{"id":"https://openalex.org/W2976538372","doi":"https://doi.org/10.1109/jssc.2019.2938626","title":"A Calibration-Free Time-Interleaved Fourth-Order Noise-Shaping SAR ADC","display_name":"A Calibration-Free Time-Interleaved Fourth-Order Noise-Shaping SAR ADC","publication_year":2019,"publication_date":"2019-09-25","ids":{"openalex":"https://openalex.org/W2976538372","doi":"https://doi.org/10.1109/jssc.2019.2938626","mag":"2976538372"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2938626","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2938626","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022571725","display_name":"Lu Jie","orcid":"https://orcid.org/0000-0001-5046-3917"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lu Jie","raw_affiliation_strings":["Electrical Engineering and Computer Science (EECS) Department, University of Michigan, Ann Arbor, USA"],"raw_orcid":"https://orcid.org/0000-0001-5046-3917","affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science (EECS) Department, University of Michigan, Ann Arbor, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049317365","display_name":"Boyi Zheng","orcid":"https://orcid.org/0000-0002-0796-8124"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Boyi Zheng","raw_affiliation_strings":["Electrical Engineering and Computer Science (EECS) Department, University of Michigan, Ann Arbor, USA"],"raw_orcid":"https://orcid.org/0000-0002-0796-8124","affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science (EECS) Department, University of Michigan, Ann Arbor, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005810864","display_name":"Michael P. Flynn","orcid":"https://orcid.org/0000-0001-5070-7512"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael P. Flynn","raw_affiliation_strings":["Electrical Engineering and Computer Science (EECS) Department, University of Michigan, Ann Arbor, USA"],"raw_orcid":"https://orcid.org/0000-0001-5070-7512","affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science (EECS) Department, University of Michigan, Ann Arbor, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5022571725"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":1.8941,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.85040271,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"54","issue":"12","first_page":"3386","last_page":"3395"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.7746964693069458},{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.7035983800888062},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6410226225852966},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.6361270546913147},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5823015570640564},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.582012951374054},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5570995211601257},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.47190338373184204},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4255646765232086},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.35926997661590576},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.338021457195282},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23733869194984436},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1474912464618683},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11241239309310913}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.7746964693069458},{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.7035983800888062},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6410226225852966},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.6361270546913147},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5823015570640564},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.582012951374054},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5570995211601257},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.47190338373184204},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4255646765232086},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.35926997661590576},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.338021457195282},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23733869194984436},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1474912464618683},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11241239309310913}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2938626","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2938626","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1925977377","https://openalex.org/W1976807891","https://openalex.org/W1982133254","https://openalex.org/W2071087062","https://openalex.org/W2593067874","https://openalex.org/W2744970705","https://openalex.org/W2897458229","https://openalex.org/W2922215933","https://openalex.org/W2922361076","https://openalex.org/W6646082109","https://openalex.org/W6680559600","https://openalex.org/W6734037425"],"related_works":["https://openalex.org/W1546440511","https://openalex.org/W2141301039","https://openalex.org/W2278942241","https://openalex.org/W2082979872","https://openalex.org/W2368405386","https://openalex.org/W1977749038","https://openalex.org/W1641489184","https://openalex.org/W3004044036","https://openalex.org/W2792167570","https://openalex.org/W2290076986"],"abstract_inverted_index":{"Noise-shaping":[0],"SAR":[1],"(NS-SAR)":[2],"is":[3,63,91,114],"an":[4],"emerging":[5],"analog":[6],"to":[7,46,65,107],"digital":[8],"converter":[9],"(ADC)":[10],"architecture":[11,38,104],"that":[12,39],"offers":[13],"both":[14],"high-resolution":[15],"and":[16,35,73,97,144,156,160],"high-energy":[17],"efficiency.":[18],"Despite":[19],"these":[20],"advantages,":[21],"oversampling":[22],"limits":[23],"the":[24,76,80,103,108,112],"useful":[25],"bandwidth":[26,42],"of":[27,75,82,132,153],"NS-SAR":[28],"ADCs.":[29],"This":[30],"article":[31],"introduces":[32],"a":[33,52,67,94,98,118,129,136],"robust":[34,86,164],"practical":[36],"interleaving":[37],"overcomes":[40],"this":[41],"limitation.":[43],"Midway":[44],"feedback":[45,89,100],"multiple":[47],"successive-approximation":[48],"conversion":[49],"phases":[50],"enables":[51],"realizable":[53],"time-interleaved":[54],"noise-shaped":[55],"(TINS)":[56],"system.":[57],"The":[58],"inherent":[59],"delay":[60],"between":[61],"channels":[62],"harnessed":[64],"generate":[66],"high-order":[68],"noise-transfer":[69],"function":[70],"(NTF).":[71],"Redundancy":[72],"optimization":[74],"NTF":[77],"coefficients":[78],"eliminate":[79],"risk":[81],"quantization":[83],"overload,":[84],"ensuring":[85],"operation.":[87],"Error":[88],"(EF)":[90],"realized":[92],"with":[93],"summing":[95],"pre-amplifier":[96,113],"shared":[99],"bus,":[101],"keeping":[102],"simple.":[105],"Thanks":[106],"low":[109],"required":[110],"gain,":[111],"simply":[115],"implemented":[116],"as":[117],"single-stage":[119],"open-loop":[120],"amplifier.":[121],"A":[122],"prototype":[123],"40-nm":[124],"CMOS":[125],"TINS-SAR":[126],"ADC":[127],"has":[128],"measured":[130],"SNDR":[131],"70.4":[133],"dB":[134],"for":[135],"50-MHz":[137],"bandwidth.":[138],"It":[139],"consumes":[140],"only":[141],"13":[142],"mW":[143],"occupies":[145],"0.06":[146],"mm":[147],"<sup":[148],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[149],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[150],".":[151],"Testing":[152],"several":[154],"devices":[155],"evaluation":[157],"over":[158],"temperature":[159],"supply":[161],"variations":[162],"demonstrate":[163],"performance":[165],"without":[166],"calibration.":[167]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}