{"id":"https://openalex.org/W4398187583","doi":"https://doi.org/10.1109/jssc.2024.3400621","title":"EQZ-LDO: A Secure Digital Low Dropout Regulator Armed With Detection-Driven Protection Against Correlation Power Analysis","display_name":"EQZ-LDO: A Secure Digital Low Dropout Regulator Armed With Detection-Driven Protection Against Correlation Power Analysis","publication_year":2024,"publication_date":"2024-05-21","ids":{"openalex":"https://openalex.org/W4398187583","doi":"https://doi.org/10.1109/jssc.2024.3400621"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2024.3400621","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3400621","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100786430","display_name":"Mao Li","orcid":"https://orcid.org/0009-0009-5968-7250"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mao Li","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA"],"raw_orcid":"https://orcid.org/0009-0009-5968-7250","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068836418","display_name":"Jae\u2010Han Park","orcid":"https://orcid.org/0000-0001-5837-3131"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaehan Park","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007461519","display_name":"Sung Justin Kim","orcid":"https://orcid.org/0000-0001-5672-0689"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]},{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sung Justin Kim","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA","Nvidia, Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Nvidia, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025421871","display_name":"Dongkwun Kim","orcid":"https://orcid.org/0000-0002-1379-0561"},"institutions":[{"id":"https://openalex.org/I4210153776","display_name":"Apple (United States)","ror":"https://ror.org/059hsda18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153776"]},{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dongkwun Kim","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA","Apple, Cupertino, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-1379-0561","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Apple, Cupertino, CA, USA","institution_ids":["https://openalex.org/I4210153776"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039276616","display_name":"Sanu Mathew","orcid":"https://orcid.org/0000-0003-1344-7533"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanu K. Mathew","raw_affiliation_strings":["Intel Labs, Intel Corporation, Hillsboro, OR, USA"],"raw_orcid":"https://orcid.org/0000-0003-1344-7533","affiliations":[{"raw_affiliation_string":"Intel Labs, Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076642880","display_name":"Vivek De","orcid":"https://orcid.org/0000-0001-5207-1079"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vivek De","raw_affiliation_strings":["Intel Labs, Intel Corporation, Hillsboro, OR, USA"],"raw_orcid":"https://orcid.org/0000-0001-5207-1079","affiliations":[{"raw_affiliation_string":"Intel Labs, Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011887658","display_name":"Mingoo Seok","orcid":"https://orcid.org/0000-0002-9722-0979"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA"],"raw_orcid":"https://orcid.org/0000-0002-9722-0979","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3462,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55846152,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"59","issue":"11","first_page":"3806","last_page":"3815"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dropout","display_name":"Dropout (neural networks)","score":0.6995447278022766},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.5898541212081909},{"id":"https://openalex.org/keywords/ultra-low-power","display_name":"Ultra low power","score":0.478183776140213},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4449997544288635},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.3675254285335541},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3258717954158783},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.3231510519981384},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.3103328049182892},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25800544023513794},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2556332051753998},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2094287872314453},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1665424406528473},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.08639881014823914}],"concepts":[{"id":"https://openalex.org/C2776145597","wikidata":"https://www.wikidata.org/wiki/Q25339462","display_name":"Dropout (neural networks)","level":2,"score":0.6995447278022766},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.5898541212081909},{"id":"https://openalex.org/C3017773396","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Ultra low power","level":4,"score":0.478183776140213},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4449997544288635},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.3675254285335541},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3258717954158783},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3231510519981384},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.3103328049182892},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25800544023513794},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2556332051753998},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2094287872314453},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1665424406528473},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.08639881014823914},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2024.3400621","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3400621","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W148441276","https://openalex.org/W1556212265","https://openalex.org/W1562542037","https://openalex.org/W1613874182","https://openalex.org/W1984863066","https://openalex.org/W2005476978","https://openalex.org/W2109309427","https://openalex.org/W2154909745","https://openalex.org/W2592705047","https://openalex.org/W2768105115","https://openalex.org/W2799920367","https://openalex.org/W2804635567","https://openalex.org/W2921643410","https://openalex.org/W3015928503","https://openalex.org/W3109014748","https://openalex.org/W3155757514","https://openalex.org/W3158373903","https://openalex.org/W3185500789","https://openalex.org/W4286571866"],"related_works":["https://openalex.org/W1982997428","https://openalex.org/W2044172536","https://openalex.org/W2371498377","https://openalex.org/W2370995213","https://openalex.org/W3185987145","https://openalex.org/W4366165321","https://openalex.org/W3081405802","https://openalex.org/W4287514677","https://openalex.org/W2017190659","https://openalex.org/W4282007662"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"equalizer":[3],"(EQZ)-low":[4],"dropout":[5,13],"regulator":[6,14],"(LDO),":[7],"an":[8,18,48,187],"innovative,":[9],"secure":[10,157],"digital":[11],"low":[12,36],"(DLDO)":[15],"that":[16,173],"integrates":[17],"attack":[19],"detector":[20],"and":[21],"a":[22,34,53,71,118,141,153],"detection-driven":[23],"protection":[24,102],"scheme":[25],"to":[26,103],"mitigate":[27],"correlation":[28],"power":[29,111],"analysis":[30],"(CPA).":[31],"EQZ-LDO":[32,50],"incurs":[33],"remarkably":[35],"0.5%":[37],"energy-delay-product":[38],"(EDP)":[39],"overhead":[40,144],"by":[41,57,93,192],"activating":[42],"protective":[43],"measures":[44],"exclusively":[45],"upon":[46],"detecting":[47],"attack.":[49],"can":[51],"detect":[52],"resistance":[54],"change":[55],"induced":[56],"CPA":[58],"attempts":[59],"as":[60,62],"small":[61,142],"1":[63],"<inline-formula":[64,77,84,180,194],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[65,78,85,181,195],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[66,79,86,182,196],"<tex-math":[67,80,87,183,197],"notation=\"LaTeX\">$\\Omega$</tex-math>":[68],"</inline-formula>":[69,82,89,185,199],"across":[70],"wide":[72],"temperature":[73],"range":[74],"of":[75,121,133,163,189,210],"0":[76],"notation=\"LaTeX\">$^\\circ$</tex-math>":[81,88],"C\u201390":[83],"C.":[90],"Following":[91],"detection,":[92],"leveraging":[94],"the":[95,98,106,110,115,136,166,174,179,203,207],"switched-capacitor-based":[96],"equalizer,":[97],"DLDO":[99],"automatically":[100],"triggers":[101],"effectively":[104],"equalize":[105],"current":[107,116],"draw":[108],"from":[109],"supply,":[112],"significantly":[113],"attenuating":[114],"signature,":[117],"major":[119],"source":[120],"potential":[122,190],"secret":[123],"information":[124],"leakage.":[125],"The":[126],"equalization":[127],"requires":[128],"only":[129,140],"one":[130],"more":[131],"pair":[132],"switches":[134],"than":[135],"baseline":[137],"DLDO,":[138],"incurring":[139],"area":[143],"An":[145],"EQZ-LDO-equipped":[146],"advanced":[147],"encryption":[148],"standard":[149],"(AES)-128":[150],"module":[151],"in":[152],"65-nm":[154],"CMOS":[155],"remains":[156],"after":[158],"at":[159],"least":[160],"10":[161,208],"M-trace":[162,209],"CPA.":[164,211],"Furthermore,":[165],"test":[167],"vector":[168],"leakage":[169],"assessment":[170],"(TVLA)":[171],"reveals":[172],"proposed":[175],"circuits":[176],"drastically":[177],"reduce":[178],"notation=\"LaTeX\">$t$</tex-math>":[184],"-value,":[186],"indicator":[188],"leakage,":[191],"13.36":[193],"notation=\"LaTeX\">$\\times$</tex-math>":[198],",":[200],"compared":[201],"with":[202],"unprotected":[204],"AES":[205],"for":[206]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}