{"id":"https://openalex.org/W4387546424","doi":"https://doi.org/10.1109/jssc.2023.3320709","title":"A Temperature- and Aging-Compensated <i>RC</i> Oscillator With \u00b11030-ppm Inaccuracy From40 \u00b0C to 85 \u00b0C After Accelerated Aging for 500 h at 125 \u00b0C","display_name":"A Temperature- and Aging-Compensated <i>RC</i> Oscillator With \u00b11030-ppm Inaccuracy From40 \u00b0C to 85 \u00b0C After Accelerated Aging for 500 h at 125 \u00b0C","publication_year":2023,"publication_date":"2023-10-11","ids":{"openalex":"https://openalex.org/W4387546424","doi":"https://doi.org/10.1109/jssc.2023.3320709"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2023.3320709","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3320709","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10278177.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10278177.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064808352","display_name":"Kyu-Sang Park","orcid":"https://orcid.org/0000-0003-2515-4682"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kyu-Sang Park","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022341159","display_name":"Nilanjan Pal","orcid":"https://orcid.org/0000-0003-1691-8986"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nilanjan Pal","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100405255","display_name":"Yongxin Li","orcid":"https://orcid.org/0000-0003-3812-9793"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yongxin Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021747082","display_name":"Ruhao Xia","orcid":"https://orcid.org/0000-0003-3694-0160"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ruhao Xia","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057358334","display_name":"Tianyu Wang","orcid":"https://orcid.org/0000-0001-7555-1382"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tianyu Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058351738","display_name":"Ahmed Abdelrahman","orcid":"https://orcid.org/0000-0002-1260-7155"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Abdelrahman","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086888499","display_name":"Pavan Kumar Hanumolu","orcid":"https://orcid.org/0000-0002-3456-2082"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pavan Kumar Hanumolu","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois at Urbana&#x2014;Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5064808352"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":1.5672,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.83337072,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"58","issue":"12","first_page":"3459","last_page":"3469"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.6143368482589722},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4131527245044708},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.386809378862381},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.27253684401512146}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.6143368482589722},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4131527245044708},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.386809378862381},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.27253684401512146}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2023.3320709","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3320709","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10278177.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/jssc.2023.3320709","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3320709","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/4359912/10278177.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6299999952316284}],"awards":[{"id":"https://openalex.org/G4775902049","display_name":null,"funder_award_id":"Task 2810","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G4799173274","display_name":null,"funder_award_id":"2810.036","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G8405388009","display_name":null,"funder_award_id":"GRC Task 2810.036","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4387546424.pdf","grobid_xml":"https://content.openalex.org/works/W4387546424.grobid-xml"},"referenced_works_count":35,"referenced_works":["https://openalex.org/W1807191304","https://openalex.org/W1963653651","https://openalex.org/W1976395591","https://openalex.org/W1977951774","https://openalex.org/W1998215455","https://openalex.org/W2030653793","https://openalex.org/W2036326695","https://openalex.org/W2051858301","https://openalex.org/W2054800551","https://openalex.org/W2068076936","https://openalex.org/W2090475824","https://openalex.org/W2099884755","https://openalex.org/W2100970092","https://openalex.org/W2152919488","https://openalex.org/W2168924564","https://openalex.org/W2292523461","https://openalex.org/W2305453364","https://openalex.org/W2594244657","https://openalex.org/W2610673387","https://openalex.org/W2771988120","https://openalex.org/W2801217541","https://openalex.org/W2892196271","https://openalex.org/W2892393788","https://openalex.org/W2903201626","https://openalex.org/W2966218558","https://openalex.org/W3048749073","https://openalex.org/W3135661566","https://openalex.org/W3211036016","https://openalex.org/W4206592536","https://openalex.org/W4210581110","https://openalex.org/W4221073597","https://openalex.org/W4280494900","https://openalex.org/W4285113751","https://openalex.org/W4312924853","https://openalex.org/W4360605486"],"related_works":["https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W2051487156","https://openalex.org/W2504004674","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W2142036596","https://openalex.org/W2072657027","https://openalex.org/W2600246793"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,98,110,178],"temperature-and":[4],"aging-compensated":[5],"<inline-formula":[6,57,67,101,118,127,134,143,158,167,183],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7,58,68,102,119,128,135,144,159,168,184],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[8,59,69,103,120,129,136,145,160,169,185],"<tex-math":[9,60,70,104,121,130,137,146,161,170,186],"notation=\"LaTeX\">$RC$</tex-math>":[10,71,105],"</inline-formula>":[11,62,72,106,123,132,139,148,163,174,188],"oscillator":[12,22,107],"(TACO)":[13],"in":[14,109],"which":[15],"the":[16,20,33,39,43,50,87,91,95],"long-term":[17,40],"drift":[18],"of":[19,32,42,52,90,117,153,181],"main":[21],"is":[23],"compensated":[24],"by":[25],"periodically":[26],"locking":[27],"its":[28],"frequency":[29],"to":[30,74,84,141],"that":[31],"less-aged":[34],"reference":[35,92],"oscillator.":[36,93],"To":[37],"improve":[38],"stability":[41],"TACO,":[44],"it":[45],"employs":[46],"techniques,":[47,97],"such":[48],"as":[49],"use":[51],"higher":[53],"activation":[54],"energy":[55],"(":[56],"notation=\"LaTeX\">$E_{a}$</tex-math>":[61],")":[63],"resistors,":[64],"switched":[65],"dual":[66],"branches":[73],"mitigate":[75],"stress":[76],"from":[77,126],"dc-current-induced":[78],"electromigration":[79],"(EM),":[80],"and":[81,177],"duty":[82],"cycling":[83],"slow":[85],"down":[86],"aging":[88,155],"rate":[89],"Using":[94],"proposed":[96],"prototype":[99],"100-MHz":[100],"fabricated":[108],"65-nm":[111],"CMOS":[112],"process":[113],"achieves":[114],"an":[115],"inaccuracy":[116],"notation=\"LaTeX\">$\\pm$</tex-math>":[122],"1030":[124],"ppm":[125],"notation=\"LaTeX\">$-$</tex-math>":[131],"40":[133],"notation=\"LaTeX\">$^\\circ$</tex-math>":[138,147,162],"C":[140,149],"85":[142],"after":[150],"500":[151],"h":[152],"accelerated":[154],"at":[156],"125":[157],"C,":[164],"with":[165],"5.1-":[166],"notation=\"LaTeX\">$\\rm":[171],"ps_{\\rm":[172],"rms}$</tex-math>":[173],"period":[175],"jitter":[176],"power":[179],"efficiency":[180],"1.4":[182],"notation=\"LaTeX\">$\\mu$</tex-math>":[187],"W/MHz.":[189]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":3}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}