{"id":"https://openalex.org/W4394698937","doi":"https://doi.org/10.1109/jssc.2024.3381595","title":"A 3 THz CMOS Image Sensor","display_name":"A 3 THz CMOS Image Sensor","publication_year":2024,"publication_date":"2024-04-10","ids":{"openalex":"https://openalex.org/W4394698937","doi":"https://doi.org/10.1109/jssc.2024.3381595"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2024.3381595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3381595","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100343876","display_name":"Min Liu","orcid":"https://orcid.org/0000-0002-0616-2727"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Liu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0616-2727","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019767088","display_name":"Ziteng Cai","orcid":"https://orcid.org/0009-0001-6621-447X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziteng Cai","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0001-6621-447X","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066771573","display_name":"Z. G. Wang","orcid":"https://orcid.org/0000-0001-8256-2848"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhe Wang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8256-2848","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057270742","display_name":"Shaohua Zhou","orcid":"https://orcid.org/0000-0003-3292-9511"},"institutions":[{"id":"https://openalex.org/I4210123185","display_name":"Zhejiang Lab","ror":"https://ror.org/02m2h7991","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210123185"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaohua Zhou","raw_affiliation_strings":["Zhejiang Laboratory","Research Center for Intelligent Chips and Devices, Zhejiang Laboratory, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-3292-9511","affiliations":[{"raw_affiliation_string":"Zhejiang Laboratory","institution_ids":["https://openalex.org/I4210123185"]},{"raw_affiliation_string":"Research Center for Intelligent Chips and Devices, Zhejiang Laboratory, Hangzhou, China","institution_ids":["https://openalex.org/I4210123185"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029369208","display_name":"Man\u2010Kay Law","orcid":"https://orcid.org/0000-0002-2799-1129"},"institutions":[{"id":"https://openalex.org/I204512498","display_name":"University of Macau","ror":"https://ror.org/01r4q9n85","country_code":"MO","type":"education","lineage":["https://openalex.org/I204512498"]},{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN","MO","SG"],"is_corresponding":false,"raw_author_name":"Man-Kay Law","raw_affiliation_strings":["Faculty of Science and Technology (FST-ECE), Institute of Microelectronics (IME), University of Macau","State Key Laboratory of Analog and Mixed-Signal VLSI, Department of Electrical and Computer Engineering, Faculty of Science and Technology (FST-ECE), and Institute of Microelectronics (IME), University of Macau, Macau, China"],"raw_orcid":"https://orcid.org/0000-0002-2799-1129","affiliations":[{"raw_affiliation_string":"Faculty of Science and Technology (FST-ECE), Institute of Microelectronics (IME), University of Macau","institution_ids":["https://openalex.org/I204512498","https://openalex.org/I4210090209"]},{"raw_affiliation_string":"State Key Laboratory of Analog and Mixed-Signal VLSI, Department of Electrical and Computer Engineering, Faculty of Science and Technology (FST-ECE), and Institute of Microelectronics (IME), University of Macau, Macau, China","institution_ids":["https://openalex.org/I204512498","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100414628","display_name":"Jian Liu","orcid":"https://orcid.org/0000-0001-8057-2444"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Liu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8057-2444","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100460573","display_name":"Jianguo Ma","orcid":"https://orcid.org/0009-0005-8516-5940"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianguo Ma","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110665174","display_name":"Nanjian Wu","orcid":"https://orcid.org/0000-0001-8022-0262"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nanjian Wu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8022-0262","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100657035","display_name":"Liyuan Liu","orcid":"https://orcid.org/0000-0003-2585-323X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyuan Liu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences","Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2585-323X","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"Institute of Semiconductors, State Key Laboratory of Superlattices and Microstructures, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":null,"fwci":1.7578,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.84106187,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"59","issue":"9","first_page":"2934","last_page":"2947"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9799000024795532,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9641000032424927,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6872775554656982},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.6170920133590698},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6168686747550964},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4864963889122009},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.42529869079589844},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4137931168079376},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3334474563598633},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3317655622959137}],"concepts":[{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6872775554656982},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.6170920133590698},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6168686747550964},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4864963889122009},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.42529869079589844},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4137931168079376},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3334474563598633},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3317655622959137}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2024.3381595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3381595","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6700000166893005,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G5057085292","display_name":null,"funder_award_id":"62075211","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8245079662","display_name":null,"funder_award_id":"61874107","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W100417395","https://openalex.org/W1977720816","https://openalex.org/W1980178290","https://openalex.org/W2009795359","https://openalex.org/W2011898260","https://openalex.org/W2025432097","https://openalex.org/W2041245232","https://openalex.org/W2058989756","https://openalex.org/W2074215498","https://openalex.org/W2080657231","https://openalex.org/W2101394360","https://openalex.org/W2102662922","https://openalex.org/W2107480603","https://openalex.org/W2109789727","https://openalex.org/W2125419875","https://openalex.org/W2128051455","https://openalex.org/W2133291396","https://openalex.org/W2145431362","https://openalex.org/W2155554933","https://openalex.org/W2170193665","https://openalex.org/W2289116695","https://openalex.org/W2614590193","https://openalex.org/W2616738357","https://openalex.org/W2769686698","https://openalex.org/W2780859966","https://openalex.org/W2900495324","https://openalex.org/W2907733468","https://openalex.org/W2921025874","https://openalex.org/W2996718704","https://openalex.org/W3119679595","https://openalex.org/W3133949595","https://openalex.org/W3158192640","https://openalex.org/W3205465532","https://openalex.org/W4200240153","https://openalex.org/W4230918589","https://openalex.org/W4237854777","https://openalex.org/W4238573033","https://openalex.org/W4285251209","https://openalex.org/W4301627548","https://openalex.org/W4360605805","https://openalex.org/W4363677240","https://openalex.org/W4387746983"],"related_works":["https://openalex.org/W2022123780","https://openalex.org/W2349576212","https://openalex.org/W1981776476","https://openalex.org/W2352535872","https://openalex.org/W2382967348","https://openalex.org/W4255753471","https://openalex.org/W2334823507","https://openalex.org/W2107073676","https://openalex.org/W2565551736","https://openalex.org/W2542675020"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,13,29,39,44,113,128,160],"3":[4,135],"THz":[5,136,166],"CMOS":[6,132],"image":[7],"sensor":[8,11,180,200],"(Tera-CIS).":[9],"The":[10,32,55,67,150,172,207],"has":[12],"column-parallel":[14],"readout":[15],"(CPRO)":[16],"architecture":[17],"that":[18],"integrates":[19],"an":[20],"antenna-coupled":[21],"pixel":[22,37,64,79,151],"array":[23],"and":[24,43,53,76,87,95,214],"CPRO":[25,83],"circuit":[26,84],"chains":[27],"on":[28],"monolithic":[30],"chip.":[31],"proposed":[33],"compact":[34],"two-transistor":[35],"(2T)":[36],"adopts":[38],"step-covered":[40,56],"patch":[41,57],"antenna":[42,58],"defected":[45],"ground":[46],"structure":[47,69],"(DGS)":[48],"to":[49,62,92,118,169,204],"obtain":[50],"sufficient":[51],"sensitivity":[52,152],"bandwidth.":[54],"model":[59],"is":[60,116],"developed":[61],"predict":[63],"performances":[65],"precisely.":[66],"DGS":[68],"suppresses":[70],"mutual":[71],"coupling":[72],"among":[73],"adjacent":[74],"pixels":[75],"shrinks":[77],"the":[78,82,98,104,175,179,188,192,199],"pitch.":[80],"In":[81],"chain,":[85],"chopping":[86],"oversampling":[88],"techniques":[89],"are":[90],"employed":[91],"reduce":[93],"noise":[94],"flexibly":[96],"balance":[97],"dynamic":[99],"range":[100],"(DR)":[101],"characteristics":[102],"with":[103,112,127,139,159],"imaging":[105,137,208,213],"rate.":[106],"A":[107,122,134],"digital":[108],"decimation":[109],"filter":[110],"(DDF)":[111],"time-multiplexing":[114],"fashion":[115],"adopted":[117],"alleviate":[119],"resource":[120],"pressure.":[121],"16.4k-pixel":[123],"Tera-CIS":[124],"was":[125,148,153,195],"fabricated":[126],"standard":[129],"0.18$\\mu":[130],"$m":[131],"process.":[133],"platform":[138],"four":[140],"different":[141],"continuous-wave":[142],"(CW)":[143],"terahertz":[144],"quantum":[145],"cascade":[146],"lasers":[147],"established.":[149],"753":[154],"V/W":[155],"at":[156,184],"3.4":[157],"THz,":[158],"measured":[161],"detection":[162],"bandwidth":[163],"of":[164,178],"0.78":[165],"(from":[167],"3.08":[168],"3.86":[170],"THz).":[171],"DR":[173,190],"in":[174,191],"voltage":[176],"domain":[177,194],"reached":[181],"73":[182],"dB":[183],"8":[185],"fps":[186],"while":[187],"maximum":[189],"power":[193],"39.8":[196],"dB.":[197],"Meanwhile,":[198],"can":[201,210],"operate":[202],"up":[203],"130":[205],"fps.":[206],"system":[209],"achieve":[211],"high-resolution":[212],"clearly":[215],"identify":[216],"concealed":[217],"objects.":[218]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}