{"id":"https://openalex.org/W3200715165","doi":"https://doi.org/10.1109/jssc.2021.3106514","title":"A 32-kHz-Reference 2.4-GHz Fractional-<i>N</i> Oversampling PLL With 200-kHz Loop Bandwidth","display_name":"A 32-kHz-Reference 2.4-GHz Fractional-<i>N</i> Oversampling PLL With 200-kHz Loop Bandwidth","publication_year":2021,"publication_date":"2021-09-14","ids":{"openalex":"https://openalex.org/W3200715165","doi":"https://doi.org/10.1109/jssc.2021.3106514","mag":"3200715165"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3106514","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3106514","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/jssc.2021.3106514","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068137637","display_name":"Junjun Qiu","orcid":"https://orcid.org/0000-0002-3698-4369"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Junjun Qiu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070812527","display_name":"Zheng Sun","orcid":"https://orcid.org/0000-0002-5671-936X"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zheng Sun","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045260163","display_name":"Bangan Liu","orcid":"https://orcid.org/0000-0002-3535-2407"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bangan Liu","raw_affiliation_strings":["Qualcomm Inc., San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Qualcomm Inc., San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596","https://openalex.org/I4210111675"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115694919","display_name":"Wenqian Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wenqian Wang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080076770","display_name":"Dingxin Xu","orcid":"https://orcid.org/0000-0003-4691-2147"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Dingxin Xu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086299849","display_name":"Hans Herdian","orcid":"https://orcid.org/0000-0002-8667-3892"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hans Herdian","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081527973","display_name":"H\u00f3ngy\u00e8 Hu\u00e1ng","orcid":"https://orcid.org/0000-0001-6071-2075"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hongye Huang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040477650","display_name":"Yuncheng Zhang","orcid":"https://orcid.org/0000-0001-6467-3667"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuncheng Zhang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088122376","display_name":"Yun Wang","orcid":"https://orcid.org/0000-0001-7773-1619"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yun Wang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085361118","display_name":"Jian Pang","orcid":"https://orcid.org/0000-0002-6278-6294"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jian Pang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100667049","display_name":"Hanli Liu","orcid":"https://orcid.org/0000-0002-0420-4284"},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hanli Liu","raw_affiliation_strings":["Broadcom Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Broadcom Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043657126","display_name":"Masaya Miyahara","orcid":"https://orcid.org/0000-0002-5748-5921"},"institutions":[{"id":"https://openalex.org/I138728355","display_name":"High Energy Accelerator Research Organization","ror":"https://ror.org/01g5y5k24","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1319490839","https://openalex.org/I138728355"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaya Miyahara","raw_affiliation_strings":["High Energy Accelerator Research Organization, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"High Energy Accelerator Research Organization, Ibaraki, Japan","institution_ids":["https://openalex.org/I138728355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028333708","display_name":"Atsushi Shirane","orcid":"https://orcid.org/0000-0001-8172-4323"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Shirane","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064086312","display_name":"Kenichi Okada","orcid":"https://orcid.org/0000-0002-1082-7672"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Okada","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5068137637"],"corresponding_institution_ids":["https://openalex.org/I114531698"],"apc_list":null,"apc_paid":null,"fwci":1.7203,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.84508493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"56","issue":"12","first_page":"3741","last_page":"3755"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.8433324098587036},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7145758867263794},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.5928125381469727},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.48365676403045654},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47653278708457947},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4754704535007477},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44869258999824524},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4465934634208679},{"id":"https://openalex.org/keywords/lookup-table","display_name":"Lookup table","score":0.441141813993454},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.3669397234916687},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3550052046775818},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18228372931480408},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11759701371192932}],"concepts":[{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.8433324098587036},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7145758867263794},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.5928125381469727},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.48365676403045654},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47653278708457947},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4754704535007477},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44869258999824524},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4465934634208679},{"id":"https://openalex.org/C134835016","wikidata":"https://www.wikidata.org/wiki/Q690265","display_name":"Lookup table","level":2,"score":0.441141813993454},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.3669397234916687},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3550052046775818},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18228372931480408},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11759701371192932},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2021.3106514","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3106514","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/jssc.2021.3106514","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3106514","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309074","display_name":"Cadence Design Systems","ror":"https://ror.org/04w8xa018"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1672819356","https://openalex.org/W1994184480","https://openalex.org/W1997287970","https://openalex.org/W2029794151","https://openalex.org/W2033675564","https://openalex.org/W2036186630","https://openalex.org/W2097406868","https://openalex.org/W2099529552","https://openalex.org/W2100859981","https://openalex.org/W2105554928","https://openalex.org/W2105874291","https://openalex.org/W2110764323","https://openalex.org/W2120500930","https://openalex.org/W2147329965","https://openalex.org/W2150259647","https://openalex.org/W2151494083","https://openalex.org/W2288286056","https://openalex.org/W2599908957","https://openalex.org/W2789248965","https://openalex.org/W2800181724","https://openalex.org/W2897766837","https://openalex.org/W2897883690","https://openalex.org/W2913416661","https://openalex.org/W2921886179","https://openalex.org/W2964943829","https://openalex.org/W3000264207","https://openalex.org/W3003987747","https://openalex.org/W3004354595","https://openalex.org/W3015520279","https://openalex.org/W3048762142","https://openalex.org/W3093748429","https://openalex.org/W3094824205","https://openalex.org/W3099426297","https://openalex.org/W3119125665","https://openalex.org/W3200715165","https://openalex.org/W4248108322","https://openalex.org/W6696526775","https://openalex.org/W6748963127","https://openalex.org/W6775731165"],"related_works":["https://openalex.org/W1580014081","https://openalex.org/W2421111280","https://openalex.org/W2097165798","https://openalex.org/W2545192519","https://openalex.org/W2170102475","https://openalex.org/W1497881430","https://openalex.org/W2116548829","https://openalex.org/W2117483815","https://openalex.org/W2139484866","https://openalex.org/W2599174517"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"a":[3,129,184],"mixed\u2013signal,":[4],"32-kHz":[5],"reference-based":[6],"2.4-GHz":[7],"fractional-":[8,195],"<inline-formula":[9,25,196],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[10,26,173,197,208],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[11,27,198],"<tex-math":[12,28,199],"notation=\"LaTeX\">${N}$":[13,200],"</tex-math></inline-formula>":[14,31,201],"over-sampling":[15],"phase-locked":[16],"loop":[17],"(OSPLL)":[18],"is":[19,111,159,180,228,237],"proposed.":[20],"Different":[21],"from":[22],"the":[23,41,44,50,57,77,83,88,93,102,115,135,166,177,204,216,234],"conventional":[24],"notation=\"LaTeX\">$1\\times":[29],"$":[30],"sampling":[32],"PLL,":[33],"which":[34],"only":[35],"uses":[36],"zero-crossing":[37],"timing":[38,53],"information":[39,55,117],"of":[40,56,143,169,211,218,221],"reference":[42,58,71,235],"signal,":[43],"proposed":[45,74,112,157],"OSPLL":[46,75,158],"fully":[47],"utilizes":[48,92],"both":[49],"voltage":[51,89],"and":[52,60,91,120,138,147,153,176,233],"domain":[54,90],"signal":[59,86],"realizes":[61],"oversampling":[62],"ratio":[63],"(OSR)":[64],"times":[65],"phase":[66,131],"detection":[67],"(PD)":[68],"in":[69,87,101,161,194],"one":[70],"cycle.":[72],"The":[73,105,141,156,224],"employs":[76],"digital-to-analog":[78],"converter":[79,95],"(DAC)":[80],"to":[81,97,113,215],"construct":[82],"reference-like":[84],"feedback":[85],"digital-to-time":[94],"(DTC)":[96],"improve":[98],"PD":[99],"resolution":[100],"time":[103],"domain.":[104],"adaptive":[106],"lookup":[107],"table":[108],"(LuT)-based":[109],"calibration":[110],"generate":[114],"correct":[116],"for":[118,134],"DAC":[119],"DTC":[121],"control.":[122],"A":[123],"clocked":[124],"passive":[125],"comparator":[126],"works":[127],"as":[128],"bang-bang":[130],"detector":[132],"(BBPD)":[133],"PLL":[136],"control":[137],"LuTs\u2019":[139],"construction.":[140],"co-design":[142],"low-noise":[144],"analog":[145],"circuits":[146],"digital":[148],"calibrations":[149],"enables":[150],"good":[151],"jitter":[152,193],"spur":[154,227,236],"performance.":[155],"fabricated":[160],"65-nm":[162],"CMOS":[163],"technology,":[164],"with":[165,183,203],"core":[167],"area":[168],"0.58":[170],"mm":[171],"<sup":[172],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[174],",":[175],"power":[178,186],"consumption":[179],"4.97":[181],"mW":[182],"1-V":[185],"supply.":[187],"It":[188],"achieves":[189],"5.79-ps":[190],"root-mean-square":[191],"(rms)":[192],"modes":[202],"loop-bandwidth":[205],"(BW":[206],"<sub":[207],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">loop</sub>":[209],")":[210],"200":[212],"kHz,":[213],"corresponding":[214],"figures":[217],"merit":[219],"(FoMs)":[220],"\u2212217.8":[222],"dB.":[223],"measured":[225],"fractional":[226],"less":[229],"than":[230],"\u221236":[231],"dBc,":[232,239],"\u221278":[238],"respectively.":[240]},"counts_by_year":[{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}