{"id":"https://openalex.org/W3138084750","doi":"https://doi.org/10.1109/jssc.2021.3063719","title":"Cascade Current Mirror to Improve Linearity and Consistency in SRAM In-Memory Computing","display_name":"Cascade Current Mirror to Improve Linearity and Consistency in SRAM In-Memory Computing","publication_year":2021,"publication_date":"2021-03-18","ids":{"openalex":"https://openalex.org/W3138084750","doi":"https://doi.org/10.1109/jssc.2021.3063719","mag":"3138084750"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3063719","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3063719","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072637140","display_name":"Zhiting Lin","orcid":"https://orcid.org/0000-0002-3314-1606"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiting Lin","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3314-1606","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069739724","display_name":"Honglan Zhan","orcid":"https://orcid.org/0000-0002-2840-9639"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honglan Zhan","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-2840-9639","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100784984","display_name":"Zhongwei Chen","orcid":"https://orcid.org/0000-0003-3463-5509"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongwei Chen","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075966974","display_name":"Chunyu Peng","orcid":"https://orcid.org/0000-0003-2408-5048"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunyu Peng","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-2408-5048","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037391840","display_name":"Xiulong Wu","orcid":"https://orcid.org/0000-0002-5012-2570"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiulong Wu","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-5012-2570","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017413053","display_name":"Wenjuan Lu","orcid":"https://orcid.org/0000-0001-6201-8589"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjuan Lu","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063284983","display_name":"Qiang Zhao","orcid":"https://orcid.org/0000-0002-0278-5804"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Zhao","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100362256","display_name":"Xuan Li","orcid":"https://orcid.org/0000-0001-6009-7711"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Li","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-6009-7711","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066523003","display_name":"Junning Chen","orcid":"https://orcid.org/0000-0001-7121-0994"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junning Chen","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":3.5405,"has_fulltext":false,"cited_by_count":47,"citation_normalized_percentile":{"value":0.93323779,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"56","issue":"8","first_page":"2550","last_page":"2562"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7846550345420837},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6345961689949036},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.559180498123169},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5414692163467407},{"id":"https://openalex.org/keywords/mnist-database","display_name":"MNIST database","score":0.5376793742179871},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.49781227111816406},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.484466552734375},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.4673384130001068},{"id":"https://openalex.org/keywords/cascade","display_name":"Cascade","score":0.4464348554611206},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44220855832099915},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.42984092235565186},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39230772852897644},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3610621988773346},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.27014708518981934},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21108853816986084},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1965353786945343},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17715081572532654},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16934552788734436},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1672477424144745}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7846550345420837},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6345961689949036},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.559180498123169},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5414692163467407},{"id":"https://openalex.org/C190502265","wikidata":"https://www.wikidata.org/wiki/Q17069496","display_name":"MNIST database","level":3,"score":0.5376793742179871},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.49781227111816406},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.484466552734375},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.4673384130001068},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.4464348554611206},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44220855832099915},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.42984092235565186},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39230772852897644},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3610621988773346},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.27014708518981934},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21108853816986084},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1965353786945343},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17715081572532654},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16934552788734436},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1672477424144745},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2021.3063719","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3063719","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5299999713897705}],"awards":[{"id":"https://openalex.org/G2270097615","display_name":null,"funder_award_id":"2017ZX01028-101-003","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"},{"id":"https://openalex.org/G2970710660","display_name":null,"funder_award_id":"U19A2074","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5582252795","display_name":"\u65b0\u539f\u7406\u5b58\u50a8\u5668\u4ef6\u7684\u5b58\u5185\u8ba1\u7b97\u5173\u952e\u6280\u672f\u7814\u7a76","funder_award_id":"61934005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7045866682","display_name":null,"funder_award_id":"2018YFB2202602","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G7486237554","display_name":null,"funder_award_id":"62074001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G985897707","display_name":null,"funder_award_id":"61804001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1584613780","https://openalex.org/W1591666071","https://openalex.org/W1601138654","https://openalex.org/W1972427123","https://openalex.org/W1976491043","https://openalex.org/W1998798369","https://openalex.org/W1999484437","https://openalex.org/W2008627543","https://openalex.org/W2036742943","https://openalex.org/W2065343838","https://openalex.org/W2105377990","https://openalex.org/W2110134128","https://openalex.org/W2136393784","https://openalex.org/W2146276996","https://openalex.org/W2167210005","https://openalex.org/W2167903456","https://openalex.org/W2171215694","https://openalex.org/W2281229150","https://openalex.org/W2412363831","https://openalex.org/W2587415333","https://openalex.org/W2591601611","https://openalex.org/W2775637085","https://openalex.org/W2782511028","https://openalex.org/W2790511620","https://openalex.org/W2790556218","https://openalex.org/W2792893539","https://openalex.org/W2809579658","https://openalex.org/W2891442728","https://openalex.org/W2895842071","https://openalex.org/W2898665561","https://openalex.org/W2898913080","https://openalex.org/W2921013323","https://openalex.org/W2922487710","https://openalex.org/W2942378084","https://openalex.org/W2966524683","https://openalex.org/W2966878541","https://openalex.org/W2969621832","https://openalex.org/W2977306693","https://openalex.org/W3000301330","https://openalex.org/W3011368285","https://openalex.org/W3015432327","https://openalex.org/W3015887053","https://openalex.org/W3017968097","https://openalex.org/W3086422614","https://openalex.org/W3104353813","https://openalex.org/W3207359372","https://openalex.org/W6634950698","https://openalex.org/W6680178178","https://openalex.org/W6748877789","https://openalex.org/W6752956637","https://openalex.org/W6775788069"],"related_works":["https://openalex.org/W4283781448","https://openalex.org/W2792016738","https://openalex.org/W3091885635","https://openalex.org/W3194132012","https://openalex.org/W4245795187","https://openalex.org/W3081966132","https://openalex.org/W4293499136","https://openalex.org/W2945948557","https://openalex.org/W3011370403","https://openalex.org/W3138084750"],"abstract_inverted_index":{"Although":[0],"multirow":[1],"read":[2,65],"is":[3,132],"essential":[4],"to":[5,54,94,123],"achieve":[6],"static":[7],"random":[8],"access":[9],"memory":[10],"(SRAM)":[11],"in-memory":[12],"computing":[13],"(IMC),":[14],"it":[15],"may":[16],"undermine":[17],"circuit":[18],"linearity":[19],"and":[20,34,61,85,98,128,160],"computational":[21,88,130],"consistency":[22,131],"across":[23],"columns.":[24],"In":[25,67,140],"this":[26],"study,":[27],"we":[28,40,142],"investigated":[29],"the":[30,64,79,83,87,92,102,113,118,129,144,158,164,178],"causes":[31],"of":[32],"nonlinearity":[33,120],"inconsistency.":[35],"Based":[36],"on":[37],"detailed":[38],"analyses,":[39],"proposed":[41,114,179],"a":[42,69,150,172],"cascade":[43],"current":[44],"mirror":[45],"(CCM)":[46],"peripheral":[47],"circuit.":[48,181],"Only":[49],"four":[50],"transistors":[51],"were":[52],"added":[53],"each":[55],"bitline":[56],"(BL)":[57],"for":[58],"voltage":[59],"clamping":[60],"proportionally":[62],"mirroring":[63],"current.":[66],"addition,":[68,141],"6T":[70],"SRAM":[71,174],"cell":[72],"with":[73,78],"double":[74],"word":[75],"lines":[76],"operating":[77],"CCM":[80,115,180],"further":[81],"reduced":[82],"delay":[84],"improved":[86,134],"consistency.":[89],"We":[90],"applied":[91],"structure":[93],"numerous":[95],"prior":[96],"studies":[97],"evaluated":[99],"them":[100],"using":[101,149],"28-nm":[103],"complementary":[104],"metal-oxide":[105],"semiconductor":[106],"process.":[107],"The":[108,166],"measurement":[109],"results":[110],"show":[111],"that":[112],"can":[116],"reduce":[117],"integer":[119],"by":[121,135],"up":[122],"70%":[124],"at":[125,137],"0.8-V":[126],"supply,":[127],"substantially":[133],"56.84%":[136],"0.9-V":[138],"supply.":[139],"verified":[143],"performance":[145],"improvement":[146],"through":[147],"classification":[148],"convolutional":[151],"neural":[152],"network,":[153],"achieving":[154],"91%":[155],"accuracy":[156,162],"in":[157,163,171],"MNIST":[159],"86%":[161],"CIFAR-10.":[165],"area":[167],"overhead":[168],"was":[169],"1.77%":[170],"512\u00d7512":[173],"array":[175],"when":[176],"integrating":[177]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}