{"id":"https://openalex.org/W3127599739","doi":"https://doi.org/10.1109/jssc.2021.3049560","title":"A 36-Channel Auto-Calibrated Front-End ASIC for a pMUT-Based Miniaturized 3-D Ultrasound System","display_name":"A 36-Channel Auto-Calibrated Front-End ASIC for a pMUT-Based Miniaturized 3-D Ultrasound System","publication_year":2021,"publication_date":"2021-01-29","ids":{"openalex":"https://openalex.org/W3127599739","doi":"https://doi.org/10.1109/jssc.2021.3049560","mag":"3127599739"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2021.3049560","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3049560","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/9440831/09340356.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/4/9440831/09340356.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048898383","display_name":"Ji Hee Lee","orcid":"https://orcid.org/0000-0003-1440-9088"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]},{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jihee Lee","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea","School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014233617","display_name":"Kyoung-Rog Lee","orcid":"https://orcid.org/0000-0002-4017-0536"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyoung-Rog Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004440463","display_name":"Benjamin E. Eovino","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Benjamin E. Eovino","raw_affiliation_strings":["Chirp Microsystems, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Chirp Microsystems, Berkeley, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002515807","display_name":"Jeong Hoan Park","orcid":"https://orcid.org/0000-0002-8882-0091"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR","SG"],"is_corresponding":false,"raw_author_name":"Jeong Hoan Park","raw_affiliation_strings":["National University of Singapore, Singapore","Samsung Electronics, Hwaseong, South Korea"],"affiliations":[{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]},{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101442688","display_name":"Yue Liang","orcid":"https://orcid.org/0000-0003-3026-9417"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Luna Yue Liang","raw_affiliation_strings":["Apple Inc., Shenzhen, China","University of California at Berkeley, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Apple Inc., Shenzhen, China","institution_ids":[]},{"raw_affiliation_string":"University of California at Berkeley, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100383258","display_name":"Liwei Lin","orcid":"https://orcid.org/0000-0001-7083-624X"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liwei Lin","raw_affiliation_strings":["University of California at Berkeley, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California at Berkeley, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-Jun Yoo","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008050114","display_name":"Jerald Yoo","orcid":"https://orcid.org/0000-0002-3150-1727"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jerald Yoo","raw_affiliation_strings":["N.1 Institute for Health, Singapore","National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"N.1 Institute for Health, Singapore","institution_ids":[]},{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5048898383"],"corresponding_institution_ids":["https://openalex.org/I157485424","https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":6.3745,"has_fulltext":true,"cited_by_count":54,"citation_normalized_percentile":{"value":0.97878311,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"56","issue":"6","first_page":"1910","last_page":"1923"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10727","display_name":"Ultrasound Imaging and Elastography","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.6464130878448486},{"id":"https://openalex.org/keywords/ultrasound","display_name":"Ultrasound","score":0.5451809763908386},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.4792749583721161},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44901415705680847},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.43736886978149414},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.42417460680007935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3844667673110962},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32063889503479004},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28933268785476685},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19963708519935608},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10580411553382874}],"concepts":[{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.6464130878448486},{"id":"https://openalex.org/C143753070","wikidata":"https://www.wikidata.org/wiki/Q162564","display_name":"Ultrasound","level":2,"score":0.5451809763908386},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.4792749583721161},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44901415705680847},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.43736886978149414},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.42417460680007935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3844667673110962},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32063889503479004},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28933268785476685},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19963708519935608},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10580411553382874}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2021.3049560","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3049560","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/9440831/09340356.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/jssc.2021.3049560","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2021.3049560","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/9440831/09340356.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5255132712","display_name":null,"funder_award_id":"HiFES","funder_id":"https://openalex.org/F4320320698","funder_display_name":"National University of Singapore"},{"id":"https://openalex.org/G6572040327","display_name":null,"funder_award_id":"R-263-501-011-133/731","funder_id":"https://openalex.org/F4320320698","funder_display_name":"National University of Singapore"}],"funders":[{"id":"https://openalex.org/F4320320698","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3127599739.pdf","grobid_xml":"https://content.openalex.org/works/W3127599739.grobid-xml"},"referenced_works_count":34,"referenced_works":["https://openalex.org/W1545485620","https://openalex.org/W1756440147","https://openalex.org/W1986934293","https://openalex.org/W2015906754","https://openalex.org/W2016291486","https://openalex.org/W2068107367","https://openalex.org/W2081038213","https://openalex.org/W2087197804","https://openalex.org/W2093859945","https://openalex.org/W2102423385","https://openalex.org/W2157476064","https://openalex.org/W2161817031","https://openalex.org/W2162071877","https://openalex.org/W2164028972","https://openalex.org/W2216062291","https://openalex.org/W2290399308","https://openalex.org/W2315162695","https://openalex.org/W2329793854","https://openalex.org/W2516570461","https://openalex.org/W2517358718","https://openalex.org/W2530195409","https://openalex.org/W2569264893","https://openalex.org/W2587764916","https://openalex.org/W2591689298","https://openalex.org/W2765815218","https://openalex.org/W2793184832","https://openalex.org/W2889595172","https://openalex.org/W2892743721","https://openalex.org/W2920876983","https://openalex.org/W2953880456","https://openalex.org/W3015373419","https://openalex.org/W3097775566","https://openalex.org/W6760274187","https://openalex.org/W6775541421"],"related_works":["https://openalex.org/W2165367082","https://openalex.org/W1972641423","https://openalex.org/W611446063","https://openalex.org/W4206938017","https://openalex.org/W2388299947","https://openalex.org/W1967064512","https://openalex.org/W2382673458","https://openalex.org/W2361380273","https://openalex.org/W2971689244","https://openalex.org/W2064074511"],"abstract_inverted_index":{"We":[0],"present":[1],"an":[2,47],"area-":[3],"and":[4,23,46,60,166,186],"power-efficient":[5],"application-specific":[6],"integrated":[7],"circuit":[8],"(ASIC)":[9],"for":[10,65],"a":[11,27,40,43,136,190],"miniaturized":[12],"3-D":[13],"ultrasound":[14],"system.":[15],"The":[16,36,72,109,130,154,172],"ASIC":[17,38,155,173],"is":[18],"designed":[19],"to":[20,63,82,104],"transmit":[21],"pulse":[22,88,162],"receive":[24],"echo":[25],"through":[26],"36-channel":[28,37],"2-D":[29],"piezoelectric":[30],"Micromachined":[31],"Ultrasound":[32],"Transducer":[33],"(pMUT)":[34],"array.":[35,193],"integrates":[39],"transmitter":[41],"(TX),":[42],"receiver":[44],"(RX),":[45],"analog-to-digital":[48],"converter":[49],"(ADC)":[50],"within":[51],"the":[52,66,70,114,124],"250-":[53],"\u03bcm":[54,176],"pitch":[55],"channel":[56],"while":[57,89],"consuming":[58],"low-power":[59],"supporting":[61],"calibration":[62],"compensate":[64],"process":[67],"variation":[68],"of":[69,107],"pMUT.":[71,108],"charge-recycling":[73],"high-voltage":[74],"TX":[75,93,168],"(CRHV-TX)":[76],"in":[77,146,174],"standard":[78],"CMOS":[79,179],"generates":[80],"up":[81],"13.2-":[83],"V":[84],"<sub":[85],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[86],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">PP</sub>":[87],"reducing":[90],"42.2%":[91],"peak":[92],"power":[94,159],"consumption.":[95],"Also,":[96],"each":[97],"CRHV-TX":[98],"automatically":[99],"calibrates":[100],"excitation":[101],"voltage":[102],"according":[103],"acoustic":[105,187],"pressure":[106],"dynamic-bit-shared":[110],"ADC":[111],"(DBS-ADC)":[112],"shares":[113],"most":[115],"significant":[116],"bits":[117],"(MSBs)":[118],"among":[119],"four":[120],"channels":[121],"based":[122],"on":[123,150],"signal":[125,138,152],"similarity":[126],"between":[127],"adjacent":[128],"channels.":[129],"analog":[131],"front":[132],"end":[133],"(AFE)":[134],"with":[135,160,183,189],"received":[137],"sensitivity":[139],"indicator":[140],"(RSSI)":[141],"changes":[142],"its":[143],"gain":[144],"adaptively":[145],"real":[147],"time":[148],"depending":[149],"input":[151],"strength.":[153],"consumes":[156],"1.14-mW/channel":[157],"average":[158],"1-kHz":[161],"repetition":[163],"frequency":[164],"(PRF)":[165],"three":[167],"pulses":[169],"per":[170],"cycle.":[171],"0.18-":[175],"1P6M":[177],"Standard":[178],"has":[180],"been":[181],"verified":[182],"both":[184],"electrical":[185],"experiments":[188],"6\u00d76":[191],"pMUT":[192]},"counts_by_year":[{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":17},{"year":2023,"cited_by_count":12},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":4}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}