{"id":"https://openalex.org/W4404057044","doi":"https://doi.org/10.1109/jssc.2024.3479273","title":"A 65-nm Proactive Power Management Technique With Real-Time Machine Learning Engine for Droop Prediction and Mitigation on Microprocessors","display_name":"A 65-nm Proactive Power Management Technique With Real-Time Machine Learning Engine for Droop Prediction and Mitigation on Microprocessors","publication_year":2024,"publication_date":"2024-11-05","ids":{"openalex":"https://openalex.org/W4404057044","doi":"https://doi.org/10.1109/jssc.2024.3479273"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2024.3479273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3479273","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100330041","display_name":"Xi Chen","orcid":"https://orcid.org/0000-0003-3276-2918"},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xi Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101226784","display_name":"Jiaxiang Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiaxiang Feng","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059212127","display_name":"Aly Shoukry","orcid":null},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aly Shoukry","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051085669","display_name":"Xin Zhang","orcid":"https://orcid.org/0000-0002-0579-2268"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Zhang","raw_affiliation_strings":["IBM T. J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024940586","display_name":"Raveesh Magod","orcid":"https://orcid.org/0000-0003-1014-8802"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raveesh Magod","raw_affiliation_strings":["Texas Instruments, Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000682696","display_name":"Nachiket Desai","orcid":"https://orcid.org/0000-0002-6795-6440"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nachiket Desai","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005991726","display_name":"Jie Gu","orcid":"https://orcid.org/0000-0003-2912-7294"},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jie Gu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA","institution_ids":["https://openalex.org/I111979921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100330041"],"corresponding_institution_ids":["https://openalex.org/I111979921"],"apc_list":null,"apc_paid":null,"fwci":1.5565,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.84549088,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":100},"biblio":{"volume":"60","issue":"6","first_page":"2170","last_page":"2181"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.9077686667442322},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6051682233810425},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5325291156768799},{"id":"https://openalex.org/keywords/power-management","display_name":"Power management","score":0.518159031867981},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4307664632797241},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.42896491289138794},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2709614634513855},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18781617283821106},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09234762191772461}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.9077686667442322},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6051682233810425},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5325291156768799},{"id":"https://openalex.org/C2778774385","wikidata":"https://www.wikidata.org/wiki/Q4437810","display_name":"Power management","level":3,"score":0.518159031867981},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4307664632797241},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.42896491289138794},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2709614634513855},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18781617283821106},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09234762191772461},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2024.3479273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3479273","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1977476862","https://openalex.org/W2002072104","https://openalex.org/W2015917466","https://openalex.org/W2042255220","https://openalex.org/W2079706534","https://openalex.org/W2094839871","https://openalex.org/W2146410479","https://openalex.org/W2151396120","https://openalex.org/W2173352832","https://openalex.org/W2518078226","https://openalex.org/W2519730952","https://openalex.org/W2594678906","https://openalex.org/W2743718435","https://openalex.org/W2769167907","https://openalex.org/W2791679455","https://openalex.org/W2898944809","https://openalex.org/W2899291086","https://openalex.org/W2902845677","https://openalex.org/W2920866063","https://openalex.org/W2922195958","https://openalex.org/W2964770872","https://openalex.org/W2964976745","https://openalex.org/W3015443050","https://openalex.org/W3015541410","https://openalex.org/W3015590138","https://openalex.org/W3027866417","https://openalex.org/W3095877874","https://openalex.org/W3108884773","https://openalex.org/W3113471851","https://openalex.org/W3133501117","https://openalex.org/W3133530612","https://openalex.org/W3134808003","https://openalex.org/W3172967059","https://openalex.org/W3192772839","https://openalex.org/W3206406968","https://openalex.org/W4220684894","https://openalex.org/W4232751114","https://openalex.org/W4360605419","https://openalex.org/W4376130850","https://openalex.org/W4385212413"],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2733481536","https://openalex.org/W2765340260","https://openalex.org/W2153130273","https://openalex.org/W3023710910","https://openalex.org/W2076823813","https://openalex.org/W3008686614","https://openalex.org/W2143080380","https://openalex.org/W1589163333","https://openalex.org/W2770705885"],"abstract_inverted_index":{"A":[0],"proactive":[1,68,121],"power":[2,83,142],"management":[3],"(PM)":[4],"scheme":[5,122],"for":[6,67],"mitigating":[7],"dynamic":[8,35],"supply":[9,36,61,69,97,117],"droop":[10,32,62,107],"is":[11,37,56,109],"proposed":[12,120],"with":[13,89,145],"a":[14,23,30,50,64,77,105,127],"fully":[15],"integrated":[16,73],"buck":[17,74],"converter,":[18],"an":[19,40],"RISC-V":[20],"CPU":[21,43,137],"core,":[22],"real-time":[24],"machine":[25],"learning":[26],"engine":[27],"(MLE),":[28],"and":[29,44,94,131],"safety":[31,106],"guardband.":[33],"The":[34,54,119],"modeled":[38],"using":[39],"RV32IM":[41],"ISA":[42],"the":[45,60,72,82,90,113,116],"model":[46],"was":[47],"simulated":[48],"in":[49],"customized":[51],"co-sim":[52],"environment.":[53],"MLE":[55,93],"used":[57],"to":[58,87,111,134],"predict":[59],"on":[63,126],"cycle-by-cycle":[65],"basis":[66],"regulation":[70],"from":[71],"converter":[75],"through":[76],"fast":[78,147],"PWM":[79],"modulation":[80],"of":[81,92,115],"switches.":[84],"In":[85],"addition,":[86],"deal":[88],"misprediction":[91],"other":[95],"long-term":[96],"droops":[98],"that":[99],"cannot":[100],"be":[101],"captured":[102],"by":[103],"MLE,":[104],"guardband":[108],"implemented":[110,125],"secure":[112],"integrity":[114],"voltage.":[118],"has":[123],"been":[124],"65-nm":[128],"test":[129],"chip":[130],"demonstrated":[132],"up":[133],"9.9%":[135],"higher":[136,141],"frequency":[138],"or":[139],"9.2%":[140],"efficiency":[143],"compared":[144],"prior":[146],"digital":[148],"LDO":[149],"schemes.":[150]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-05T09:29:38.588285","created_date":"2025-10-10T00:00:00"}