{"id":"https://openalex.org/W2985307378","doi":"https://doi.org/10.1109/jssc.2019.2951415","title":"A Physical Unclonable Function With Bit Error Rate < 2.3 $\\times$ 10\u22128 Based on Contact Formation Probability Without Error Correction Code","display_name":"A Physical Unclonable Function With Bit Error Rate < 2.3 $\\times$ 10\u22128 Based on Contact Formation Probability Without Error Correction Code","publication_year":2019,"publication_date":"2019-11-14","ids":{"openalex":"https://openalex.org/W2985307378","doi":"https://doi.org/10.1109/jssc.2019.2951415","mag":"2985307378"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2951415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2951415","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073403065","display_name":"Duhyun Jeon","orcid":"https://orcid.org/0000-0003-1305-3462"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Duhyun Jeon","raw_affiliation_strings":["Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1305-3462","affiliations":[{"raw_affiliation_string":"Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044953695","display_name":"Jong Hak Baek","orcid":"https://orcid.org/0000-0003-0256-0696"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong Hak Baek","raw_affiliation_strings":["Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-0256-0696","affiliations":[{"raw_affiliation_string":"Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050127069","display_name":"Yong\u2010Duck Kim","orcid":"https://orcid.org/0000-0001-7080-5806"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Duck Kim","raw_affiliation_strings":["Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-7080-5806","affiliations":[{"raw_affiliation_string":"Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jaeseong Lee","orcid":"https://orcid.org/0000-0003-1490-3975"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeseong Lee","raw_affiliation_strings":["Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1490-3975","affiliations":[{"raw_affiliation_string":"Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061247388","display_name":"Dong Kyue Kim","orcid":"https://orcid.org/0000-0001-5614-0449"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong Kyue Kim","raw_affiliation_strings":["Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5614-0449","affiliations":[{"raw_affiliation_string":"Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075614027","display_name":"Byong\u2010Deok Choi","orcid":"https://orcid.org/0000-0002-9283-8243"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byong-Deok Choi","raw_affiliation_strings":["Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-9283-8243","affiliations":[{"raw_affiliation_string":"Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":{"value":2045,"currency":"USD","value_usd":2045},"apc_paid":null,"fwci":5.7311,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.96459759,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"55","issue":"3","first_page":"805","last_page":"816"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.7032896280288696},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5052681565284729},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.49802470207214355},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4972288906574249},{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.45620155334472656},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.42521175742149353},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4241543412208557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.397746741771698},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3903247117996216},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32073840498924255},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2606782913208008},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25478067994117737},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2336331009864807},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.14855152368545532},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11146259307861328}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.7032896280288696},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5052681565284729},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.49802470207214355},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4972288906574249},{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.45620155334472656},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.42521175742149353},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4241543412208557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.397746741771698},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3903247117996216},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32073840498924255},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2606782913208008},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25478067994117737},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2336331009864807},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.14855152368545532},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11146259307861328},{"id":"https://openalex.org/C204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2951415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2951415","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W25365497","https://openalex.org/W26080743","https://openalex.org/W42037993","https://openalex.org/W42545666","https://openalex.org/W156132949","https://openalex.org/W1517403092","https://openalex.org/W1583816927","https://openalex.org/W1597805936","https://openalex.org/W1991398325","https://openalex.org/W2001067488","https://openalex.org/W2011612927","https://openalex.org/W2013845336","https://openalex.org/W2044598644","https://openalex.org/W2061106457","https://openalex.org/W2067987747","https://openalex.org/W2104160351","https://openalex.org/W2107271224","https://openalex.org/W2116374153","https://openalex.org/W2120317475","https://openalex.org/W2130351941","https://openalex.org/W2150010995","https://openalex.org/W2151759197","https://openalex.org/W2157024459","https://openalex.org/W2169212403","https://openalex.org/W2290692811","https://openalex.org/W2295460135","https://openalex.org/W2421397265","https://openalex.org/W2502734849","https://openalex.org/W2548971394","https://openalex.org/W2579991392","https://openalex.org/W2580334840","https://openalex.org/W2791198567","https://openalex.org/W2890844360","https://openalex.org/W3103339143","https://openalex.org/W3150645827","https://openalex.org/W3151293064","https://openalex.org/W4253800576","https://openalex.org/W6601734997","https://openalex.org/W6601790426","https://openalex.org/W6606357357","https://openalex.org/W6634881901","https://openalex.org/W6635673271","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W2807901368","https://openalex.org/W2158491338","https://openalex.org/W2133733652","https://openalex.org/W2072658171","https://openalex.org/W2606392311","https://openalex.org/W4385956668","https://openalex.org/W2900895161","https://openalex.org/W4380838366","https://openalex.org/W2539884462","https://openalex.org/W4388510194"],"abstract_inverted_index":{"This":[0,154],"article":[1],"proposes":[2],"a":[3,28,50,60,139],"physical":[4],"unclonable":[5],"function":[6],"(PUF)":[7],"based":[8],"on":[9],"the":[10,18,22,25,31,37,41,44,64,68,103,115,130,147,160,188],"contact":[11,15,32,45,54,69,105,165],"formation":[12,46],"probability.":[13],"The":[14,100,134,163],"here":[16],"is":[17,33,71,107,136,167],"interconnect":[19],"layer":[20],"between":[21],"metal":[23],"and":[24,57,97,144,177,180,193],"silicon":[26],"in":[27,40,49,127,150],"chip.":[29],"As":[30],"designed":[34,137],"smaller":[35],"than":[36],"size":[38],"given":[39,186],"design":[42],"rule,":[43],"becomes":[47],"stochastic":[48],"certain":[51],"range":[52],"of":[53,102,129,191],"hole":[55],"sizes":[56],"can":[58],"be":[59,74],"random":[61],"source":[62],"for":[63],"PUF.":[65],"Consequently,":[66],"once":[67],"state":[70],"determined":[72],"to":[73,158],"either":[75],"open":[76],"or":[77],"short,":[78],"its":[79],"connectivity":[80],"does":[81],"not":[82],"change":[83],"over":[84],"time":[85],"under":[86],"noisy":[87],"environmental":[88],"conditions,":[89],"such":[90],"as":[91],"temperature,":[92],"supply":[93],"voltage,":[94],"humidity":[95],"variations,":[96],"so":[98],"on.":[99],"reliability":[101,111],"proposed":[104,164],"PUF":[106,166],"verified":[108],"through":[109],"seven":[110],"tests":[112,185],"defined":[113],"by":[114,187],"Joint":[116],"Electron":[117],"Device":[118],"Engineering":[119],"Council":[120],"(JEDEC)":[121],"standards.":[122],"No":[123],"bit":[124],"errors":[125],"occur":[126],"any":[128],"366":[131],"chips":[132],"tested.":[133],"bitcell":[135,161],"using":[138,169],"digital":[140],"standard":[141],"cell":[142],"structure":[143],"scattered":[145],"throughout":[146],"chip":[148],"embedded":[149],"other":[151],"logic":[152],"gates.":[153],"makes":[155],"it":[156],"difficult":[157],"find":[159],"position.":[162],"fabricated":[168],"0.13-\u03bcm":[170],"CMOS":[171],"technology.":[172],"It":[173],"achieves":[174],"49.99%":[175],"uniqueness":[176],"0.99973":[178],"entropy":[179],"passes":[181],"all":[182],"applicable":[183],"randomness":[184],"National":[189],"Institute":[190],"Standards":[192],"Technology":[194],"(NIST)":[195],"SP":[196],"800-22.":[197]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":12},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":3}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}