{"id":"https://openalex.org/W3203138028","doi":"https://doi.org/10.1109/jssc.2021.3114620","title":"A 124-dB Dynamic-Range SPAD Photon-Counting Image Sensor Using Subframe Sampling and Extrapolating Photon Count","display_name":"A 124-dB Dynamic-Range SPAD Photon-Counting Image Sensor Using Subframe Sampling and Extrapolating Photon Count","publication_year":2021,"publication_date":"2021-10-02","ids":{"openalex":"https://openalex.org/W3203138028","doi":"https://doi.org/10.1109/jssc.2021.3114620","mag":"3203138028"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3114620","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3114620","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009839183","display_name":"Jun Ogi","orcid":"https://orcid.org/0000-0002-8549-1480"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Jun Ogi","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086363717","display_name":"Takafumi Takatsuka","orcid":"https://orcid.org/0009-0004-0326-3671"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takafumi Takatsuka","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011726299","display_name":"Kazuki Hizu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kazuki Hizu","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017710579","display_name":"Yutaka Inaoka","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yutaka Inaoka","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100757520","display_name":"H. Zhu","orcid":"https://orcid.org/0000-0001-8066-7048"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hongbo Zhu","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111678704","display_name":"Yasuhisa Tochigi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yasuhisa Tochigi","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102046493","display_name":"Yoshiaki Tashiro","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yoshiaki Tashiro","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054892385","display_name":"Fumiaki Sano","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fumiaki Sano","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000156218","display_name":"Yusuke Murakawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yusuke Murakawa","raw_affiliation_strings":["Mobile Image Sensor Product Division, Sony Semiconductor Manufacturing, Isahaya-shi, Nagasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Mobile Image Sensor Product Division, Sony Semiconductor Manufacturing, Isahaya-shi, Nagasaki, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072536066","display_name":"Makoto Nakamura","orcid":"https://orcid.org/0000-0001-7008-6880"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Makoto Nakamura","raw_affiliation_strings":["Mobile Image Sensor Product Division, Sony Semiconductor Manufacturing, Isahaya-shi, Nagasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Mobile Image Sensor Product Division, Sony Semiconductor Manufacturing, Isahaya-shi, Nagasaki, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048431820","display_name":"Yusuke Oike","orcid":"https://orcid.org/0000-0002-6647-1986"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yusuke Oike","raw_affiliation_strings":["Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan"],"affiliations":[{"raw_affiliation_string":"Research Division 1, Sony Semiconductor Solutions Corporation, Atsugi-shi, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5009839183"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.2769,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.96635351,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"56","issue":"11","first_page":"3220","last_page":"3227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.7547907829284668},{"id":"https://openalex.org/keywords/photon-counting","display_name":"Photon counting","score":0.6954865455627441},{"id":"https://openalex.org/keywords/subframe","display_name":"Subframe","score":0.6813247799873352},{"id":"https://openalex.org/keywords/shutter","display_name":"Shutter","score":0.6707357168197632},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.5718244910240173},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.557392418384552},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5382672548294067},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5158178210258484},{"id":"https://openalex.org/keywords/high-dynamic-range","display_name":"High dynamic range","score":0.5032474398612976},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5018575191497803},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4985392093658447},{"id":"https://openalex.org/keywords/photon","display_name":"Photon","score":0.4829253852367401},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.461723268032074},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4546944200992584},{"id":"https://openalex.org/keywords/wide-dynamic-range","display_name":"Wide dynamic range","score":0.4450937509536743},{"id":"https://openalex.org/keywords/avalanche-diode","display_name":"Avalanche diode","score":0.4223308265209198},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4174908697605133},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34014052152633667},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.29507994651794434},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2880159318447113},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.21984609961509705},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.14585718512535095},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1253150999546051}],"concepts":[{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.7547907829284668},{"id":"https://openalex.org/C2781402376","wikidata":"https://www.wikidata.org/wiki/Q17126172","display_name":"Photon counting","level":3,"score":0.6954865455627441},{"id":"https://openalex.org/C2776514898","wikidata":"https://www.wikidata.org/wiki/Q7631141","display_name":"Subframe","level":3,"score":0.6813247799873352},{"id":"https://openalex.org/C2776871301","wikidata":"https://www.wikidata.org/wiki/Q691823","display_name":"Shutter","level":2,"score":0.6707357168197632},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.5718244910240173},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.557392418384552},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5382672548294067},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5158178210258484},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.5032474398612976},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5018575191497803},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4985392093658447},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.4829253852367401},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.461723268032074},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4546944200992584},{"id":"https://openalex.org/C2776179129","wikidata":"https://www.wikidata.org/wiki/Q7998640","display_name":"Wide dynamic range","level":2,"score":0.4450937509536743},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.4223308265209198},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4174908697605133},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34014052152633667},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.29507994651794434},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2880159318447113},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.21984609961509705},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.14585718512535095},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1253150999546051},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C138660444","wikidata":"https://www.wikidata.org/wiki/Q5607897","display_name":"Telecommunications link","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2021.3114620","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3114620","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1642953514","https://openalex.org/W2088284312","https://openalex.org/W2196753883","https://openalex.org/W2218437761","https://openalex.org/W2244376146","https://openalex.org/W2290854562","https://openalex.org/W2294480298","https://openalex.org/W2583154691","https://openalex.org/W2593654060","https://openalex.org/W2793047620","https://openalex.org/W2796557786","https://openalex.org/W2799763456","https://openalex.org/W2891387140","https://openalex.org/W2977164968","https://openalex.org/W2980170825","https://openalex.org/W2980839101","https://openalex.org/W3011749650","https://openalex.org/W3016228989","https://openalex.org/W3135266920","https://openalex.org/W3137041278","https://openalex.org/W6672314924","https://openalex.org/W6775730632","https://openalex.org/W6791871435"],"related_works":["https://openalex.org/W4312359288","https://openalex.org/W2542605403","https://openalex.org/W2523867895","https://openalex.org/W2353677941","https://openalex.org/W2787948314","https://openalex.org/W2056069142","https://openalex.org/W2095699925","https://openalex.org/W1982710784","https://openalex.org/W2027126274","https://openalex.org/W3203138028"],"abstract_inverted_index":{"This":[0,59],"article":[1],"presents":[2],"a":[3,9,19,65],"250-ft/s":[4],"photon-counting":[5,28],"image":[6,29,43],"sensor":[7,30],"with":[8,31,45,87],"dynamic":[10],"range":[11],"(DR)":[12],"of":[13,18,75],"124":[14],"dB.":[15],"A":[16],"prototype":[17],"<inline-formula>":[20,32],"<tex-math":[21,33],"notation=\"LaTeX\">$160\\times264$":[22],"</tex-math></inline-formula>":[23,36],"single-photon":[24],"avalanche":[25],"diode":[26],"(SPAD)-based":[27],"notation=\"LaTeX\">$12.24~\\mu":[34],"\\text{m}$":[35],"pitch":[37],"stacked":[38],"pixels":[39],"successfully":[40],"realized":[41],"global-shutter":[42],"capture":[44],"noiseless":[46],"readout,":[47],"motion":[48],"artifact":[49],"suppression,":[50],"and":[51,68,80],"no":[52],"signal-to-noise-ratio":[53],"(SNR)":[54],"dip":[55],"over":[56],"the":[57,73,82],"DR.":[58],"result":[60],"can":[61],"be":[62],"achieved":[63],"by":[64,71,85],"subframe":[66],"sampling":[67],"extrapolating":[69],"architecture":[70],"decreasing":[72],"number":[74],"counter":[76],"bits":[77],"to":[78],"9":[79],"reducing":[81],"power":[83],"consumption":[84],"1/100":[86],"10<sup>6</sup>":[88],"incident":[89],"photons":[90],"under":[91],"high":[92],"light":[93],"intensity.":[94]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-24T08:02:53.985720","created_date":"2025-10-10T00:00:00"}