{"id":"https://openalex.org/W2990976435","doi":"https://doi.org/10.1109/jssc.2019.2952855","title":"A 1770-$\\mu$ m2 Leakage-Based Digital Temperature Sensor With Supply Sensitivity Suppression in 55-nm CMOS","display_name":"A 1770-$\\mu$ m2 Leakage-Based Digital Temperature Sensor With Supply Sensitivity Suppression in 55-nm CMOS","publication_year":2019,"publication_date":"2019-11-26","ids":{"openalex":"https://openalex.org/W2990976435","doi":"https://doi.org/10.1109/jssc.2019.2952855","mag":"2990976435"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2952855","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2952855","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001748763","display_name":"Zhong Tang","orcid":"https://orcid.org/0000-0003-3655-0912"},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhong Tang","raw_affiliation_strings":["Institute of VLSI Design, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-3655-0912","affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008526223","display_name":"Yun Fang","orcid":"https://orcid.org/0000-0001-9217-8858"},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yun Fang","raw_affiliation_strings":["Institute of VLSI Design, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9217-8858","affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100775131","display_name":"Zheng Shi","orcid":"https://orcid.org/0000-0003-4952-9389"},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Shi","raw_affiliation_strings":["Institute of VLSI Design, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074291976","display_name":"Xiaopeng Yu","orcid":"https://orcid.org/0000-0002-4531-6645"},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao-Peng Yu","raw_affiliation_strings":["Institute of VLSI Design, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-4531-6645","affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104318593","display_name":"Nick Nianxiong Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nick Nianxiong Tan","raw_affiliation_strings":["Institute of VLSI Design, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114910588","display_name":"Weiwei Pan","orcid":"https://orcid.org/0000-0001-8323-861X"},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiwei Pan","raw_affiliation_strings":["Institute of VLSI Design, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2045,"currency":"USD","value_usd":2045},"apc_paid":null,"fwci":1.6849,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.83054799,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"55","issue":"3","first_page":"781","last_page":"793"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.8736194372177124},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.789103627204895},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7034947276115417},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.663177490234375},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.5796657800674438},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5704299211502075},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49442124366760254},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47495317459106445},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4730207920074463},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4135902523994446},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4127753973007202},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3617989122867584},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3410390019416809},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.33354878425598145},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.27994999289512634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20872589945793152},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.19269925355911255}],"concepts":[{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.8736194372177124},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.789103627204895},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7034947276115417},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.663177490234375},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.5796657800674438},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5704299211502075},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49442124366760254},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47495317459106445},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4730207920074463},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4135902523994446},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4127753973007202},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3617989122867584},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3410390019416809},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.33354878425598145},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.27994999289512634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20872589945793152},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.19269925355911255},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2952855","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2952855","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3246600761","display_name":null,"funder_award_id":"U1709221","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3550908568","display_name":null,"funder_award_id":"61574125","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1932208055","https://openalex.org/W1966656109","https://openalex.org/W2055944305","https://openalex.org/W2060572274","https://openalex.org/W2064189791","https://openalex.org/W2067558307","https://openalex.org/W2074293309","https://openalex.org/W2110134128","https://openalex.org/W2118372864","https://openalex.org/W2125892790","https://openalex.org/W2131862714","https://openalex.org/W2136600361","https://openalex.org/W2242934213","https://openalex.org/W2518173922","https://openalex.org/W2566998670","https://openalex.org/W2581188453","https://openalex.org/W2583045991","https://openalex.org/W2594304245","https://openalex.org/W2777758997","https://openalex.org/W2794038749","https://openalex.org/W2899434022","https://openalex.org/W4247586331"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W1811213809","https://openalex.org/W2745127909","https://openalex.org/W2537099411","https://openalex.org/W3104408177","https://openalex.org/W2947980285"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,20,31,60,65,77,87],"leakage-based":[4,54],"digital":[5,69,73],"temperature":[6,38,74],"sensor":[7,75,118],"with":[8,19,36,95],"reduced":[9],"supply":[10,22,88,97],"sensitivity":[11,23],"for":[12],"on-chip":[13],"thermal":[14],"management.":[15],"The":[16],"sensor,":[17],"featured":[18],"novel":[21],"suppression":[24],"mechanism,":[25],"performs":[26],"the":[27,42,71,96,117],"temperature-to-frequency":[28],"conversion":[29],"by":[30],"leakage-dominated":[32],"ring":[33],"oscillator":[34],"(LDRO)":[35],"exponential":[37],"dependence.":[39],"Thanks":[40],"to":[41,92,129],"proposed":[43,72],"robust":[44],"and":[45,52,102],"reconfigurable":[46],"Schmitt-trigger-based":[47],"delay":[48],"cell,":[49],"both":[50],"NMOS":[51],"PMOS":[53],"sensors":[55],"can":[56,84],"be":[57],"evaluated":[58],"in":[59,64,105],"single":[61],"design.":[62],"Fabricated":[63],"standard":[66],"55-nm":[67],"CMOS":[68],"process,":[70],"occupies":[76],"silicon":[78],"area":[79],"of":[80,99,122],"only":[81],"1770":[82],"\u03bcm2and":[83],"operate":[85],"under":[86],"ranging":[89],"from":[90,126],"0.8":[91],"1.3":[93],"V,":[94],"sensitivities":[98],"2.53-5.22":[100],"\u00b0C/V":[101,104],"2.84-5.76":[103],"two":[106],"working":[107],"modes":[108],"at":[109],"room":[110],"temperature,":[111],"respectively.":[112],"Measurement":[113],"results":[114],"show":[115],"that":[116],"achieves":[119],"an":[120],"inaccuracy":[121],"\u00b10.70":[123],"\u00b0C":[124,128,131],"(3\u03c3)":[125],"-40":[127],"125":[130],"after":[132],"two-point":[133],"calibration.":[134]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":18},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":5}],"updated_date":"2026-09-01T08:31:24.195828","created_date":"2025-10-10T00:00:00"}