{"id":"https://openalex.org/W2953880456","doi":"https://doi.org/10.1109/jssc.2019.2921697","title":"Single-Chip 3072-Element-Channel Transceiver/128-Subarray-Channel 2-D Array IC With Analog RX and All-Digital TX Beamformer for Echocardiography","display_name":"Single-Chip 3072-Element-Channel Transceiver/128-Subarray-Channel 2-D Array IC With Analog RX and All-Digital TX Beamformer for Echocardiography","publication_year":2019,"publication_date":"2019-06-27","ids":{"openalex":"https://openalex.org/W2953880456","doi":"https://doi.org/10.1109/jssc.2019.2921697","mag":"2953880456"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2921697","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2921697","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010333469","display_name":"Yutaka Igarashi","orcid":"https://orcid.org/0000-0002-4123-2508"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yutaka Igarashi","raw_affiliation_strings":["Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan"],"raw_orcid":"https://orcid.org/0000-0002-4123-2508","affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017273263","display_name":"Shinya Kajiyama","orcid":"https://orcid.org/0000-0003-2237-5164"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinya Kajiyama","raw_affiliation_strings":["Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052574403","display_name":"Yusaku Katsube","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yusaku Katsube","raw_affiliation_strings":["Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101856336","display_name":"Takuma Nishimoto","orcid":"https://orcid.org/0000-0002-1224-8711"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuma Nishimoto","raw_affiliation_strings":["Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081525596","display_name":"Tatsuo Nakagawa","orcid":"https://orcid.org/0000-0002-8461-0564"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuo Nakagawa","raw_affiliation_strings":["Center for Technology Innovation \u2013 Healthcare, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Healthcare, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009979619","display_name":"Yasuyuki Okuma","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuyuki Okuma","raw_affiliation_strings":["Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100989462","display_name":"Yohei Nakamura","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohei Nakamura","raw_affiliation_strings":["Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112314472","display_name":"Takahide Terada","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahide Terada","raw_affiliation_strings":["Center for Technology Innovation \u2013 Healthcare, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Healthcare, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064295075","display_name":"Taizo Yamawaki","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taizo Yamawaki","raw_affiliation_strings":["Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Electronics, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054689047","display_name":"Toru Yazaki","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toru Yazaki","raw_affiliation_strings":["Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Production Engineering, Research and Development Group, Hitachi, Ltd., Yokohama, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084117432","display_name":"Y. Hayashi","orcid":"https://orcid.org/0000-0002-2060-1351"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshihiro Hayashi","raw_affiliation_strings":["Diagnostic R&D Division, Healthcare Business Unit, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Diagnostic R&D Division, Healthcare Business Unit, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051880118","display_name":"Kazuhiro Amino","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuhiro Amino","raw_affiliation_strings":["Diagnostic R&D Division, Healthcare Business Unit, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Diagnostic R&D Division, Healthcare Business Unit, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101023174","display_name":"Takuya Kaneko","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya Kaneko","raw_affiliation_strings":["Diagnostic R&D Division, Healthcare Business Unit, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Diagnostic R&D Division, Healthcare Business Unit, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075497120","display_name":"Hiroki Tanaka","orcid":"https://orcid.org/0000-0002-6195-3177"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroki Tanaka","raw_affiliation_strings":["Center for Technology Innovation \u2013 Healthcare, Research and Development Group, Hitachi, Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Technology Innovation \u2013 Healthcare, Research and Development Group, Hitachi, Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5010333469"],"corresponding_institution_ids":["https://openalex.org/I65143321"],"apc_list":null,"apc_paid":null,"fwci":4.1134,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.94142237,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"54","issue":"9","first_page":"2555","last_page":"2567"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10727","display_name":"Ultrasound Imaging and Elastography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10727","display_name":"Ultrasound Imaging and Elastography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11249","display_name":"Wireless Power Transfer Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.6698369979858398},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5501219034194946},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5253997445106506},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5172720551490784},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3848588764667511},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3460302948951721},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3343238830566406}],"concepts":[{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.6698369979858398},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5501219034194946},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5253997445106506},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5172720551490784},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3848588764667511},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3460302948951721},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3343238830566406}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2921697","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2921697","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7599999904632568,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1874803653","https://openalex.org/W2010052188","https://openalex.org/W2024179924","https://openalex.org/W2055570207","https://openalex.org/W2093859945","https://openalex.org/W2139773618","https://openalex.org/W2151226467","https://openalex.org/W2153000091","https://openalex.org/W2290399308","https://openalex.org/W2525204324","https://openalex.org/W2562121608","https://openalex.org/W2569264893","https://openalex.org/W2592721671","https://openalex.org/W2793184832","https://openalex.org/W6682077983","https://openalex.org/W6731761538","https://openalex.org/W6734190837"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4249165909","https://openalex.org/W2783437851","https://openalex.org/W2136659592","https://openalex.org/W2115569193","https://openalex.org/W1993470621","https://openalex.org/W2161127017","https://openalex.org/W3116108134","https://openalex.org/W2109445684","https://openalex.org/W2135814299"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,33,85,157,175,188,198],"single-chip":[4],"3072-elementchannel":[5],"(ECh)":[6],"transceiver/128-subarray-channel":[7],"(SCh)":[8],"2-D":[9],"array":[10],"IC":[11,25,171],"with":[12,84,156,174,232],"analog":[13,138],"receiver":[14],"(RX)":[15],"and":[16,54,67,75,96,109,163,210],"all-digital":[17,81],"transmitter":[18],"(TX)":[19],"beamformer":[20,87],"for":[21,122],"echocardiography.":[22],"The":[23,112,127,169,214],"proposed":[24,170],"integrates":[26],"3072-ECh":[27],"transceivers":[28],"that":[29,89,119],"are":[30,120,146],"composed":[31],"of":[32],"low-power":[34],"tunable":[35],"amplitude":[36],"three-level":[37,116],"pulser":[38],"(TA3LP),":[39],"zero-power-TX-and-RXisolation":[40],"switch":[41],"(ZTRSW),":[42],"programmable":[43],"gain-and-inputimpedance":[44],"low-noise":[45,63],"amplifier":[46],"(PGZLNA),":[47],"bidirectional":[48],"dynamically":[49],"reconfigurable":[50],"switched-capacitor":[51],"delayer":[52],"(BDRSCD),":[53],"24-ECh-to-1-SCh":[55],"charge-domain":[56],"adder":[57],"(CDADD).":[58],"It":[59,78],"also":[60,225],"has":[61,79],"128-SCh":[62],"cable":[64,102],"buffers":[65],"(LNCBUFs)":[66],"all":[68],"the":[69,93,105,110,115,153,237],"related":[70],"peripheral":[71],"circuits,":[72],"including":[73],"control":[74],"interface":[76],"circuits.":[77],"an":[80,136,144,166],"TX":[82,132],"architecture":[83],"digital":[86,133],"(TX-DBF)":[88],"is":[90,172,218],"free":[91],"from":[92],"waveform":[94],"distortion":[95],"timing":[97],"error":[98],"caused":[99],"by":[100],"long":[101],"propagation":[103],"between":[104],"main":[106],"instrument":[107],"unit":[108],"IC.":[111],"TA3LP":[113],"launches":[114],"bipolar":[117],"signals":[118,134,142],"necessary":[121],"tissue":[123],"harmonic":[124],"imaging":[125],"(THI).":[126],"BDR-SCD":[128],"can":[129],"delay":[130],"2-bit":[131],"or":[135],"RX":[137,141],"signal;":[139],"24":[140],"in":[143,152,236],"SCh":[145,167],"coherently":[147],"delayed":[148],"using":[149],"BDR-SCDs,":[150],"summed":[151],"charge":[154],"domain":[155],"CDADD":[158],"without":[159],"signal":[160],"headroom":[161],"concerns,":[162],"converted":[164],"into":[165],"signal.":[168],"fabricated":[173],"0.18-\u03bcm":[176],"high-voltage":[177],"silicon-on-insulator":[178],"(HV":[179],"SOI)":[180],"CMOS":[181],"process.":[182],"Each":[183],"ECh":[184],"transceiver":[185],"occupies":[186],"only":[187],"300":[189,192],"\u03bcm":[190,193],"\u00d7":[191],"silicon":[194],"area":[195],"while":[196],"having":[197],"greater":[199],"than":[200],"85-dB":[201],"dynamic":[202],"range,":[203],"25-ns":[204],"resolution,":[205],"750-ns":[206],"maximum":[207],"time":[208],"delay,":[209],"138-Vpp":[211],"output":[212],"capabilities.":[213],"total":[215],"die":[216],"size":[217],"417":[219],"mm2.":[220],"An":[221],"ultrasound":[222],"system":[223],"was":[224],"made":[226],"to":[227],"visualize":[228],"2-D/3-D":[229],"phantom":[230],"images":[231],"0.74-mW/ECh":[233],"power":[234],"consumption":[235],"B-mode.":[238]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}