{"id":"https://openalex.org/W2963976731","doi":"https://doi.org/10.1109/jssc.2019.2926648","title":"A 9.1-ENOB 6-mW 10-Bit 500-MS/s Pipelined-SAR ADC With Current-Mode Residue Processing in 28-nm CMOS","display_name":"A 9.1-ENOB 6-mW 10-Bit 500-MS/s Pipelined-SAR ADC With Current-Mode Residue Processing in 28-nm CMOS","publication_year":2019,"publication_date":"2019-07-23","ids":{"openalex":"https://openalex.org/W2963976731","doi":"https://doi.org/10.1109/jssc.2019.2926648","mag":"2963976731"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2926648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2926648","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017446883","display_name":"Kyoung-Jun Moon","orcid":"https://orcid.org/0000-0002-2786-7865"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Kyoung-Jun Moon","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2786-7865","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000082031","display_name":"Dong\u2010Shin Jo","orcid":"https://orcid.org/0000-0002-1505-6168"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Shin Jo","raw_affiliation_strings":["SK Hynix, Icheon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1505-6168","affiliations":[{"raw_affiliation_string":"SK Hynix, Icheon, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089896333","display_name":"Wan Kim","orcid":"https://orcid.org/0000-0002-2505-4481"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wan Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102172743","display_name":"Michael Choi","orcid":"https://orcid.org/0009-0005-1210-3466"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Michael Choi","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110512444","display_name":"Hyung-Jong Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung-Jong Ko","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054097644","display_name":"Seung\u2010Tak Ryu","orcid":"https://orcid.org/0000-0002-6947-7785"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Tak Ryu","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6947-7785","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5017446883"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":1.1963,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.77205491,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"54","issue":"9","first_page":"2532","last_page":"2542"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.9142199754714966},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.8388746380805969},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6964496374130249},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.577373206615448},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.51567542552948},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.4803158640861511},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43279483914375305},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4270809590816498},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.41754817962646484},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4164992570877075},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41313907504081726},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3625505864620209},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33614909648895264},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2092256247997284},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19630372524261475}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.9142199754714966},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.8388746380805969},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6964496374130249},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.577373206615448},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.51567542552948},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.4803158640861511},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43279483914375305},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4270809590816498},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.41754817962646484},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4164992570877075},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41313907504081726},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3625505864620209},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33614909648895264},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2092256247997284},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19630372524261475}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2926648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2926648","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1967180561","https://openalex.org/W1986817445","https://openalex.org/W1988045322","https://openalex.org/W2019274525","https://openalex.org/W2062972648","https://openalex.org/W2063165946","https://openalex.org/W2106117210","https://openalex.org/W2126860636","https://openalex.org/W2131585911","https://openalex.org/W2138536318","https://openalex.org/W2144216554","https://openalex.org/W2152789742","https://openalex.org/W2161982945","https://openalex.org/W2417486445","https://openalex.org/W2417627908","https://openalex.org/W2469737602","https://openalex.org/W2592515961","https://openalex.org/W2594167987","https://openalex.org/W2742639921","https://openalex.org/W2749655596","https://openalex.org/W2898857372","https://openalex.org/W2903551423","https://openalex.org/W6679454727","https://openalex.org/W6734084249","https://openalex.org/W6734567846","https://openalex.org/W6742234556"],"related_works":["https://openalex.org/W3216962587","https://openalex.org/W2010414704","https://openalex.org/W2138923007","https://openalex.org/W2799308884","https://openalex.org/W2564593953","https://openalex.org/W3119822033","https://openalex.org/W2070631620","https://openalex.org/W1967132996","https://openalex.org/W39727502","https://openalex.org/W4290714559"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3,9,22,38,46,54,65,69,77,82,92,97,104],"current-mode":[4],"residue":[5,44],"processing":[6],"technique":[7],"in":[8,81,96],"pipelined-successive-approximation":[10],"register":[11],"(SAR)":[12],"analog-to-digital":[13],"converter":[14,58],"(ADC),":[15],"which":[16],"extends":[17],"the":[18],"operation":[19],"speed":[20],"of":[21,100,103],"single-channel":[23],"ADC":[24,31,79],"utilizing":[25],"low-impedance-based":[26],"signaling.":[27],"A":[28],"10-bit":[29],"pipelined-SAR":[30],"with":[32],"featured":[33],"building":[34],"blocks":[35],"such":[36],"as":[37,41],"degenerated":[39],"gm-cell":[40],"an":[42],"open-loop":[43],"amplifier,":[45],"switched-current":[47],"mirror":[48],"for":[49,60],"sample-and-hold":[50],"(S/H)":[51],"function,":[52],"and":[53],"split":[55],"current":[56],"digital-to-analog":[57],"(DAC)":[59],"current-domain":[61],"SAR":[62],"conversion":[63],"achieves":[64,86],"500-MS/s":[66],"conversion-rate":[67],"under":[68],"1.0-V":[70],"supply.":[71],"With":[72],"background":[73],"inter-stage":[74],"mismatch":[75],"calibration,":[76],"prototype":[78],"fabricated":[80],"28-nm":[83],"CMOS":[84],"process":[85],"56.6-dB":[87],"signal-to-noise-and-distortion":[88],"ratio":[89],"(SNDR)":[90],"at":[91],"Nyquist":[93],"input,":[94],"resulting":[95],"Walden":[98],"figure":[99],"merit":[101],"(FoM)":[102],"21.7-fJ/conversion-step.":[105]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}