{"id":"https://openalex.org/W4293153924","doi":"https://doi.org/10.1109/jssc.2022.3167912","title":"An 88.9-dB SNR Fully-Dynamic Noise-Shaping SAR Capacitance-to-Digital Converter","display_name":"An 88.9-dB SNR Fully-Dynamic Noise-Shaping SAR Capacitance-to-Digital Converter","publication_year":2022,"publication_date":"2022-04-27","ids":{"openalex":"https://openalex.org/W4293153924","doi":"https://doi.org/10.1109/jssc.2022.3167912"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2022.3167912","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2022.3167912","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019678480","display_name":"Chaegang Lim","orcid":"https://orcid.org/0000-0002-5633-6000"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Chaegang Lim","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046974439","display_name":"Yohan Choi","orcid":"https://orcid.org/0009-0003-0941-3776"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yohan Choi","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089687153","display_name":"Jaegeun Song","orcid":"https://orcid.org/0000-0002-9327-9973"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaegeun Song","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037961668","display_name":"Soonsung Ahn","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soonsung Ahn","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054177305","display_name":"Seokwon Jang","orcid":"https://orcid.org/0000-0001-8222-9375"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokwon Jang","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100777100","display_name":"Chulwoo Kim","orcid":"https://orcid.org/0000-0003-4379-7905"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chulwoo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5019678480"],"corresponding_institution_ids":["https://openalex.org/I197347611"],"apc_list":null,"apc_paid":null,"fwci":1.2008,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.75792635,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"57","issue":"9","first_page":"2778","last_page":"2790"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6864057779312134},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5990087389945984},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.5724209547042847},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5189987421035767},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.512117862701416},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.4841209352016449},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.476777583360672},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.4715476334095001},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.463250994682312},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.45427757501602173},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4514254629611969},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.42388302087783813},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.42210516333580017},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40716028213500977},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35274356603622437},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2634347081184387},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2571718096733093}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6864057779312134},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5990087389945984},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.5724209547042847},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5189987421035767},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.512117862701416},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.4841209352016449},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.476777583360672},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.4715476334095001},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.463250994682312},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.45427757501602173},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4514254629611969},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.42388302087783813},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.42210516333580017},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40716028213500977},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35274356603622437},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2634347081184387},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2571718096733093},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2022.3167912","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2022.3167912","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9200000166893005,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2819299374","display_name":null,"funder_award_id":"2022R1A2C3012245","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W605564925","https://openalex.org/W1965112009","https://openalex.org/W1976807891","https://openalex.org/W2020517697","https://openalex.org/W2056184138","https://openalex.org/W2056204030","https://openalex.org/W2062972648","https://openalex.org/W2070653196","https://openalex.org/W2071087062","https://openalex.org/W2082979872","https://openalex.org/W2084822044","https://openalex.org/W2091424692","https://openalex.org/W2133313666","https://openalex.org/W2143035009","https://openalex.org/W2164251692","https://openalex.org/W2169349592","https://openalex.org/W2347028567","https://openalex.org/W2520964342","https://openalex.org/W2524022976","https://openalex.org/W2539938733","https://openalex.org/W2552852934","https://openalex.org/W2593067874","https://openalex.org/W2608117326","https://openalex.org/W2741408477","https://openalex.org/W2743547618","https://openalex.org/W2754795175","https://openalex.org/W2773134638","https://openalex.org/W2799859329","https://openalex.org/W2810499632","https://openalex.org/W2967473233","https://openalex.org/W2969068023","https://openalex.org/W3041781673","https://openalex.org/W3183763343"],"related_works":["https://openalex.org/W2006763825","https://openalex.org/W2128234435","https://openalex.org/W1536128679","https://openalex.org/W1549382382","https://openalex.org/W3213962850","https://openalex.org/W1913031742","https://openalex.org/W1970914845","https://openalex.org/W2022951482","https://openalex.org/W3011546017","https://openalex.org/W2289098659"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"an":[3,87,152,199],"energy-efficient":[4,88],"noise-shaping":[5],"successive-approximation":[6],"register":[7],"(SAR)":[8],"capacitance-to-digital":[9],"converter":[10,91],"(CDC)":[11],"for":[12,82,105,124],"high-resolution":[13],"capacitive":[14,89],"sensor":[15,104],"applications.":[16],"Based":[17],"on":[18],"a":[19,79,83,112,116,147,173,205],"12-bit":[20],"SAR":[21],"architecture,":[22],"quantization":[23],"noise":[24,67],"is":[25,43,62,76,120,144,188],"shaped":[26],"by":[27],"the":[28,59,71,109,125,128,136,185],"first-order":[29],"FIR-IIR":[30],"loop":[31,35,60,139],"filter.":[32],"The":[33,74,141,195],"proposed":[34,110,121,142],"filter":[36,61],"comprises":[37],"dynamic":[38,113],"amplifiers":[39],"(DAs),":[40],"and":[41,55,64,138,204],"it":[42],"designed":[44],"to":[45,48,122,192],"be":[46],"insensitive":[47],"DA":[49],"gains'":[50],"variations.":[51],"Under":[52],"process,":[53],"voltage,":[54],"temperature":[56],"(PVT)":[57],"variations,":[58],"stable":[63],"retains":[65],"in-band":[66],"suppression":[68],"ability":[69],"without":[70],"gain":[72],"calibration.":[73],"CDC":[75,143,197],"implemented":[77],"in":[78,146],"differential":[80,106],"configuration":[81],"single-sensor":[84],"measurement":[85],"with":[86,115,151],"digital-to-analog":[90],"(CDAC)":[92],"switching":[93],"method.":[94],"It":[95,162],"does":[96],"not":[97],"require":[98],"any":[99],"replica":[100],"or":[101],"dual":[102],"capacitor":[103],"operation.":[107],"In":[108],"CDC,":[111],"comparator":[114],"common-mode":[117],"(CM)":[118],"rejection":[119],"compensate":[123],"instability":[126],"because":[127],"parasitic":[129],"capacitance":[130],"causes":[131],"CM":[132],"voltage":[133],"deviation":[134],"of":[135,155,176,207],"CDAC":[137],"instability.":[140],"fabricated":[145],"180-nm":[148],"CMOS":[149],"technology":[150],"active":[153],"area":[154],"0.25":[156],"mm":[157],"<sup":[158],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[159,166],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[160],".":[161],"dissipates":[163],"63.3":[164],"<inline-formula":[165],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[167],"<tex-math":[168],"notation=\"LaTeX\">$\\mu":[169],"\\text{W}$":[170],"</tex-math></inline-formula>":[171],"at":[172],"sampling":[174,186],"frequency":[175,187],"320":[177,193],"kHz.":[178,194],"Given":[179],"that":[180],"all":[181],"circuits":[182],"operate":[183],"dynamically,":[184],"scalable":[189],"from":[190],"3.2":[191],"prototype":[196],"achieves":[198],"88.9-dB":[200],"signal-to-noise":[201],"ratio":[202],"(SNR)":[203],"figure-of-merit":[206],"139":[208],"fJ/conversion-step.":[209]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}