{"id":"https://openalex.org/W4393906143","doi":"https://doi.org/10.1109/jssc.2024.3378768","title":"Cryo-CMOS Voltage References for the Ultrawide Temperature Range From 300 K Down to 4.2 K","display_name":"Cryo-CMOS Voltage References for the Ultrawide Temperature Range From 300 K Down to 4.2 K","publication_year":2024,"publication_date":"2024-04-03","ids":{"openalex":"https://openalex.org/W4393906143","doi":"https://doi.org/10.1109/jssc.2024.3378768"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2024.3378768","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3378768","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10490008.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10490008.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077351799","display_name":"Job van Staveren","orcid":"https://orcid.org/0000-0002-2465-9534"},"institutions":[{"id":"https://openalex.org/I4210145640","display_name":"QuTech","ror":"https://ror.org/04wf30j82","country_code":"NL","type":"facility","lineage":["https://openalex.org/I148297040","https://openalex.org/I4210145640","https://openalex.org/I98358874"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Job van Staveren","raw_affiliation_strings":["Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","QuTech, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-2465-9534","affiliations":[{"raw_affiliation_string":"Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"QuTech, Delft, The Netherlands","institution_ids":["https://openalex.org/I4210145640"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041370076","display_name":"Pinakin Padalia","orcid":"https://orcid.org/0000-0002-8074-4565"},"institutions":[{"id":"https://openalex.org/I4210145640","display_name":"QuTech","ror":"https://ror.org/04wf30j82","country_code":"NL","type":"facility","lineage":["https://openalex.org/I148297040","https://openalex.org/I4210145640","https://openalex.org/I98358874"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Pinakin M. Padalia","raw_affiliation_strings":["Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","QuTech, Delft, The Netherlands","Renesas Electronics India Pvt., Ltd, Bengaluru, India"],"raw_orcid":"https://orcid.org/0000-0002-8074-4565","affiliations":[{"raw_affiliation_string":"Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"QuTech, Delft, The Netherlands","institution_ids":["https://openalex.org/I4210145640"]},{"raw_affiliation_string":"Renesas Electronics India Pvt., Ltd, Bengaluru, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026782847","display_name":"Edoardo Charbon","orcid":"https://orcid.org/0000-0002-0620-3365"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Edoardo Charbon","raw_affiliation_strings":["Kavli Institute of Nanoscience Delft, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-0620-3365","affiliations":[{"raw_affiliation_string":"Kavli Institute of Nanoscience Delft, Delft, The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065774119","display_name":"Carmen G. Almud\u00e9ver","orcid":"https://orcid.org/0000-0002-3800-2357"},"institutions":[{"id":"https://openalex.org/I4210145640","display_name":"QuTech","ror":"https://ror.org/04wf30j82","country_code":"NL","type":"facility","lineage":["https://openalex.org/I148297040","https://openalex.org/I4210145640","https://openalex.org/I98358874"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Carmen G. Almudever","raw_affiliation_strings":["Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","QuTech, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-3800-2357","affiliations":[{"raw_affiliation_string":"Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"QuTech, Delft, The Netherlands","institution_ids":["https://openalex.org/I4210145640"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028014163","display_name":"Giordano Scappucci","orcid":"https://orcid.org/0000-0003-2512-0079"},"institutions":[{"id":"https://openalex.org/I4210145640","display_name":"QuTech","ror":"https://ror.org/04wf30j82","country_code":"NL","type":"facility","lineage":["https://openalex.org/I148297040","https://openalex.org/I4210145640","https://openalex.org/I98358874"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Giordano Scappucci","raw_affiliation_strings":["QuTech and the Kavli Institute of Nanoscience Delft, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"QuTech and the Kavli Institute of Nanoscience Delft, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I4210145640","https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038559388","display_name":"Masoud Babaie","orcid":"https://orcid.org/0000-0001-7635-5324"},"institutions":[{"id":"https://openalex.org/I4210145640","display_name":"QuTech","ror":"https://ror.org/04wf30j82","country_code":"NL","type":"facility","lineage":["https://openalex.org/I148297040","https://openalex.org/I4210145640","https://openalex.org/I98358874"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Masoud Babaie","raw_affiliation_strings":["Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","QuTech, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0001-7635-5324","affiliations":[{"raw_affiliation_string":"Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"QuTech, Delft, The Netherlands","institution_ids":["https://openalex.org/I4210145640"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101784340","display_name":"Fabio Sebastiano","orcid":"https://orcid.org/0000-0002-8489-9409"},"institutions":[{"id":"https://openalex.org/I4210145640","display_name":"QuTech","ror":"https://ror.org/04wf30j82","country_code":"NL","type":"facility","lineage":["https://openalex.org/I148297040","https://openalex.org/I4210145640","https://openalex.org/I98358874"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Fabio Sebastiano","raw_affiliation_strings":["Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","QuTech, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-8489-9409","affiliations":[{"raw_affiliation_string":"Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"QuTech, Delft, The Netherlands","institution_ids":["https://openalex.org/I4210145640"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.637,"has_fulltext":true,"cited_by_count":22,"citation_normalized_percentile":{"value":0.90467153,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"59","issue":"9","first_page":"2884","last_page":"2894"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7256423234939575},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.5133373141288757},{"id":"https://openalex.org/keywords/cryogenic-temperature","display_name":"Cryogenic temperature","score":0.5032464861869812},{"id":"https://openalex.org/keywords/cryogenics","display_name":"Cryogenics","score":0.4790312349796295},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.4589461088180542},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.44888511300086975},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4225546717643738},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4023270010948181},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.34753063321113586},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.342180073261261},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3387479782104492},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33105534315109253},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.32726988196372986},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32566338777542114},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2220301330089569},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2219640612602234},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.21142220497131348},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.1724853813648224},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.12404888868331909},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.10088586807250977}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7256423234939575},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.5133373141288757},{"id":"https://openalex.org/C2985130431","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenic temperature","level":2,"score":0.5032464861869812},{"id":"https://openalex.org/C179725390","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenics","level":2,"score":0.4790312349796295},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.4589461088180542},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.44888511300086975},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4225546717643738},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4023270010948181},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34753063321113586},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.342180073261261},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3387479782104492},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33105534315109253},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.32726988196372986},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32566338777542114},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2220301330089569},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2219640612602234},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21142220497131348},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.1724853813648224},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.12404888868331909},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.10088586807250977},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/jssc.2024.3378768","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3378768","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10490008.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:infoscience.epfl.ch:311071","is_oa":true,"landing_page_url":"https://infoscience.epfl.ch/handle/20.500.14299/207933","pdf_url":"https://infoscience.epfl.ch/bitstreams/f69d92db-6fac-4e23-b363-a0bee2e29c4e/download","source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I5124864","host_organization_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","host_organization_lineage":["https://openalex.org/I5124864"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"WoS","raw_type":"research article"},{"id":"pmh:oai:riunet.upv.es:10251/208522","is_oa":true,"landing_page_url":"http://hdl.handle.net/10251/208522","pdf_url":null,"source":{"id":"https://openalex.org/S4306400639","display_name":"RiuNet (Universitat Polit\u00e8cnica de Val\u00e8ncia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I60053951","host_organization_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","host_organization_lineage":["https://openalex.org/I60053951"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/jssc.2024.3378768","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3378768","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10490008.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7599999904632568,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G7937316916","display_name":null,"funder_award_id":"16278","funder_id":"https://openalex.org/F4320321800","funder_display_name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320321800","display_name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek","ror":"https://ror.org/04jsz6e67"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4393906143.pdf","grobid_xml":"https://content.openalex.org/works/W4393906143.grobid-xml"},"referenced_works_count":37,"referenced_works":["https://openalex.org/W1540893100","https://openalex.org/W1989483638","https://openalex.org/W2027731855","https://openalex.org/W2081422077","https://openalex.org/W2093236804","https://openalex.org/W2109206407","https://openalex.org/W2118389586","https://openalex.org/W2133201500","https://openalex.org/W2140755946","https://openalex.org/W2160509435","https://openalex.org/W2171702041","https://openalex.org/W2483378112","https://openalex.org/W2558013876","https://openalex.org/W2561818119","https://openalex.org/W2590474843","https://openalex.org/W2794338547","https://openalex.org/W2794745494","https://openalex.org/W2795812195","https://openalex.org/W2896469455","https://openalex.org/W2979142575","https://openalex.org/W2986456514","https://openalex.org/W2996946661","https://openalex.org/W3008170113","https://openalex.org/W3019032708","https://openalex.org/W3019381406","https://openalex.org/W3020771783","https://openalex.org/W3044247275","https://openalex.org/W3115799550","https://openalex.org/W3134124940","https://openalex.org/W3135839872","https://openalex.org/W3201829914","https://openalex.org/W3203060215","https://openalex.org/W3210282126","https://openalex.org/W4286571740","https://openalex.org/W4295790497","https://openalex.org/W6742622249","https://openalex.org/W6768634335"],"related_works":["https://openalex.org/W2768225710","https://openalex.org/W4244225764","https://openalex.org/W2080652734","https://openalex.org/W2017432886","https://openalex.org/W1970616762","https://openalex.org/W1973617994","https://openalex.org/W2160424718","https://openalex.org/W2164592883","https://openalex.org/W4211113447","https://openalex.org/W4385363489"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,50,57,71,86],"family":[4],"of":[5,73,90,109],"sub-1-V,":[6],"fully-CMOS":[7],"voltage":[8],"references":[9,48],"adopting":[10],"MOS":[11],"devices":[12],"in":[13,44,85],"weak":[14],"inversion":[15],"to":[16,25,32,78,101,113],"achieve":[17],"continuous":[18],"operation":[19],"from":[20,56,76],"room":[21],"temperature":[22,87],"(RT)":[23],"down":[24,100],"cryogenic":[26,102,116],"temperatures.":[27],"Their":[28],"accuracy":[29],"limitations":[30],"due":[31],"curvature,":[33],"body":[34],"effect,":[35],"and":[36,40],"mismatch":[37],"are":[38],"investigated":[39],"experimentally":[41],"validated.":[42],"Implemented":[43],"40-nm":[45],"CMOS,":[46],"the":[47,94,104,107,110],"show":[49],"line":[51],"regulation":[52],"better":[53],"than":[54],"2.7%/V":[55],"supply":[58],"as":[59,61,120],"low":[60],"0.99":[62],"V.":[63],"By":[64],"applying":[65],"dynamic":[66],"element":[67],"matching":[68],"(DEM)":[69],"techniques,":[70],"spread":[72],"1.2%":[74],"(3$\\sigma$)":[75],"4.2":[77],"300":[79],"K":[80],"can":[81],"be":[82],"achieved,":[83],"resulting":[84],"coefficient":[88],"(TC)":[89],"111":[91],"ppm/K.":[92],"As":[93],"first":[95],"significant":[96],"statistical":[97],"characterization":[98],"extending":[99],"temperatures,":[103],"results":[105],"demonstrate":[106],"ability":[108],"proposed":[111],"architectures":[112],"work":[114],"under":[115],"harsh":[117],"environments,":[118],"such":[119],"space-and":[121],"quantum-computing":[122],"applications.":[123]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":4}],"updated_date":"2026-08-13T07:04:57.449891","created_date":"2025-10-10T00:00:00"}
