https://openalex.org/W2972064036","https://openalex.org/W3015344750","https://openalex.org/W3035275655","https://openalex.org/W3107883801","https://openalex.org/W3127346093","https://openalex.org/W3177992047","https://openalex.org/W4200500969","https://openalex.org/W4214876017","https://openalex.org/W4286571727","https://openalex.org/W4293255309","https://openalex.org/W4312236198","https://openalex.org/W4319865464","https://openalex.org/W4392746402","https://openalex.org/W4392776132","https://openalex.org/W4396507023","https://openalex.org/W4400945559","https://openalex.org/W4400945771"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2995582362","https://openalex.org/W2539021588","https://openalex.org/W2355936982","https://openalex.org/W2013214760","https://openalex.org/W2357378429","https://openalex.org/W2038111116","https://openalex.org/W2347626178","https://openalex.org/W2378263425","https://openalex.org/W4236177372"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,11,48,99,130,138,151],"compact":[4,30],"mixer-based":[5],"true":[6],"power":[7,13,31,111,135,153,165],"detector":[8,32,112,136],"integrated":[9],"within":[10],"Ka-band":[12],"amplifier":[14],"(PA).":[15],"By":[16],"performing":[17],"capacitive":[18],"voltage":[19,81,123],"sensing":[20,24,126],"and":[21,82,94,124,149],"inductive":[22],"current":[23,83,85,125],"at":[25],"the":[26,29,34,44,58,71,80,91,109,119,122,134],"primary":[27],"coil,":[28],"eliminates":[33],"need":[35],"for":[36],"additional":[37],"area-consuming":[38],"passive":[39],"components":[40],"while":[41],"still":[42],"allowing":[43],"PA":[45],"to":[46,98,157],"maintain":[47],"single-ended":[49],"antenna":[50],"output.":[51],"The":[52,76],"control":[53],"of":[54,141],"magnetic":[55,65],"coupling":[56],"with":[57,163],"secondary":[59],"coil":[60],"is":[61],"achieved":[62],"by":[63,117],"exploiting":[64],"flux":[66],"cancellation":[67],"rather":[68],"than":[69],"increasing":[70],"physical":[72],"distance":[73],"between":[74,121],"coils.":[75],"active":[77],"mixer":[78],"multiplying":[79],"uses":[84],"bleeding":[86],"technique":[87],"that":[88],"simultaneously":[89],"suppresses":[90],"flicker":[92],"noise":[93],"enhances":[95],"linearity,":[96],"leading":[97],"state-of-art":[100],"dynamic":[101],"range.":[102],"Without":[103],"phase":[104,115],"shifters":[105],"or":[106],"resistor":[107],"termination,":[108],"overall":[110],"achieves":[113],"intrinsic":[114],"compensation":[116],"matching":[118],"delays":[120],"paths.":[127],"Fabricated":[128],"in":[129],"40-nm":[131],"CMOS":[132],"process,":[133],"occupies":[137],"core":[139],"area":[140],"<inline-formula":[142],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[143],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[144],"<tex-math":[145],"notation=\"LaTeX\">$3520~\\mu":[146],"$":[147],"</tex-math></inline-formula>m2":[148],"covers":[150],"detectable":[152],"range":[154],"from":[155],"\u221218":[156],"+15":[158],"dBm":[159],"across":[160],"25\u201331":[161],"GHz":[162],"12.1-mW":[164],"consumption.":[166]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}