{"id":"https://openalex.org/W4383113483","doi":"https://doi.org/10.1109/jssc.2023.3287360","title":"An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC\u2013DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS","display_name":"An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC\u2013DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS","publication_year":2023,"publication_date":"2023-07-04","ids":{"openalex":"https://openalex.org/W4383113483","doi":"https://doi.org/10.1109/jssc.2023.3287360"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2023.3287360","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3287360","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046442535","display_name":"Bing-Chen Wu","orcid":"https://orcid.org/0000-0002-7451-4261"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bing-Chen Wu","raw_affiliation_strings":["Bing-Chen Wu and Wei-Ting Chen were with the Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-7451-4261","affiliations":[{"raw_affiliation_string":"Bing-Chen Wu and Wei-Ting Chen were with the Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100687515","display_name":"Wei\u2010Ting Chen","orcid":"https://orcid.org/0009-0008-0547-9459"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Ting Chen","raw_affiliation_strings":["Bing-Chen Wu and Wei-Ting Chen were with the Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bing-Chen Wu and Wei-Ting Chen were with the Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066241253","display_name":"Tsung-Te Liu","orcid":"https://orcid.org/0000-0002-5433-9830"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsung-Te Liu","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-5433-9830","affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9817,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.75216353,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"58","issue":"11","first_page":"3275","last_page":"3285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6738004684448242},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5925689935684204},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5491589903831482},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4860242009162903},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4440656006336212},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4344170093536377},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.42533785104751587},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41330161690711975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3577544093132019},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23086202144622803},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13921400904655457}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6738004684448242},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5925689935684204},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5491589903831482},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4860242009162903},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4440656006336212},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4344170093536377},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.42533785104751587},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41330161690711975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3577544093132019},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23086202144622803},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13921400904655457}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2023.3287360","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3287360","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9100000262260437}],"awards":[],"funders":[{"id":"https://openalex.org/F4320323900","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1607087355","https://openalex.org/W1620991513","https://openalex.org/W1998525920","https://openalex.org/W2010635096","https://openalex.org/W2015917466","https://openalex.org/W2054989520","https://openalex.org/W2068372672","https://openalex.org/W2085966991","https://openalex.org/W2095351656","https://openalex.org/W2097324958","https://openalex.org/W2101987266","https://openalex.org/W2133256259","https://openalex.org/W2161380844","https://openalex.org/W2178304595","https://openalex.org/W2221168811","https://openalex.org/W2543536827","https://openalex.org/W2594678906","https://openalex.org/W2744562181","https://openalex.org/W2761878354","https://openalex.org/W2802288775","https://openalex.org/W2889347940","https://openalex.org/W2906598608","https://openalex.org/W2908635805","https://openalex.org/W2945790802","https://openalex.org/W2966064626","https://openalex.org/W2973657200","https://openalex.org/W2979287008","https://openalex.org/W2990042152","https://openalex.org/W2997207673","https://openalex.org/W3015364115","https://openalex.org/W3038807513","https://openalex.org/W3133079566","https://openalex.org/W3183768494","https://openalex.org/W4236432903"],"related_works":["https://openalex.org/W39373273","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W2967161359","https://openalex.org/W2001393705","https://openalex.org/W2357771869"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"an":[3,10,15,51,122,156],"energy-efficient":[4],"microprocessor":[5,65],"design":[6,24],"that":[7,106,132],"fully":[8,73,107],"integrates":[9,108],"error-resilient":[11,52],"RISC-V":[12],"core":[13],"and":[14,32,45,50,83,99,175],"embedded":[16],"dc\u2013dc":[17],"switched-capacitor":[18],"voltage":[19],"regulator":[20],"(SCVR).":[21],"The":[22,128],"proposed":[23,91,134],"achieves":[25],"high":[26,29,94],"energy":[27,176],"efficiency,":[28,96],"computation":[30],"performance,":[31],"a":[33,72,77,84,149],"small":[34],"system":[35],"footprint":[36],"through":[37],"several":[38],"innovations.":[39],"First,":[40],"in":[41,115,135,178],"situ":[42,136],"error":[43,61],"detection":[44],"correction":[46],"(EDAC)":[47],"flip-flops":[48],"(FFs)":[49],"static":[53],"random":[54],"access":[55],"memory":[56],"(SRAM)":[57],"interfacing":[58],"technique":[59,89],"enable":[60],"resilience":[62],"on":[63],"the":[64,109,116,133,140,172,179],"without":[66,143],"any":[67,144],"post-silicon":[68,145],"calibration":[69,146],"requirement.":[70],"Next,":[71],"integrated":[74],"SCVR":[75],"featuring":[76],"multi-rate":[78],"successive":[79],"approximation":[80],"(MRSA)":[81],"algorithm":[82],"dynamic":[85],"conduction":[86],"loss":[87],"minimization":[88],"is":[90],"to":[92,147],"achieve":[93,148],"conversion":[95],"high-power":[97],"density,":[98],"fast":[100],"load":[101],"regulation.":[102],"A":[103],"prototype":[104],"chip":[105],"techniques":[110],"described":[111],"above":[112],"was":[113],"fabricated":[114],"28-nm":[117],"standard":[118,180],"CMOS":[119,181],"technology":[120],"with":[121,155],"active":[123],"area":[124],"of":[125,152,159],"0.42":[126],"mm2.":[127],"measurement":[129],"results":[130],"show":[131],"EDAC":[137],"effectively":[138],"minimizes":[139],"timing":[141],"margin":[142],"high-processor":[150],"performance":[151,174],"43":[153],"MHz":[154],"energy-delay-product":[157],"(EDP)":[158],"0.57":[160],"<inline-formula":[161],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[162],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[163],"<tex-math":[164],"notation=\"LaTeX\">$\\text":[165],"{pJ}\\cdot":[166],"\\mu":[167],"\\text{s}$":[168],"</tex-math></inline-formula>":[169],",":[170],"showing":[171],"state-of-the-art":[173],"efficiency":[177],"technology.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}