{"id":"https://openalex.org/W4205594724","doi":"https://doi.org/10.1109/jssc.2021.3137540","title":"A 13-Bit ENOB Third-Order Noise-Shaping SAR ADC Employing Hybrid Error Control Structure and LMS-Based Foreground Digital Calibration","display_name":"A 13-Bit ENOB Third-Order Noise-Shaping SAR ADC Employing Hybrid Error Control Structure and LMS-Based Foreground Digital Calibration","publication_year":2022,"publication_date":"2022-01-05","ids":{"openalex":"https://openalex.org/W4205594724","doi":"https://doi.org/10.1109/jssc.2021.3137540"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3137540","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3137540","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101622962","display_name":"Qihui Zhang","orcid":"https://orcid.org/0000-0001-7015-2059"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qihui Zhang","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7015-2059","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100749757","display_name":"Ning Ning","orcid":"https://orcid.org/0000-0001-7893-1428"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Ning","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7893-1428","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100350975","display_name":"Zhong Zhang","orcid":"https://orcid.org/0000-0003-2611-9424"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhong Zhang","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-2611-9424","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100336850","display_name":"Jing Li","orcid":"https://orcid.org/0000-0001-9980-0224"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-9980-0224","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067510762","display_name":"Kejun Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kejun Wu","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-5472-0570","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100706888","display_name":"Yong Chen","orcid":"https://orcid.org/0000-0002-2794-1324"},"institutions":[{"id":"https://openalex.org/I204512498","display_name":"University of Macau","ror":"https://ror.org/01r4q9n85","country_code":"MO","type":"education","lineage":["https://openalex.org/I204512498"]}],"countries":["MO"],"is_corresponding":false,"raw_author_name":"Yong Chen","raw_affiliation_strings":["State-Key Laboratory of Analog and Mixed-Signal VLSI and IME/ECE-FST, University of Macau, Macao, China"],"raw_orcid":"https://orcid.org/0000-0002-2794-1324","affiliations":[{"raw_affiliation_string":"State-Key Laboratory of Analog and Mixed-Signal VLSI and IME/ECE-FST, University of Macau, Macao, China","institution_ids":["https://openalex.org/I204512498"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100377679","display_name":"Qi Yu","orcid":"https://orcid.org/0000-0002-0490-0749"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Yu","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7772,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.90646195,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"57","issue":"7","first_page":"2181","last_page":"2195"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.73580402135849},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.7291260957717896},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6361538171768188},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.5480100512504578},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.5333589911460876},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5326216816902161},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.49366673827171326},{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.4918370246887207},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4658758342266083},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.44601961970329285},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.4444027543067932},{"id":"https://openalex.org/keywords/quantization","display_name":"Quantization (signal processing)","score":0.4318331480026245},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.36430633068084717},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.35946404933929443},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.355479896068573},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2730766236782074},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.24010059237480164},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20228677988052368},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18087345361709595},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14648625254631042},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12865903973579407}],"concepts":[{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.73580402135849},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.7291260957717896},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6361538171768188},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.5480100512504578},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.5333589911460876},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5326216816902161},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.49366673827171326},{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.4918370246887207},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4658758342266083},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.44601961970329285},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.4444027543067932},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.4318331480026245},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.36430633068084717},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35946404933929443},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.355479896068573},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2730766236782074},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.24010059237480164},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20228677988052368},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18087345361709595},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14648625254631042},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12865903973579407},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2021.3137540","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3137540","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1061997893","display_name":null,"funder_award_id":"2021YFG0146","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G2300347699","display_name":null,"funder_award_id":"62004024","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6764093795","display_name":null,"funder_award_id":"2021YFG0004","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322922","display_name":"Department of Science and Technology of Sichuan Province","ror":"https://ror.org/04323m874"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W605564925","https://openalex.org/W1509148781","https://openalex.org/W1976807891","https://openalex.org/W2056204030","https://openalex.org/W2071087062","https://openalex.org/W2079474160","https://openalex.org/W2089904582","https://openalex.org/W2113025650","https://openalex.org/W2117432625","https://openalex.org/W2136376206","https://openalex.org/W2520964342","https://openalex.org/W2527632290","https://openalex.org/W2536517842","https://openalex.org/W2568520569","https://openalex.org/W2586158728","https://openalex.org/W2593067874","https://openalex.org/W2740728963","https://openalex.org/W2897458229","https://openalex.org/W2901171969","https://openalex.org/W2903196701","https://openalex.org/W2907744714","https://openalex.org/W2921260700","https://openalex.org/W3019911557","https://openalex.org/W3034711398","https://openalex.org/W3034949358","https://openalex.org/W3083977280","https://openalex.org/W3086509224","https://openalex.org/W3102310302","https://openalex.org/W3135662627","https://openalex.org/W3161095768","https://openalex.org/W4253418370"],"related_works":["https://openalex.org/W2914701507","https://openalex.org/W2982541868","https://openalex.org/W3011208887","https://openalex.org/W2905521207","https://openalex.org/W3176856240","https://openalex.org/W2580320552","https://openalex.org/W3002516890","https://openalex.org/W2487410127","https://openalex.org/W2909877441","https://openalex.org/W1526838648"],"abstract_inverted_index":{"This":[0,30,50],"article":[1],"presents":[2],"a":[3,16,33,40,54,107,111,140,146,159,164,171,181],"third-order":[4],"noise-shaping":[5],"(NS)":[6],"successive":[7],"approximation":[8],"register":[9],"(SAR)":[10],"analog-to-digital":[11],"converter":[12],"(ADC),":[13],"which":[14],"exploits":[15],"hybrid":[17,34],"error":[18,47],"control":[19],"topology":[20],"to":[21,74,85,123],"increase":[22],"the":[23,26,61,64,76,81,86,96,124],"order":[24],"of":[25,35,63,88,98,175,177,185,192],"noise-transfer":[27],"function":[28],"(NTF).":[29],"scheme":[31,117],"is":[32,72,118,137],"two":[36],"NS":[37,57],"stages,":[38],"namely,":[39],"cascaded":[41],"integrator":[42],"feed-forward":[43],"(CIFF)":[44],"and":[45,59,120,127],"an":[46,89,132,189],"feedback":[48],"(EF).":[49],"EF-CIFF":[51],"structure":[52],"contributes":[53],"more":[55],"effective":[56],"capability":[58],"enhances":[60],"robustness":[62],"high-order":[65],"NTF.":[66],"An":[67],"improved":[68],"dither-based":[69],"digital":[70],"calibration":[71,93],"developed":[73],"mitigate":[75],"harmonic":[77],"distortion":[78],"caused":[79],"by":[80],"capacitor":[82],"mismatch.":[83],"Due":[84],"usage":[87],"averaging":[90],"filter,":[91],"this":[92],"greatly":[94],"reduces":[95],"interference":[97],"quantization":[99],"noise":[100],"on":[101,131],"mismatch":[102],"extraction":[103],"while":[104],"only":[105],"needing":[106],"minimum":[108],"modification":[109],"in":[110,139],"standard":[112],"SAR":[113],"Topology.":[114],"Hence,":[115],"our":[116,135],"simple":[119],"inherently":[121],"robust":[122],"process,":[125],"voltage,":[126],"temperature":[128],"variation.":[129],"Based":[130],"8-bit":[133],"SAR,":[134],"prototype":[136],"fabricated":[138],"130-nm":[141],"CMOS":[142],"process.":[143],"It":[144],"consumes":[145],"96-":[147],"<inline-formula":[148],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[149],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[150],"<tex-math":[151],"notation=\"LaTeX\">$\\mu":[152],"\\text{W}$":[153],"</tex-math></inline-formula>":[154],"power":[155],"when":[156],"operating":[157],"at":[158,188],"2-MS/s":[160],"sampling":[161],"frequency":[162],"with":[163,180],"1.2-V":[165],"supply.":[166],"The":[167],"proposed":[168],"NS-SAR":[169],"yields":[170],"peak":[172],"Schreier":[173],"figure":[174],"merit":[176],"170.7":[178],"dB":[179,187],"signal-to-noise-and-distortion":[182],"ratio":[183,191],"(SNDR)":[184],"79.57":[186],"oversampling":[190],"8.":[193]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":10}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}