{"id":"https://openalex.org/W2972420192","doi":"https://doi.org/10.1109/jssc.2019.2936967","title":"A 265-$\\mu$ W Fractional-${N}$ Digital PLL With Seamless Automatic Switching Sub-Sampling/Sampling Feedback Path and Duty-Cycled Frequency-Locked Loop in 65-nm CMOS","display_name":"A 265-$\\mu$ W Fractional-${N}$ Digital PLL With Seamless Automatic Switching Sub-Sampling/Sampling Feedback Path and Duty-Cycled Frequency-Locked Loop in 65-nm CMOS","publication_year":2019,"publication_date":"2019-09-12","ids":{"openalex":"https://openalex.org/W2972420192","doi":"https://doi.org/10.1109/jssc.2019.2936967","mag":"2972420192"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2936967","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2936967","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/jssc.2019.2936967","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100667049","display_name":"Hanli Liu","orcid":"https://orcid.org/0000-0002-0420-4284"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hanli Liu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-0420-4284","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028333708","display_name":"Atsushi Shirane","orcid":"https://orcid.org/0000-0001-8172-4323"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Shirane","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064086312","display_name":"Kenichi Okada","orcid":"https://orcid.org/0000-0002-1082-7672"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Okada","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-1082-7672","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070812527","display_name":"Zheng Sun","orcid":"https://orcid.org/0000-0002-5671-936X"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zheng Sun","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081527973","display_name":"H\u00f3ngy\u00e8 Hu\u00e1ng","orcid":"https://orcid.org/0000-0001-6071-2075"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hongye Huang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0001-6071-2075","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074494245","display_name":"Wei Deng","orcid":"https://orcid.org/0000-0002-6323-4539"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Deng","raw_affiliation_strings":["Department of Microelectronics and Nanoelectronics, Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6323-4539","affiliations":[{"raw_affiliation_string":"Department of Microelectronics and Nanoelectronics, Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050565374","display_name":"Teerachot Siriburanon","orcid":"https://orcid.org/0000-0003-1658-9596"},"institutions":[{"id":"https://openalex.org/I100930933","display_name":"University College Dublin","ror":"https://ror.org/05m7pjf47","country_code":"IE","type":"education","lineage":["https://openalex.org/I100930933"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"Teerachot Siriburanon","raw_affiliation_strings":["School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland"],"raw_orcid":"https://orcid.org/0000-0003-1658-9596","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland","institution_ids":["https://openalex.org/I100930933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085361118","display_name":"Jian Pang","orcid":"https://orcid.org/0000-0002-6278-6294"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jian Pang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-6278-6294","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088122376","display_name":"Yun Wang","orcid":"https://orcid.org/0000-0001-7773-1619"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yun Wang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0001-7773-1619","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101672796","display_name":"Rui Wu","orcid":"https://orcid.org/0000-0001-7804-7691"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Wu","raw_affiliation_strings":["Institute of Electronics, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-7804-7691","affiliations":[{"raw_affiliation_string":"Institute of Electronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056585542","display_name":"T. Someya","orcid":"https://orcid.org/0000-0002-8506-1384"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Teruki Someya","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-8506-1384","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.0119,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.86749842,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"54","issue":"12","first_page":"3478","last_page":"3492"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dpll-algorithm","display_name":"DPLL algorithm","score":0.8610542416572571},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.8300377130508423},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.6814322471618652},{"id":"https://openalex.org/keywords/digitally-controlled-oscillator","display_name":"Digitally controlled oscillator","score":0.5973849296569824},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5298490524291992},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5083360075950623},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4940348267555237},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.4554878771305084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4213564991950989},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4007672369480133},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.31824052333831787},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23665818572044373},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.224398672580719},{"id":"https://openalex.org/keywords/delay-line-oscillator","display_name":"Delay line oscillator","score":0.17701423168182373},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11399781703948975},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08121189475059509}],"concepts":[{"id":"https://openalex.org/C143936061","wikidata":"https://www.wikidata.org/wiki/Q2030088","display_name":"DPLL algorithm","level":4,"score":0.8610542416572571},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.8300377130508423},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.6814322471618652},{"id":"https://openalex.org/C167872736","wikidata":"https://www.wikidata.org/wiki/Q5276224","display_name":"Digitally controlled oscillator","level":5,"score":0.5973849296569824},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5298490524291992},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5083360075950623},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4940348267555237},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.4554878771305084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4213564991950989},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4007672369480133},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.31824052333831787},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23665818572044373},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.224398672580719},{"id":"https://openalex.org/C26907483","wikidata":"https://www.wikidata.org/wiki/Q5253479","display_name":"Delay line oscillator","level":4,"score":0.17701423168182373},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11399781703948975},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08121189475059509},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2936967","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2936967","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/jssc.2019.2936967","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2936967","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1571758417","https://openalex.org/W1581211860","https://openalex.org/W1751319346","https://openalex.org/W1970939492","https://openalex.org/W1994184480","https://openalex.org/W2028941857","https://openalex.org/W2041777739","https://openalex.org/W2055978681","https://openalex.org/W2097406868","https://openalex.org/W2098907338","https://openalex.org/W2102596261","https://openalex.org/W2112006904","https://openalex.org/W2120174253","https://openalex.org/W2120500930","https://openalex.org/W2131053965","https://openalex.org/W2142610168","https://openalex.org/W2158552598","https://openalex.org/W2342426112","https://openalex.org/W2346049708","https://openalex.org/W2468148494","https://openalex.org/W2559073178","https://openalex.org/W2590315573","https://openalex.org/W2758621295","https://openalex.org/W2789248965","https://openalex.org/W2791379208","https://openalex.org/W2802479922","https://openalex.org/W2810207282","https://openalex.org/W2811068495","https://openalex.org/W2897883690","https://openalex.org/W2900718938","https://openalex.org/W2901368319","https://openalex.org/W2911541304","https://openalex.org/W2921046765","https://openalex.org/W2921886179","https://openalex.org/W3142120744","https://openalex.org/W6677968051","https://openalex.org/W6748453687","https://openalex.org/W6748963127"],"related_works":["https://openalex.org/W1488060887","https://openalex.org/W2380467267","https://openalex.org/W1980525453","https://openalex.org/W2325206724","https://openalex.org/W2043945969","https://openalex.org/W4390099038","https://openalex.org/W2059960378","https://openalex.org/W4311222988","https://openalex.org/W4312667005","https://openalex.org/W2170314462"],"abstract_inverted_index":{"This":[0],"article":[1],"proposes":[2],"a":[3,11,84,170,181],"fractional-N":[4,155],"digital":[5],"phase-locked":[6,33],"loop":[7,87],"(DPLL)":[8],"that":[9,45],"achieves":[10,95],"265-\u03bcW":[12],"ultra-lowpower":[13],"operation.":[14],"The":[15,153],"proposed":[16,121,143,154],"switching":[17,93],"feedback":[18,94],"can":[19],"seamlessly":[20],"change":[21],"the":[22,32,36,40,48,57,64,72,76,90,92,105,124,129,134,146],"DPLL":[23,37,156],"from":[24],"sampling":[25],"operation":[26,29],"to":[27,38,52,70,122,132,144,180],"sub-sampling":[28,106],"without":[30],"disturbing":[31],"state":[34],"of":[35,42,60,75,166,175,183,186],"reduce":[39,71],"number":[41,59],"building":[43],"blocks":[44],"works":[46],"at":[47,101],"oscillator":[49,119],"frequency,":[50],"leading":[51],"significant":[53],"power":[54,73,125,147],"reduction.":[55],"With":[56],"reduced":[58],"high-frequency":[61],"circuits,":[62],"scaling":[63],"reference":[65],"frequency":[66,97,113],"is":[67,120,142],"fully":[68],"used":[69],"consumption":[74,126],"DPLL.":[77],"Together":[78],"with":[79],"an":[80,163],"out-of-dead-zone":[81],"detector":[82],"and":[83,98,103,112,169],"duty-cycled":[85],"frequency-locked":[86],"running":[88],"in":[89],"background,":[91],"robust":[96],"phase":[99,111],"acquisition":[100],"start-up":[102],"helps":[104],"PLL":[107],"recover":[108],"when":[109],"large":[110],"disturbances":[114],"occur.":[115],"A":[116,137],"transformer-based":[117],"stacked-gm":[118],"minimize":[123],"while":[127,149,161],"providing":[128],"sufficient":[130],"swing":[131],"drive":[133],"subsequent":[135],"stages.":[136],"truncated":[138],"constant-slope":[139],"digital-to-time":[140],"converter":[141],"improve":[145],"efficiency":[148],"retaining":[150],"good":[151],"linearity.":[152],"consumes":[157],"only":[158],"265":[159],"\u03bcW":[160],"achieving":[162],"integrated":[164],"jitter":[165],"2.8":[167],"ps":[168],"worst":[171],"case":[172],"fractional":[173],"spur":[174],"-52":[176],"dBc,":[177],"which":[178],"corresponds":[179],"figure":[182],"merit":[184],"(FOM)":[185],"-237":[187],"dB.":[188]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":5}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}