{"id":"https://openalex.org/W3040703042","doi":"https://doi.org/10.1109/jssc.2020.3005806","title":"A 4-GHz Sub-Harmonically Injection-Locked Phase-Locked Loop With Self-Calibrated Injection Timing and Pulsewidth","display_name":"A 4-GHz Sub-Harmonically Injection-Locked Phase-Locked Loop With Self-Calibrated Injection Timing and Pulsewidth","publication_year":2020,"publication_date":"2020-07-09","ids":{"openalex":"https://openalex.org/W3040703042","doi":"https://doi.org/10.1109/jssc.2020.3005806","mag":"3040703042"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2020.3005806","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2020.3005806","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068295871","display_name":"Xuefan Jin","orcid":"https://orcid.org/0000-0002-2784-4196"},"institutions":[{"id":"https://openalex.org/I4210131320","display_name":"LG (South Korea)","ror":"https://ror.org/03ddh2c27","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210131320"]},{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Xuefan Jin","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","LG Electronics, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2784-4196","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]},{"raw_affiliation_string":"LG Electronics, Seoul, South Korea","institution_ids":["https://openalex.org/I4210131320"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101924093","display_name":"Woosung Park","orcid":"https://orcid.org/0000-0002-6696-4326"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woosung Park","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6696-4326","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101403845","display_name":"Dongseok Kang","orcid":"https://orcid.org/0000-0003-2165-4014"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Seok Kang","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002322483","display_name":"Young-Jun Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngjun Ko","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052707197","display_name":"Kee-Won Kwon","orcid":"https://orcid.org/0000-0003-4513-8532"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kee-Won Kwon","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4513-8532","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]},{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009724263","display_name":"Jung\u2010Hoon Chun","orcid":"https://orcid.org/0000-0002-2668-6739"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Hoon Chun","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2668-6739","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0406,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.76504674,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"55","issue":"10","first_page":"2724","last_page":"2733"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.9719725251197815},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8073650002479553},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7716136574745178},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.7536453604698181},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6474528312683105},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5346288681030273},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.525492250919342},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4781312048435211},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4375725984573364},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4269787669181824},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4161548912525177},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3406117558479309},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.337182879447937},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22476869821548462},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.16775840520858765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11959600448608398}],"concepts":[{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.9719725251197815},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8073650002479553},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7716136574745178},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.7536453604698181},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6474528312683105},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5346288681030273},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.525492250919342},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4781312048435211},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4375725984573364},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4269787669181824},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4161548912525177},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3406117558479309},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.337182879447937},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22476869821548462},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.16775840520858765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11959600448608398},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2020.3005806","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2020.3005806","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8500000238418579}],"awards":[{"id":"https://openalex.org/G3315451840","display_name":null,"funder_award_id":"2016R1D1A1B04933413","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1971635427","https://openalex.org/W2020188262","https://openalex.org/W2036086508","https://openalex.org/W2051547299","https://openalex.org/W2066871406","https://openalex.org/W2069335439","https://openalex.org/W2093232112","https://openalex.org/W2097406868","https://openalex.org/W2102596261","https://openalex.org/W2119816915","https://openalex.org/W2121854746","https://openalex.org/W2131053965","https://openalex.org/W2161581992","https://openalex.org/W2167891824","https://openalex.org/W2177383565","https://openalex.org/W2290934758","https://openalex.org/W2462522525","https://openalex.org/W2605666562","https://openalex.org/W2754812974","https://openalex.org/W2895509314","https://openalex.org/W2921945517","https://openalex.org/W3016138070","https://openalex.org/W3145704239","https://openalex.org/W6760304811"],"related_works":["https://openalex.org/W1994021281","https://openalex.org/W2540832666","https://openalex.org/W4286579627","https://openalex.org/W2139484866","https://openalex.org/W1851259350","https://openalex.org/W272184114","https://openalex.org/W2117747481","https://openalex.org/W2394282069","https://openalex.org/W3189810088","https://openalex.org/W2141726610"],"abstract_inverted_index":{"A":[0],"4-GHz":[1],"sub-harmonically":[2],"injection-locked":[3],"phase-locked":[4],"loop":[5],"(ILPLL)":[6],"with":[7,73],"on-chip":[8],"calibration":[9,76],"is":[10],"presented.":[11],"The":[12,28,51],"injection":[13],"timing":[14],"and":[15,64],"pulsewidth":[16],"of":[17,31,44],"the":[18,32,45,65,74,84],"injected":[19],"pulse":[20],"are":[21],"self-calibrated":[22],"to":[23,58],"achieve":[24],"low":[25],"phase":[26,29],"noise.":[27],"noise":[30],"proposed":[33,75,85],"ILPLL":[34,86],"was":[35,48,61,70],"\u2212112.3":[36],"dBc/Hz":[37],"at":[38,95],"1-MHz":[39],"offset":[40],"frequency,":[41],"whereas":[42],"that":[43],"conventional":[46],"PLL":[47],"\u2212104.8":[49],"dBc/Hz.":[50],"measured":[52],"integrated":[53],"jitter":[54],"from":[55,102],"10":[56],"kHz":[57],"30":[59],"MHz":[60],"710":[62],"fs,":[63],"corresponding":[66],"reference":[67],"spur":[68],"level":[69],"\u221261.6":[71],"dBc":[72],"technique.":[77],"Fabricated":[78],"in":[79],"a":[80,103],"28-nm":[81],"CMOS":[82],"process,":[83],"occupies":[87],"0.09":[88],"mm":[89],"<sup":[90],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[91],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[92],".":[93],"Operating":[94],"4":[96],"GHz,":[97],"it":[98],"consumes":[99],"11.4":[100],"mW":[101],"1.0-V":[104],"power":[105],"supply.":[106]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}