{"id":"https://openalex.org/W2999571526","doi":"https://doi.org/10.1109/jssc.2019.2963002","title":"A 373-F\u00b2 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and VSS Bias-Based Dark-Bit Detection","display_name":"A 373-F\u00b2 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and VSS Bias-Based Dark-Bit Detection","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W2999571526","doi":"https://doi.org/10.1109/jssc.2019.2963002","mag":"2999571526"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2963002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2963002","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018776323","display_name":"Kunyang Liu","orcid":"https://orcid.org/0000-0002-9328-7076"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunyang Liu","raw_affiliation_strings":["Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan"],"raw_orcid":"https://orcid.org/0000-0002-9328-7076","affiliations":[{"raw_affiliation_string":"Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042418335","display_name":"Min Yue","orcid":"https://orcid.org/0000-0002-9369-2688"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yue Min","raw_affiliation_strings":["Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","Marvell Technology Ltd., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"Marvell Technology Ltd., Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101975561","display_name":"Xuan Yang","orcid":"https://orcid.org/0009-0001-0361-2470"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xuan Yang","raw_affiliation_strings":["Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","HiSilicon Technologies Company Ltd., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"HiSilicon Technologies Company Ltd., Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025286236","display_name":"Hanfeng Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hanfeng Sun","raw_affiliation_strings":["Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008563407","display_name":"Hirofumi Shinohara","orcid":"https://orcid.org/0000-0001-5589-8397"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirofumi Shinohara","raw_affiliation_strings":["Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information, Production and Systems, Waseda University, Kitakyushu, Japan","institution_ids":["https://openalex.org/I150744194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I150744194"],"apc_list":null,"apc_paid":null,"fwci":10.4625,"has_fulltext":false,"cited_by_count":73,"citation_normalized_percentile":{"value":0.98996014,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.6660003662109375},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5966638326644897},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.5841289162635803},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.5069110989570618},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4958997666835785},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.44943252205848694},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44454360008239746},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4327021539211273},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4160492420196533},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35851621627807617},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.34872138500213623},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.29449647665023804},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22209995985031128},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2150445580482483},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.17419672012329102},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11669427156448364}],"concepts":[{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.6660003662109375},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5966638326644897},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.5841289162635803},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.5069110989570618},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4958997666835785},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.44943252205848694},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44454360008239746},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4327021539211273},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4160492420196533},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35851621627807617},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34872138500213623},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29449647665023804},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22209995985031128},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2150445580482483},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.17419672012329102},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11669427156448364},{"id":"https://openalex.org/C2779971761","wikidata":"https://www.wikidata.org/wiki/Q629872","display_name":"Arbiter","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2963002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2963002","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8399999737739563}],"awards":[{"id":"https://openalex.org/G6048121410","display_name":"Quality Improvement of Natural Data for Security by Controling Initial State","funder_award_id":"17K06404","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W609951012","https://openalex.org/W1515671919","https://openalex.org/W2000171858","https://openalex.org/W2001067488","https://openalex.org/W2017500042","https://openalex.org/W2017827600","https://openalex.org/W2053877171","https://openalex.org/W2080284304","https://openalex.org/W2095526927","https://openalex.org/W2105114022","https://openalex.org/W2113322447","https://openalex.org/W2138874069","https://openalex.org/W2169212403","https://openalex.org/W2290692811","https://openalex.org/W2295460135","https://openalex.org/W2304716896","https://openalex.org/W2580334840","https://openalex.org/W2592569505","https://openalex.org/W2594214473","https://openalex.org/W2621777950","https://openalex.org/W2725642090","https://openalex.org/W2745643874","https://openalex.org/W2749093550","https://openalex.org/W2759479718","https://openalex.org/W2768417459","https://openalex.org/W2770486545","https://openalex.org/W2791198567","https://openalex.org/W2794177219","https://openalex.org/W2890844360","https://openalex.org/W2906862720","https://openalex.org/W2907642298","https://openalex.org/W2961729905","https://openalex.org/W6630771808","https://openalex.org/W6654954156","https://openalex.org/W6734181298","https://openalex.org/W6739978421"],"related_works":["https://openalex.org/W2217098757","https://openalex.org/W2088771128","https://openalex.org/W2263373136","https://openalex.org/W2796085262","https://openalex.org/W190245591","https://openalex.org/W1650778624","https://openalex.org/W2545385022","https://openalex.org/W2775062502","https://openalex.org/W2302863414","https://openalex.org/W4385196433"],"abstract_inverted_index":{"This":[0,143],"article":[1],"presents":[2],"a":[3,47,53,203],"highly":[4,200],"stable":[5],"SRAM-based":[6,110],"physically":[7],"unclonable":[8],"function":[9],"(PUF)":[10],"using":[11],"enhancement-":[12],"enhancement":[13],"(EE)-structure":[14],"bit":[15,23,67,82,119,197,205],"cells":[16,24,68],"for":[17],"native":[18,81],"stability":[19],"improvement.":[20],"The":[21,172,195],"PUF":[22],"are":[25,29],"power-gated":[26],"2-D":[27,192],"and":[28,39,77,99,137,159,182],"normally":[30],"in":[31,60,90,150],"the":[32,108,114,128,151,156,183,191],"OFF":[33],"state,":[34],"which":[35,102],"largely":[36],"reduces":[37],"power":[38,185],"is":[40,58,94,103,179,186,199],"beneficial":[41],"to":[42,62,134,140,190],"attack":[43],"tolerance.":[44],"In":[45],"addition,":[46],"dark-bit":[48,161],"detection":[49],"technique":[50,144],"based":[51],"on":[52],"lightweight":[54],"integrated":[55],"VSS-bias":[56],"generator":[57],"implemented":[59],"order":[61],"screen":[63],"out":[64],"potentially":[65],"unstable":[66,148],"(dark":[69],"bits)":[70],"induced":[71],"by":[72],"supply":[73],"voltage/temperature":[74],"(VT)":[75],"variations":[76],"other":[78],"factors.":[79],"Measured":[80],"error":[83,120],"rate":[84],"(BER)":[85],"of":[86,208],"prototype":[87],"chips":[88],"fabricated":[89],"130-nm":[91],"standard":[92],"CMOS":[93],"0.21%":[95],"at":[96,127,176],"0.8":[97,133,177],"V":[98,136,178],"23":[100],"\u00b0C,":[101],"14\u00d7":[104],"better":[105],"compared":[106],"with":[107,202],"conventional":[109],"PUF.":[111],"After":[112],"masking":[113,162],"detected":[115],"dark":[116],"bits,":[117],"no":[118],"(3339":[121],"bits":[122,149],"\u00d7":[123],"500":[124],"evaluations)":[125],"appeared":[126],"worst":[129],"VT":[130],"corner":[131],"across":[132],"1.4":[135],"-40":[138],"\u00b0C":[139],"120":[141],"\u00b0C.":[142],"also":[145],"eliminated":[146],"all":[147,165],"accelerated":[152],"aging":[153],"test.":[154],"Both":[155],"data":[157],"before":[158],"after":[160],"have":[163],"passed":[164],"applicable":[166],"NIST":[167],"SP":[168],"800-22":[169],"randomness":[170],"tests.":[171],"measured":[173],"operational":[174],"energy":[175],"128":[180],"fJ/bit":[181],"standby":[184],"0.44":[187],"pW/bit,":[188],"thanks":[189],"power-gating":[193],"scheme.":[194],"nMOS-only":[196],"cell":[198,206],"compact,":[201],"normalized":[204],"area":[207],"373":[209],"F":[210],"<sup":[211],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[212],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[213],".":[214]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":19},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}