{"id":"https://openalex.org/W3187803867","doi":"https://doi.org/10.1109/jssc.2021.3100470","title":"A Readout IC for Capacitive Touch Screen Panels With 33.9 dB Charge-Overflow Reduction Using Amplitude-Modulated Multi-Frequency Excitation","display_name":"A Readout IC for Capacitive Touch Screen Panels With 33.9 dB Charge-Overflow Reduction Using Amplitude-Modulated Multi-Frequency Excitation","publication_year":2021,"publication_date":"2021-08-05","ids":{"openalex":"https://openalex.org/W3187803867","doi":"https://doi.org/10.1109/jssc.2021.3100470","mag":"3187803867"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3100470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3100470","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100759341","display_name":"Jae-Sung An","orcid":"https://orcid.org/0000-0002-9831-5902"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Jae-Sung An","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technology, Delft, CD, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-9831-5902","affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113956828","display_name":"Jong-Hyun Ra","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Hyun Ra","raw_affiliation_strings":["SK Hynix Inc., Gyeonggi, Icheon-si, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SK Hynix Inc., Gyeonggi, Icheon-si, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078681482","display_name":"Eunchul Kang","orcid":"https://orcid.org/0000-0001-9849-4405"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Eunchul Kang","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technology, Delft, CD, The Netherlands","Sony Semiconductor Solutions, Lysaker, Norway"],"raw_orcid":"https://orcid.org/0000-0001-9849-4405","affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Sony Semiconductor Solutions, Lysaker, Norway","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019433498","display_name":"Michiel A. P. Pertijs","orcid":"https://orcid.org/0000-0002-9891-4374"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Michiel A. P. Pertijs","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technology, Delft, CD, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0002-9891-4374","affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101696117","display_name":"Sang-Hyun Han","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sang-Hyun Han","raw_affiliation_strings":["Leading UI Company, Ltd., Gyeonggi, Anyang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Leading UI Company, Ltd., Gyeonggi, Anyang, South Korea","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100759341"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.4248,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.57245774,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"56","issue":"11","first_page":"3486","last_page":"3498"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10914","display_name":"Tactile and Sensory Interactions","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2805","display_name":"Cognitive Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.6027128100395203},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.5827130079269409},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.5674148797988892},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44765931367874146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3859483599662781},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34509149193763733},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3431551456451416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23245835304260254},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.17572516202926636}],"concepts":[{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6027128100395203},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.5827130079269409},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.5674148797988892},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44765931367874146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3859483599662781},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34509149193763733},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3431551456451416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23245835304260254},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17572516202926636}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2021.3100470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3100470","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:tudelft.nl:uuid:9216eca4-4c7f-48c4-9a0d-d4f677416ced","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:9216eca4-4c7f-48c4-9a0d-d4f677416ced","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1961008516","https://openalex.org/W1967449424","https://openalex.org/W1973719213","https://openalex.org/W1975830975","https://openalex.org/W2020808975","https://openalex.org/W2028376114","https://openalex.org/W2085697433","https://openalex.org/W2095482223","https://openalex.org/W2108560657","https://openalex.org/W2108613929","https://openalex.org/W2118790894","https://openalex.org/W2127378720","https://openalex.org/W2136500484","https://openalex.org/W2140982079","https://openalex.org/W2142621880","https://openalex.org/W2157233558","https://openalex.org/W2160968599","https://openalex.org/W2169766445","https://openalex.org/W2177594704","https://openalex.org/W2209776115","https://openalex.org/W2290104157","https://openalex.org/W2465573274","https://openalex.org/W2472406600","https://openalex.org/W2507736523","https://openalex.org/W2555407481","https://openalex.org/W2560140195","https://openalex.org/W2586960794","https://openalex.org/W2593863448","https://openalex.org/W2759660702","https://openalex.org/W2765831366","https://openalex.org/W2791590267","https://openalex.org/W2792137411","https://openalex.org/W2801703160","https://openalex.org/W2911331896","https://openalex.org/W2985697058","https://openalex.org/W3015232057","https://openalex.org/W3048475507","https://openalex.org/W3102697607","https://openalex.org/W4238768493","https://openalex.org/W4254371078","https://openalex.org/W6679168911","https://openalex.org/W6681290002"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3102847316","https://openalex.org/W3172386668","https://openalex.org/W2045392317","https://openalex.org/W2035297892","https://openalex.org/W3011006018","https://openalex.org/W4205540626","https://openalex.org/W2143949944","https://openalex.org/W2051563071","https://openalex.org/W4386571252"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,45,93,109,147],"readout":[4,85],"integrated":[5],"circuit":[6],"(ROIC)":[7],"for":[8],"capacitive":[9],"touch-screen":[10,120],"panels":[11],"(TSPs)":[12],"employing":[13],"an":[14],"amplitude-modulated":[15],"multiple-frequency":[16],"excitation":[17,33,42,51,76],"(AM-MFE)":[18],"technique.":[19],"To":[20],"prevent":[21],"charge":[22,59,62,131],"overflow,":[23],"which":[24],"occurs":[25],"periodically":[26],"at":[27,44],"the":[28,32,35,38,41,50,54,58,66,72,75,80,84,144],"beat":[29],"frequency":[30,47],"of":[31,40,74,83,150,155],"frequencies,":[34],"ROIC":[36,55,89,145],"modulates":[37],"amplitude":[39,73],"voltages":[43,77],"mixing":[46],"derived":[48],"from":[49],"frequencies.":[52],"Thus,":[53],"can":[56],"sense":[57],"signal":[60],"without":[61,140],"overflow":[63,132],"and":[64,105,124,153,157,162],"maximize":[65],"signal-to-noise":[67],"ratio":[68],"(SNR)":[69],"by":[70],"increasing":[71],"up":[78,133],"to":[79,134,138],"sensing":[81],"range":[82],"circuit.":[86],"The":[87],"proposed":[88],"was":[90,106],"fabricated":[91],"in":[92],"0.13-":[94],"<inline-formula":[95,112],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[96,113],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[97,114],"<tex-math":[98,115],"notation=\"LaTeX\">$\\mu":[99],"\\text{m}$":[100],"</tex-math></inline-formula>":[101,118],"standard":[102],"CMOS":[103],"process":[104],"measured":[107],"with":[108,160],"32-in":[110],"104":[111],"notation=\"LaTeX\">$\\times":[116],"$":[117],"64":[119],"panel":[121],"using":[122],"1":[123,161],"10":[125,163],"mm":[126,164],"metal":[127,165],"pillars.":[128],"It":[129],"reduces":[130],"33.9":[135],"dB":[136,159],"compared":[137],"operation":[139],"AM-MFE.":[141],"In":[142],"addition,":[143],"achieves":[146],"frame":[148],"rate":[149],"2.93":[151],"kHz,":[152],"SNRs":[154],"41.7":[156],"61.6":[158],"pillars,":[166],"respectively.":[167]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}