{"id":"https://openalex.org/W3110953700","doi":"https://doi.org/10.1109/jssc.2020.3039800","title":"Dual-Port SOT-MRAM Achieving 90-MHz Read and 60-MHz Write Operations Under Field-Assistance-Free Condition","display_name":"Dual-Port SOT-MRAM Achieving 90-MHz Read and 60-MHz Write Operations Under Field-Assistance-Free Condition","publication_year":2020,"publication_date":"2020-12-10","ids":{"openalex":"https://openalex.org/W3110953700","doi":"https://doi.org/10.1109/jssc.2020.3039800","mag":"3110953700"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2020.3039800","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2020.3039800","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002874074","display_name":"Masanori Natsui","orcid":"https://orcid.org/0000-0001-7424-4663"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Natsui","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","Laboratory for Brainware Systems, Research Institute of Electrical Communication, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0001-7424-4663","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Laboratory for Brainware Systems, Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023574224","display_name":"Akira Tamakoshi","orcid":"https://orcid.org/0000-0002-7348-8196"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Tamakoshi","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Research Institute of Electrical Communication, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0002-7348-8196","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035295738","display_name":"H. Honjo","orcid":"https://orcid.org/0000-0002-5742-108X"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Honjo","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0002-5742-108X","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101123460","display_name":"Toshinari Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshinari Watanabe","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007183512","display_name":"T. Nasuno","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Nasuno","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101433888","display_name":"Chaoliang Zhang","orcid":"https://orcid.org/0000-0002-6859-1340"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Chaoliang Zhang","raw_affiliation_strings":["Frontier Research Institute for Interdisciplinary Sciences, Tohoku University, Sendai, Japan","Laboratory for Nanoelectronics and Spintronics, Tohoku University, Sendai, Japan","Research Institute of Electrical Communication, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Frontier Research Institute for Interdisciplinary Sciences, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Laboratory for Nanoelectronics and Spintronics, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108677680","display_name":"Takaho Tanigawa","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takaho Tanigawa","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108492826","display_name":"Hirofumi Inoue","orcid":"https://orcid.org/0009-0001-4413-5746"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirofumi Inoue","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052532747","display_name":"M. Niwa","orcid":"https://orcid.org/0000-0002-4859-7016"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaaki Niwa","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007877689","display_name":"T. Yoshiduka","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toru Yoshiduka","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051006340","display_name":"Y. Noguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuo Noguchi","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047888352","display_name":"M. Yasuhira","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuo Yasuhira","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083627030","display_name":"Yitao Ma","orcid":"https://orcid.org/0000-0003-4004-0245"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yitao Ma","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","Graduate School of Engineering, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0003-4004-0245","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Graduate School of Engineering, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100696758","display_name":"Hui Shen","orcid":"https://orcid.org/0000-0002-0437-8516"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hui Shen","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Graduate School of Engineering, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Graduate School of Engineering, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069574310","display_name":"Shunsuke Fukami","orcid":"https://orcid.org/0000-0001-5750-2990"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210094683","display_name":"Advanced Institute of Materials Science","ror":"https://ror.org/00p5prq49","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210094683"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunsuke Fukami","raw_affiliation_strings":["Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","Laboratory for Nanoelectronics and Spintronics, Tohoku University, Sendai, Japan","Center for Science and Innovation in Spintronics, Tohoku University, Sendai, Japan","WPI-Advanced Institute for Materials Research, Tohoku University, Sendai, Japan","Center for Spintronics Research Network, Tohoku University, Sendai, Japan","Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0001-5750-2990","affiliations":[{"raw_affiliation_string":"Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Laboratory for Nanoelectronics and Spintronics, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Science and Innovation in Spintronics, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"WPI-Advanced Institute for Materials Research, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210094683","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Research Network, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055570618","display_name":"H. Sato","orcid":"https://orcid.org/0000-0003-4673-1936"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideo Sato","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","Center for Spintronics Research Network, Tohoku University, Sendai, Japan","Research Institute of Electrical Communication, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0003-4673-1936","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Research Network, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012267283","display_name":"Shoji Ikeda","orcid":"https://orcid.org/0000-0002-3925-4089"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji Ikeda","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Science and Innovation in Spintronics, Tohoku University, Sendai, Japan","Center for Spintronics Research Network, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0002-3925-4089","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Science and Innovation in Spintronics, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Research Network, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081983682","display_name":"Hideo Ohno","orcid":"https://orcid.org/0000-0001-9688-8259"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210094683","display_name":"Advanced Institute of Materials Science","ror":"https://ror.org/00p5prq49","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210094683"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideo Ohno","raw_affiliation_strings":["Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","Laboratory for Nanoelectronics and Spintronics, Tohoku University, Sendai, Japan","Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Science and Innovation in Spintronics, Tohoku University, Sendai, Japan","WPI Advanced Institute for Materials Research, Tohoku University, Sendai, Japan","Center for Spintronics Research Network, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9688-8259","affiliations":[{"raw_affiliation_string":"Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Laboratory for Nanoelectronics and Spintronics, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Science and Innovation in Spintronics, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"WPI Advanced Institute for Materials Research, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210094683","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Research Network, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083722186","display_name":"Tetsuo Endoh","orcid":"https://orcid.org/0000-0002-5583-3283"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuo Endoh","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","Graduate School of Engineering, Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0002-5583-3283","affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Graduate School of Engineering, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062434040","display_name":"Takahiro Hanyu","orcid":"https://orcid.org/0000-0002-4397-8290"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Hanyu","raw_affiliation_strings":["Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","Laboratory for Brainware Systems, Tohoku University, Sendai, Japan","Research Institute of Electrical Communication, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]},{"raw_affiliation_string":"Laboratory for Brainware Systems, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Research Institute of Electrical Communication, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":20,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.1997,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.92705122,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"56","issue":"4","first_page":"1116","last_page":"1128"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.9091848134994507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6449794769287109},{"id":"https://openalex.org/keywords/spin-transfer-torque","display_name":"Spin-transfer torque","score":0.5124850273132324},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5020053386688232},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4680927097797394},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.46413370966911316},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4299715757369995},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4114759564399719},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3321074843406677},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.18559378385543823},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1791420578956604},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1697731912136078},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.16969913244247437},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11411285400390625},{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.10164019465446472}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.9091848134994507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6449794769287109},{"id":"https://openalex.org/C609986","wikidata":"https://www.wikidata.org/wiki/Q844840","display_name":"Spin-transfer torque","level":4,"score":0.5124850273132324},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5020053386688232},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4680927097797394},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.46413370966911316},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4299715757369995},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4114759564399719},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3321074843406677},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.18559378385543823},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1791420578956604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1697731912136078},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.16969913244247437},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11411285400390625},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.10164019465446472},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2020.3039800","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2020.3039800","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W1526699078","https://openalex.org/W1967547265","https://openalex.org/W2014744284","https://openalex.org/W2032558960","https://openalex.org/W2047540651","https://openalex.org/W2048344562","https://openalex.org/W2058483530","https://openalex.org/W2090159636","https://openalex.org/W2096445739","https://openalex.org/W2102209351","https://openalex.org/W2169801078","https://openalex.org/W2401752548","https://openalex.org/W2514994418","https://openalex.org/W2517053653","https://openalex.org/W2526677435","https://openalex.org/W2588704006","https://openalex.org/W2594544187","https://openalex.org/W2621198309","https://openalex.org/W2738287842","https://openalex.org/W2898399894","https://openalex.org/W2909022488","https://openalex.org/W2912664664","https://openalex.org/W2912871364","https://openalex.org/W2913402275","https://openalex.org/W2914243259","https://openalex.org/W2922071906","https://openalex.org/W2922523256","https://openalex.org/W2960963051","https://openalex.org/W2965634106","https://openalex.org/W2966533375","https://openalex.org/W2967487348","https://openalex.org/W3005843323","https://openalex.org/W3006196114","https://openalex.org/W3013200932","https://openalex.org/W3015213341","https://openalex.org/W3015432327","https://openalex.org/W3016021860","https://openalex.org/W3016147292","https://openalex.org/W3016245653","https://openalex.org/W3048503986","https://openalex.org/W4230995605","https://openalex.org/W6631403632","https://openalex.org/W6658403690","https://openalex.org/W6685169983","https://openalex.org/W6761042657","https://openalex.org/W6766277174","https://openalex.org/W6775788069","https://openalex.org/W6776125218","https://openalex.org/W6776605763"],"related_works":["https://openalex.org/W2034593071","https://openalex.org/W1977755618","https://openalex.org/W3136027979","https://openalex.org/W1970094457","https://openalex.org/W4226197542","https://openalex.org/W4231059390","https://openalex.org/W2543376619","https://openalex.org/W2490184523","https://openalex.org/W2289300168","https://openalex.org/W2770398769"],"abstract_inverted_index":{"The":[0,133],"development":[1,97],"of":[2,33,92,98,151,180],"new":[3,23,99],"functional":[4],"memories":[5,100],"using":[6,121,136],"emerging":[7],"nonvolatile":[8,94,119],"devices":[9,123],"has":[10,21,44],"been":[11],"widely":[12],"investigated.":[13],"Spin-transfer":[14],"torque":[15],"magnetoresistive":[16],"random":[17],"access":[18,52],"memory":[19,120],"(STT-MRAM)":[20],"become":[22],"technology":[24],"platform":[25],"to":[26,40,85,160],"overcome":[27],"the":[28,36,57,87,90,96,152,177,181,188],"issue":[29],"in":[30,61,143],"power":[31],"consumption":[32],"logic":[34],"for":[35,71,89,154],"application":[37],"from":[38],"IoT":[39],"AI;":[41],"however,":[42],"STT-MRAM":[43,62],"a":[45,64,118,130,137,144,148,156,165,170,203],"tradeoff":[46],"relationship":[47],"between":[48],"endurance,":[49],"retention,":[50],"and":[51,67,106,194],"time.":[53],"This":[54],"is":[55,63,109,141,173],"because":[56],"MTJ":[58,122],"device":[59,153],"used":[60],"two-terminal":[65],"device,":[66,105],"excessive":[68],"read":[69,81,196],"current":[70],"high-speed":[72,93,161],"readout":[73],"can":[74],"cause":[75],"unexpected":[76],"data":[77],"writing,":[78],"or":[79],"so-called":[80],"disturbance.":[82],"In":[83,111,163],"order":[84],"meet":[86],"demand":[88],"realization":[91],"memory,":[95],"based":[101],"on":[102],"innovative":[103],"circuit,":[104],"integration":[107],"process":[108,140],"required.":[110],"this":[112],"article,":[113],"we":[114,185],"demonstrate":[115,187],"an":[116],"SOT-MRAM,":[117],"with":[124,198],"spin-orbit-torque":[125],"(SOT)":[126],"switching":[127],"that":[128],"have":[129],"read-disturbance-free":[131],"characteristic.":[132],"SOT-MRAM":[134,190],"fabricated":[135,182],"55-nm":[138],"CMOS":[139],"implemented":[142],"dual-port":[145],"configuration":[146],"utilizing":[147],"three-terminal":[149],"structure":[150],"realizing":[155],"wide":[157],"bandwidth":[158],"applicable":[159],"applications.":[162],"addition,":[164],"read-energy":[166],"reduction":[167],"technique":[168],"called":[169],"self-termination":[171],"scheme":[172],"also":[174],"implemented.":[175],"Through":[176],"measurement":[178],"results":[179],"prototype":[183],"chip,":[184],"will":[186],"proposed":[189],"achieves":[191],"60-MHz":[192],"write":[193],"90-MHz":[195],"operations":[197],"1.2-V":[199],"supply":[200],"voltage":[201],"under":[202],"magnetic-field-free":[204],"condition.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":23},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":11},{"year":2021,"cited_by_count":4}],"updated_date":"2026-06-13T07:54:00.901334","created_date":"2025-10-10T00:00:00"}