{"id":"https://openalex.org/W2991529885","doi":"https://doi.org/10.1109/jssc.2019.2952837","title":"A Feedforward Noise Reduction Technique in Capacitive MEMS Accelerometer Analog Front-End for Ultra-Low-Power IoT Applications","display_name":"A Feedforward Noise Reduction Technique in Capacitive MEMS Accelerometer Analog Front-End for Ultra-Low-Power IoT Applications","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2991529885","doi":"https://doi.org/10.1109/jssc.2019.2952837","mag":"2991529885"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2952837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2952837","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078390222","display_name":"Ippei Akita","orcid":"https://orcid.org/0000-0003-1451-9287"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ippei Akita","raw_affiliation_strings":["Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0003-1451-9287","affiliations":[{"raw_affiliation_string":"Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060200917","display_name":"Takayuki Okazawa","orcid":"https://orcid.org/0000-0001-5739-7115"},"institutions":[{"id":"https://openalex.org/I1295929820","display_name":"Yamaha (Japan)","ror":"https://ror.org/05s7fvh27","country_code":"JP","type":"company","lineage":["https://openalex.org/I1295929820"]},{"id":"https://openalex.org/I136259955","display_name":"Toyohashi University of Technology","ror":"https://ror.org/04ezg6d83","country_code":"JP","type":"education","lineage":["https://openalex.org/I136259955"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Okazawa","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Toyohashi University of Technology, Toyohashi, Japan","Yamaha Corporation, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Toyohashi University of Technology, Toyohashi, Japan","institution_ids":["https://openalex.org/I136259955"]},{"raw_affiliation_string":"Yamaha Corporation, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1295929820"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043680060","display_name":"Yoshihiko Kurui","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshihiko Kurui","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103087907","display_name":"Akira Fujimoto","orcid":"https://orcid.org/0000-0002-2894-9336"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Fujimoto","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085780525","display_name":"Takashi Asano","orcid":"https://orcid.org/0000-0002-5472-5723"},"institutions":[{"id":"https://openalex.org/I136259955","display_name":"Toyohashi University of Technology","ror":"https://ror.org/04ezg6d83","country_code":"JP","type":"education","lineage":["https://openalex.org/I136259955"]},{"id":"https://openalex.org/I4210154963","display_name":"Lintec Corporation (Japan)","ror":"https://ror.org/04qrdn471","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210154963"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Asano","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Toyohashi University of Technology, Toyohashi, Japan","Meitec Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Toyohashi University of Technology, Toyohashi, Japan","institution_ids":["https://openalex.org/I136259955"]},{"raw_affiliation_string":"Meitec Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4210154963"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2045,"currency":"USD","value_usd":2045},"apc_paid":null,"fwci":1.517,"has_fulltext":false,"cited_by_count":41,"citation_normalized_percentile":{"value":0.81112912,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6017953753471375},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5639028549194336},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5069689750671387},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5048752427101135},{"id":"https://openalex.org/keywords/accelerometer","display_name":"Accelerometer","score":0.4605298340320587},{"id":"https://openalex.org/keywords/feed-forward","display_name":"Feed forward","score":0.4601176083087921},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.44755059480667114},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.43126699328422546},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.42843422293663025},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.42238086462020874},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.416837215423584},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38421064615249634},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3830704987049103},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.34295225143432617},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3026733994483948},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.2581939101219177},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.1814870834350586},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09579133987426758}],"concepts":[{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6017953753471375},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5639028549194336},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5069689750671387},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5048752427101135},{"id":"https://openalex.org/C89805583","wikidata":"https://www.wikidata.org/wiki/Q192940","display_name":"Accelerometer","level":2,"score":0.4605298340320587},{"id":"https://openalex.org/C38858127","wikidata":"https://www.wikidata.org/wiki/Q5441228","display_name":"Feed forward","level":2,"score":0.4601176083087921},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.44755059480667114},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.43126699328422546},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.42843422293663025},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.42238086462020874},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.416837215423584},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38421064615249634},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3830704987049103},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.34295225143432617},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3026733994483948},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.2581939101219177},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.1814870834350586},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09579133987426758},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2952837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2952837","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9100000262260437,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321680","display_name":"New Energy and Industrial Technology Development Organization","ror":"https://ror.org/0055k7a87"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1481329008","https://openalex.org/W1592506358","https://openalex.org/W1991534425","https://openalex.org/W2019663817","https://openalex.org/W2027808471","https://openalex.org/W2040650521","https://openalex.org/W2049282754","https://openalex.org/W2092984849","https://openalex.org/W2096953285","https://openalex.org/W2100484040","https://openalex.org/W2101004723","https://openalex.org/W2103198996","https://openalex.org/W2104267440","https://openalex.org/W2112611349","https://openalex.org/W2138918281","https://openalex.org/W2144637390","https://openalex.org/W2145154079","https://openalex.org/W2151940289","https://openalex.org/W2539425032","https://openalex.org/W2580752875","https://openalex.org/W2612611411","https://openalex.org/W2739517552","https://openalex.org/W2757817063","https://openalex.org/W2768339954","https://openalex.org/W2784133938","https://openalex.org/W2790257945","https://openalex.org/W2791858066","https://openalex.org/W2793992764","https://openalex.org/W2809328549","https://openalex.org/W2884068903","https://openalex.org/W2898958349","https://openalex.org/W4239309307"],"related_works":["https://openalex.org/W2286391053","https://openalex.org/W2982600058","https://openalex.org/W1963486701","https://openalex.org/W2312483540","https://openalex.org/W191745111","https://openalex.org/W1522083559","https://openalex.org/W2007570603","https://openalex.org/W3102847316","https://openalex.org/W2773679836","https://openalex.org/W2729765224"],"abstract_inverted_index":{"An":[0],"ultra-low-power":[1],"(ULP)":[2],"capacitive":[3],"microelectromechanical":[4],"systems":[5],"(MEMS)":[6],"accelerometer":[7],"analog":[8],"front-end":[9],"(AFE)":[10],"chip":[11,116],"with":[12],"290-\u03bcg/\u221aHz":[13],"noise":[14,40,74],"floor":[15],"and":[16,69,100,111,126,134],"252-nW":[17],"power":[18,68,83],"consumption":[19],"is":[20,53,117],"presented.":[21],"To":[22],"achieve":[23],"such":[24],"low-noise":[25],"characteristics":[26],"under":[27],"ULP":[28],"operation,":[29],"the":[30,48,58,73,135],"proposed":[31],"AFE":[32,115],"utilizes":[33],"a":[34,54,93,102,120,128],"novel":[35],"circuitry":[36],"scheme,":[37],"namely,":[38],"feedforward":[39],"reduction":[41],"technique":[42,99],"(FNRT),":[43],"which":[44],"cancels":[45],"some":[46],"of":[47,57,131,138],"correlated":[49],"noise.":[50],"The":[51,85,114],"FNRT":[52],"simple":[55,94],"modification":[56],"conventional":[59],"self-balancing":[60],"bridge":[61],"(SBB)":[62],"architecture":[63],"without":[64],"using":[65],"any":[66],"extra":[67],"it":[70],"can":[71],"relax":[72],"requirement":[75],"on":[76],"amplifiers":[77],"in":[78,119],"AFE,":[79],"thereby":[80],"reducing":[81],"its":[82],"consumption.":[84],"designed":[86],"system":[87],"uses":[88],"an":[89],"SAR":[90],"ADC":[91],"employing":[92],"signal-to-noise":[95],"ratio":[96],"(SNR)":[97],"enhancement":[98],"includes":[101],"finite":[103],"state":[104],"machine":[105],"(FSM)":[106],"to":[107],"enable":[108],"dynamic":[109,129],"configuration":[110],"duty-cycling":[112],"operation.":[113],"implemented":[118],"0.18-\u03bcm":[121],"complementary":[122],"metal-oxide-semiconductor":[123],"(CMOS)":[124],"process":[125],"achieves":[127],"range":[130],"65":[132],"dB":[133],"bias":[136],"instability":[137],"62.8":[139],"\u03bcg.":[140]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":4}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}