{"id":"https://openalex.org/W4366310704","doi":"https://doi.org/10.1109/jssc.2023.3261600","title":"A Single-Trim Frequency Reference System With 0.7 ppm/\u00b0C From \u221263 \u00b0C to 165 \u00b0C Consuming 210 \u03bcW at 70 MHz","display_name":"A Single-Trim Frequency Reference System With 0.7 ppm/\u00b0C From \u221263 \u00b0C to 165 \u00b0C Consuming 210 \u03bcW at 70 MHz","publication_year":2023,"publication_date":"2023-04-18","ids":{"openalex":"https://openalex.org/W4366310704","doi":"https://doi.org/10.1109/jssc.2023.3261600"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2023.3261600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3261600","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://ris.utwente.nl/ws/files/303537471/JSSC_STHAFR_DEMO_Final.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063810329","display_name":"Alexander S. Delke","orcid":"https://orcid.org/0000-0003-2934-5259"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Alexander S. Delke","raw_affiliation_strings":["IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0003-2934-5259","affiliations":[{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084086854","display_name":"Thomas J. Hoen","orcid":"https://orcid.org/0000-0002-8885-2341"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Thomas J. Hoen","raw_affiliation_strings":["IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-8885-2341","affiliations":[{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001455308","display_name":"Anne-Johan Annema","orcid":"https://orcid.org/0000-0001-8164-3064"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Anne-Johan Annema","raw_affiliation_strings":["IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0001-8164-3064","affiliations":[{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012940074","display_name":"Yanyu Jin","orcid":"https://orcid.org/0000-0002-8802-2436"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Yanyu Jin","raw_affiliation_strings":["NXP Semiconductors, AE Eindhoven, The Netherlands","with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-8802-2436","affiliations":[{"raw_affiliation_string":"NXP Semiconductors, AE Eindhoven, The Netherlands","institution_ids":[]},{"raw_affiliation_string":"with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069040574","display_name":"Jos Verlinden","orcid":"https://orcid.org/0000-0002-6430-6346"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Jos Verlinden","raw_affiliation_strings":["NXP Semiconductors, AE Eindhoven, The Netherlands","IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, AE Eindhoven, The Netherlands","institution_ids":[]},{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035402438","display_name":"Bram Nauta","orcid":"https://orcid.org/0000-0001-6790-5873"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Bram Nauta","raw_affiliation_strings":["IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0001-6790-5873","affiliations":[{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"with NXP Semiconductors, 5656 AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"IC Design Group, EEMCS, University of Twente, 7500 AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0453,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.7567867,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"58","issue":"9","first_page":"2585","last_page":"2596"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5179445147514343},{"id":"https://openalex.org/keywords/trim","display_name":"Trim","score":0.485029399394989},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4701794683933258},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.4665173292160034},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.46008017659187317},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4487980604171753},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4442916214466095},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42028844356536865},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3695412576198578},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35787516832351685},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3045458197593689},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30226659774780273},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2657751441001892}],"concepts":[{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5179445147514343},{"id":"https://openalex.org/C88611116","wikidata":"https://www.wikidata.org/wiki/Q957004","display_name":"Trim","level":2,"score":0.485029399394989},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4701794683933258},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.4665173292160034},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.46008017659187317},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4487980604171753},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4442916214466095},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42028844356536865},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3695412576198578},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35787516832351685},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3045458197593689},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30226659774780273},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2657751441001892},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2023.3261600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2023.3261600","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:ris.utwente.nl:publications/879c3a64-be41-49f3-871b-b3fba817ca2b","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/879c3a64-be41-49f3-871b-b3fba817ca2b","pdf_url":"https://ris.utwente.nl/ws/files/303537471/JSSC_STHAFR_DEMO_Final.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Delke, A S, Hoen, T J, Annema, A J, Jin, Y, Verlinden, J & Nauta, B 2023, 'A Single-Trim frequency reference system with 0.7 ppm/\u00b0C from \u221263 \u00b0C to 165 \u00b0C Consuming 210 \u03bcW at 70 MHz', IEEE journal of solid-state circuits, vol. 58, no. 9, pp. 2585-2596. https://doi.org/10.1109/JSSC.2023.3261600","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:publications/879c3a64-be41-49f3-871b-b3fba817ca2b","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/879c3a64-be41-49f3-871b-b3fba817ca2b","pdf_url":"https://ris.utwente.nl/ws/files/303537471/JSSC_STHAFR_DEMO_Final.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Delke, A S, Hoen, T J, Annema, A J, Jin, Y, Verlinden, J & Nauta, B 2023, 'A Single-Trim frequency reference system with 0.7 ppm/\u00b0C from \u221263 \u00b0C to 165 \u00b0C Consuming 210 \u03bcW at 70 MHz', IEEE journal of solid-state circuits, vol. 58, no. 9, pp. 2585-2596. https://doi.org/10.1109/JSSC.2023.3261600","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[{"id":"https://openalex.org/F4320317705","display_name":"NXP Semiconductors","ror":"https://ror.org/059be4e97"},{"id":"https://openalex.org/F4320321015","display_name":"University of Twente","ror":"https://ror.org/006hf6230"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4366310704.pdf","grobid_xml":"https://content.openalex.org/works/W4366310704.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W633552881","https://openalex.org/W1525272413","https://openalex.org/W1977014414","https://openalex.org/W2014618698","https://openalex.org/W2018806435","https://openalex.org/W2051127494","https://openalex.org/W2065757592","https://openalex.org/W2093236804","https://openalex.org/W2105521144","https://openalex.org/W2148114249","https://openalex.org/W2149550862","https://openalex.org/W2168924564","https://openalex.org/W2169280750","https://openalex.org/W2291914728","https://openalex.org/W2478112276","https://openalex.org/W2533675480","https://openalex.org/W2583045991","https://openalex.org/W2610673387","https://openalex.org/W2755278056","https://openalex.org/W2757999714","https://openalex.org/W2766482000","https://openalex.org/W2768323433","https://openalex.org/W2771988120","https://openalex.org/W2892393788","https://openalex.org/W2972254160","https://openalex.org/W3084672746","https://openalex.org/W3179440573","https://openalex.org/W4206592536","https://openalex.org/W4210581110","https://openalex.org/W6644537468","https://openalex.org/W6666885020"],"related_works":["https://openalex.org/W4205838487","https://openalex.org/W4320062971","https://openalex.org/W4206542901","https://openalex.org/W2070109416","https://openalex.org/W1523213765","https://openalex.org/W392191687","https://openalex.org/W4384502435","https://openalex.org/W4200332348","https://openalex.org/W1557347312","https://openalex.org/W1963550172"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,17,29,43,155,172,183,205,209,227,253],"frequency":[4,10,41,63,92,114,132,197,232,244],"reference":[5,198],"system":[6,25],"that":[7],"combines":[8],"high":[9],"accuracy":[11],"and":[12,21,50,81,98,123,169,204,215,251],"low":[13],"power":[14,149],"consumption":[15],"using":[16],"single-point":[18,86],"temperature":[19,48,88,120,184,206],"trim":[20],"batch":[22],"calibration.":[23],"The":[24,138,195,231,242],"is":[26,57,74,96,101,142,238,260],"intended":[27],"as":[28],"low-cost":[30],"fully":[31],"integrated":[32],"crystal":[33],"oscillator":[34,55,71],"replacement.":[35],"In":[36],"this":[37],"system,":[38,199],"the":[39,61,85,91,94,99,109,112,117,131,135,147],"oscillation":[40],"of":[42,65,93,134,212],"power-efficient,":[44],"but":[45],"process,":[46],"voltage,":[47],"(PVT)":[49],"lifetime":[51,82],"(L)-sensitive":[52],"current-controlled":[53],"ring":[54,136],"(CCO)":[56],"periodically":[58],"(re)calibrated":[59],"by":[60],"well-behaved":[62],"stability":[64,77,133],"an":[66,176],"untuned":[67],"LC":[68],"\u2013based":[69],"Colpitts":[70],"(LCO),":[72],"which":[73],"optimized":[75],"for":[76],"over":[78,182],"PVT":[79],"variations":[80],"(PVTL).":[83],"During":[84],"room":[87],"factory":[89],"trim,":[90],"LCO":[95,118,141],"determined":[97],"result":[100],"digitally":[102,124],"stored.":[103],"An":[104],"on-chip":[105,201],"calibration":[106],"engine":[107],"tunes":[108],"CCO":[110],"to":[111,145,189,235,247],"target":[113],"based":[115],"on":[116],"frequency,":[119],"sensor":[121],"information,":[122,127],"stored":[125],"trimming":[126],"thus":[128],"effectively":[129],"improving":[130],"oscillator.":[137],"relatively":[139],"high-power":[140],"heavily":[143],"duty-cycled":[144],"minimize":[146],"overall":[148],"consumption.":[150],"A":[151],"prototype":[152],"fabricated":[153],"in":[154,171],"0.13-":[156],"<inline-formula":[157,219],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[158,220],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[159,221],"<tex-math":[160,222],"notation=\"LaTeX\">$\\mu":[161,223],"\\text{m}$":[162],"</tex-math></inline-formula>":[163,225],"high-voltage":[164],"(HV)":[165],"CMOS":[166],"SOI":[167],"process":[168],"assembled":[170],"plastic":[173],"package":[174],"demonstrates":[175],"inaccuracy":[177],"lower":[178],"than":[179],"\u00b193":[180],"ppm":[181],"range":[185],"from":[186,226],"\u221263":[187],"\u00b0C":[188,191],"165":[190],"across":[192],"18":[193],"samples.":[194],"presented":[196],"including":[200],"voltage":[202],"regulators":[203],"sensor,":[207],"occupies":[208],"chip":[210],"area":[211],"0.69":[213],"mm2":[214],"consumes":[216],"about":[217],"64":[218],"\\text{A}$":[224],"single":[228],"3.3-V":[229],"supply.":[230],"error":[233],"due":[234,246],"supply":[236],"variation":[237],"roughly":[239],"92":[240],"ppm/V.":[241],"mean":[243],"shift":[245],"aging,":[248],"measured":[249],"before":[250],"after":[252],"six-day":[254],"storage":[255],"bake":[256],"at":[257],"175":[258],"\u00b0C,":[259],"only":[261],"52":[262],"ppm.":[263]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}