{"id":"https://openalex.org/W3155757514","doi":"https://doi.org/10.1109/jssc.2021.3069954","title":"0.5\u20131-V, 90\u2013400-mA, Modular, Distributed, 3 \u00d7 3 Digital LDOs Based on Event-Driven Control and Domino Sampling and Regulation","display_name":"0.5\u20131-V, 90\u2013400-mA, Modular, Distributed, 3 \u00d7 3 Digital LDOs Based on Event-Driven Control and Domino Sampling and Regulation","publication_year":2021,"publication_date":"2021-04-16","ids":{"openalex":"https://openalex.org/W3155757514","doi":"https://doi.org/10.1109/jssc.2021.3069954","mag":"3155757514"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3069954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3069954","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007461519","display_name":"Sung Justin Kim","orcid":"https://orcid.org/0000-0001-5672-0689"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sung Justin Kim","raw_affiliation_strings":["Columbia University, New York, NY, USA"],"raw_orcid":"https://orcid.org/0000-0001-5672-0689","affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025421871","display_name":"Dongkwun Kim","orcid":"https://orcid.org/0000-0002-1379-0561"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dongkwun Kim","raw_affiliation_strings":["Columbia University, New York, NY, USA"],"raw_orcid":"https://orcid.org/0000-0002-1379-0561","affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037936776","display_name":"Yu Pu","orcid":"https://orcid.org/0000-0001-8366-8572"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210095624","display_name":"Alibaba Group (United States)","ror":"https://ror.org/00rn0m335","country_code":"US","type":"company","lineage":["https://openalex.org/I4210095624","https://openalex.org/I45928872"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Pu","raw_affiliation_strings":["Alibaba DAMO Computing Research Laboratory, Sunnyvale, CA, USA","Qualcomm, San Diego, CA, USA"],"raw_orcid":"https://orcid.org/0000-0001-8366-8572","affiliations":[{"raw_affiliation_string":"Alibaba DAMO Computing Research Laboratory, Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210095624"]},{"raw_affiliation_string":"Qualcomm, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101566780","display_name":"Chunlei Shi","orcid":"https://orcid.org/0000-0002-7745-1788"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chunlei Shi","raw_affiliation_strings":["Qualcomm, San Diego, CA, USA","Spreadtrum Communications USA, San Diego, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-7745-1788","affiliations":[{"raw_affiliation_string":"Qualcomm, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Spreadtrum Communications USA, San Diego, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018541939","display_name":"Soo Bong Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Soo Bong Chang","raw_affiliation_strings":["Columbia University, New York, NY, USA","Samsung Electronics, Hwaseong-si, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011887658","display_name":"Mingoo Seok","orcid":"https://orcid.org/0000-0002-9722-0979"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Columbia University, New York, NY, USA"],"raw_orcid":"https://orcid.org/0000-0002-9722-0979","affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2364,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.75955436,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"56","issue":"9","first_page":"2781","last_page":"2794"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.9221822619438171},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5231013298034668},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.48906072974205017},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.47938087582588196},{"id":"https://openalex.org/keywords/domino","display_name":"Domino","score":0.47752419114112854},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.473340779542923},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3838810622692108},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35944560170173645},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32180333137512207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21062913537025452}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.9221822619438171},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5231013298034668},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.48906072974205017},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.47938087582588196},{"id":"https://openalex.org/C2776416436","wikidata":"https://www.wikidata.org/wiki/Q3751781","display_name":"Domino","level":3,"score":0.47752419114112854},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.473340779542923},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3838810622692108},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35944560170173645},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32180333137512207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21062913537025452},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2021.3069954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3069954","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8100000023841858,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5415761988","display_name":"CAREER: Addressing Deepening Variability Challenges for Next-Generation Margin-Free VLSI Computing Platform Design","funder_award_id":"1453142","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2031456393","https://openalex.org/W2054989520","https://openalex.org/W2057042806","https://openalex.org/W2098264218","https://openalex.org/W2112611349","https://openalex.org/W2134327452","https://openalex.org/W2290232850","https://openalex.org/W2291648313","https://openalex.org/W2344336685","https://openalex.org/W2591643806","https://openalex.org/W2593766759","https://openalex.org/W2756683889","https://openalex.org/W2760813205","https://openalex.org/W2770079565","https://openalex.org/W2789664164","https://openalex.org/W2790621319","https://openalex.org/W2791562781","https://openalex.org/W2794182888","https://openalex.org/W2894668784","https://openalex.org/W2897516574","https://openalex.org/W2922193163","https://openalex.org/W2964770872","https://openalex.org/W2964937811","https://openalex.org/W3015928503","https://openalex.org/W3016214307","https://openalex.org/W6658496101","https://openalex.org/W6734468446","https://openalex.org/W6748369327","https://openalex.org/W6749402870","https://openalex.org/W6776214803"],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2153130273","https://openalex.org/W2765340260","https://openalex.org/W2143080380","https://openalex.org/W2076823813","https://openalex.org/W1589163333","https://openalex.org/W2141242302","https://openalex.org/W1979180831","https://openalex.org/W2101688915","https://openalex.org/W2081840904"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"on-chip":[3,157],"power":[4,45,57,98,158],"delivery":[5,159],"hardware":[6],"comprised":[7],"of":[8,41,47,56,68,162,180,208,229],"nine":[9],"event-driven":[10],"(ED)":[11],"digital":[12,20,70,165],"low-dropout":[13],"voltage":[14,90,107,112,201],"regulators":[15],"(LDOs)":[16],"for":[17,104,203],"a":[18,48,69,127,147,168,204,216,226],"large":[19],"load.":[21,49],"The":[22],"goal":[23],"is":[24],"to":[25,126,176],"address":[26,80],"the":[27,39,44,54,66,83,88,97,101,111,123,137,156,174,178,181,194,222],"performance":[28],"degradations":[29],"in":[30,38,43,167],"an":[31],"LDO's":[32],"accuracy":[33],"and":[34,72,86,151],"dynamic":[35,89],"load":[36,71,205],"regulation":[37,152],"presence":[40],"parasitics":[42],"grid":[46,58,99],"In":[50],"particular,":[51],"we":[52,79,115,141],"investigate":[53],"effects":[55],"resistance":[59],"(":[60],"RG),":[61],"which":[62],"becomes":[63],"worse":[64],"with":[65,118,146,215],"size":[67],"technology":[73],"scaling.":[74],"Two":[75],"critical":[76],"problems":[77],"that":[78,122,188],"are:":[81],"1)":[82],"IR":[84,102],"drop":[85,103],"2)":[87],"droop":[91,113,129,202],"problems.":[92],"Employing":[93],"multiple":[94],"LDOs":[95,117,166],"across":[96,184],"improves":[100],"mainly":[105],"better":[106],"sensing.":[108],"To":[109,134],"tackle":[110],"problem,":[114],"distribute":[116],"ED":[119],"control":[120,139],"such":[121],"LDO":[124,145,196],"closest":[125],"localized":[128],"can":[130],"instantly":[131],"correct":[132],"it.":[133],"further":[135],"improve":[136],"feedback":[138],"latency,":[140],"also":[142,172],"enhance":[143],"each":[144],"novel":[148],"domino":[149],"sampling":[150],"technique.":[153],"We":[154,171],"prototype":[155],"system":[160,183,224],"consisting":[161],"3":[163],"\u00d73":[164],"65-nm":[169],"CMOS.":[170],"devise":[173],"framework":[175],"analyze":[177],"stability":[179],"multi-LDO":[182],"RGvalues.":[185],"Measurements":[186],"show":[187],"at":[189,233],"0.5-V":[190,234],"(1":[191,235],"V)":[192,236],"input,":[193],"single":[195],"exhibits":[197],"49.8-mV":[198],"(94.1":[199],"mV)":[200],"current":[206,227],"change":[207],"4.04":[209],"mA/0.1":[210],"ns":[211],"(13.8":[212],"mA/0.2":[213],"ns)":[214],"0.1-nF":[217],"integrated":[218],"output":[219],"capacitor.":[220],"Also,":[221],"nine-LDO":[223],"achieves":[225],"density":[228],"248.8":[230],"mA/mm2(1.118.6":[231],"A/mm2)":[232],"input":[237],"voltage.":[238]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2}],"updated_date":"2026-08-06T08:24:18.245995","created_date":"2025-10-10T00:00:00"}