{"id":"https://openalex.org/W4392979909","doi":"https://doi.org/10.1109/jssc.2024.3374638","title":"An Energy-Efficient Neural Network Accelerator With Improved Resilience Against Fault Attacks","display_name":"An Energy-Efficient Neural Network Accelerator With Improved Resilience Against Fault Attacks","publication_year":2024,"publication_date":"2024-03-20","ids":{"openalex":"https://openalex.org/W4392979909","doi":"https://doi.org/10.1109/jssc.2024.3374638"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2024.3374638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3374638","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050442772","display_name":"Saurav Maji","orcid":"https://orcid.org/0000-0003-4204-3829"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saurav Maji","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","Intel Corporation, Hillsboro, OR, USA"],"raw_orcid":"https://orcid.org/0000-0003-4204-3829","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062648698","display_name":"Kyungmi Lee","orcid":"https://orcid.org/0000-0001-6406-9515"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kyungmi Lee","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":"https://orcid.org/0000-0001-6406-9515","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045682482","display_name":"Cheng Gongye","orcid":"https://orcid.org/0000-0002-6423-0871"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]},{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cheng Gongye","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","Nvidia Corporation, Santa Clara, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-6423-0871","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"Nvidia Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yunsi Fei","orcid":"https://orcid.org/0000-0002-5169-4044"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yunsi Fei","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5169-4044","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084128470","display_name":"Anantha P. Chandrakasan","orcid":"https://orcid.org/0000-0002-5977-2748"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anantha P. Chandrakasan","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5977-2748","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.5439,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.93579235,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"59","issue":"9","first_page":"3106","last_page":"3116"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7088699340820312},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.672951340675354},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.6512699127197266},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.619125247001648},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6149080991744995},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6098638772964478},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6067676544189453},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6024049520492554},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.509000301361084},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.49103474617004395},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.4479422867298126},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.4312222898006439},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4272172451019287},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4109104871749878},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3705674409866333},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3356897830963135},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19614535570144653},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13990214467048645},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09451082348823547},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07537618279457092}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7088699340820312},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.672951340675354},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.6512699127197266},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.619125247001648},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6149080991744995},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6098638772964478},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6067676544189453},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6024049520492554},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.509000301361084},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.49103474617004395},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.4479422867298126},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.4312222898006439},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4272172451019287},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4109104871749878},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3705674409866333},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3356897830963135},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19614535570144653},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13990214467048645},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09451082348823547},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07537618279457092},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2024.3374638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2024.3374638","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G8326775025","display_name":null,"funder_award_id":"NSF-SaTC 1929300","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320309065","display_name":"Analog Devices","ror":"https://ror.org/01545pm61"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1655844021","https://openalex.org/W1873852107","https://openalex.org/W1998435257","https://openalex.org/W2047037825","https://openalex.org/W2119144962","https://openalex.org/W2242153142","https://openalex.org/W2604319603","https://openalex.org/W2793779719","https://openalex.org/W2807835252","https://openalex.org/W2884941392","https://openalex.org/W2893525234","https://openalex.org/W2981860227","https://openalex.org/W2984453562","https://openalex.org/W3034579202","https://openalex.org/W3049623895","https://openalex.org/W3092516112","https://openalex.org/W3118867694","https://openalex.org/W3132111889","https://openalex.org/W3183847497","https://openalex.org/W3197312262","https://openalex.org/W3205058537","https://openalex.org/W3213911739","https://openalex.org/W4221015304","https://openalex.org/W4223504011","https://openalex.org/W4238341678","https://openalex.org/W4245276998","https://openalex.org/W4254435982","https://openalex.org/W4286571762","https://openalex.org/W4289744749","https://openalex.org/W4312920563","https://openalex.org/W4313467207","https://openalex.org/W4360606518","https://openalex.org/W4385192319","https://openalex.org/W4387395082","https://openalex.org/W6635937959","https://openalex.org/W6677580257","https://openalex.org/W6763412433","https://openalex.org/W6766787143","https://openalex.org/W6775611046","https://openalex.org/W6785511510","https://openalex.org/W6858643687"],"related_works":["https://openalex.org/W2165367082","https://openalex.org/W1972641423","https://openalex.org/W611446063","https://openalex.org/W2604133224","https://openalex.org/W3122756779","https://openalex.org/W4206938017","https://openalex.org/W4234532445","https://openalex.org/W2388299947","https://openalex.org/W2394408226","https://openalex.org/W4389168214"],"abstract_inverted_index":{"Embedded":[0],"neural":[1],"network":[2],"(NN)":[3],"implementations":[4],"are":[5,21],"vulnerable":[6],"to":[7,76],"misclassification":[8],"under":[9],"fault":[10,85],"attacks":[11],"(FAs).":[12],"Clock":[13],"glitching":[14],"and":[15,40,80,105],"injecting":[16],"strong":[17],"electromagnetic":[18],"(EM)":[19],"pulses":[20],"two":[22],"simple":[23],"yet":[24],"detrimental":[25],"FA":[26,64],"techniques":[27],"that":[28],"disrupt":[29],"the":[30,37,49],"NN":[31,38,43,59,109],"by:":[32],"1)":[33],"introducing":[34],"errors":[35,79],"in":[36],"model":[39,78],"2)":[41],"corrupting":[42],"computation":[44],"results.":[45],"This":[46],"article":[47],"introduces":[48],"first":[50],"application-specific":[51],"integrated":[52,69],"circuit":[53],"(ASIC)":[54],"demonstration":[55],"of":[56,103],"an":[57],"energy-efficient":[58],"accelerator":[60],"equipped":[61],"with":[62,98],"built-in":[63],"detection":[65,86],"capabilities.":[66],"We":[67,92],"have":[68],"lightweight":[70],"cryptography-based":[71],"checks":[72],"for":[73,88],"on-chip":[74],"verification":[75],"identify":[77],"additionally":[81],"serve":[82],"as":[83],"a":[84,99],"sensor":[87],"spotting":[89],"computational":[90],"errors.":[91],"showcase":[93],"high":[94],"error-detection":[95],"capabilities":[96],"along":[97],"minimal":[100],"area":[101],"overhead":[102],"5.9%":[104],"negligible":[106],"impact":[107],"on":[108],"accuracy.":[110]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}