{"id":"https://openalex.org/W2922523972","doi":"https://doi.org/10.1109/jssc.2019.2899720","title":"A Reference-Free Temperature-Dependency-Compensating Readout Scheme for Phase-Change Memory Using Flash-ADC-Configured Sense Amplifiers","display_name":"A Reference-Free Temperature-Dependency-Compensating Readout Scheme for Phase-Change Memory Using Flash-ADC-Configured Sense Amplifiers","publication_year":2019,"publication_date":"2019-03-12","ids":{"openalex":"https://openalex.org/W2922523972","doi":"https://doi.org/10.1109/jssc.2019.2899720","mag":"2922523972"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2019.2899720","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2899720","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100517234","display_name":"Dong-Hwan Jin","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Dong-Hwan Jin","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086784298","display_name":"Ji\u2010Wook Kwon","orcid":"https://orcid.org/0009-0001-7643-1187"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ji-Wook Kwon","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022219380","display_name":"Min-Jae Seo","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min-Jae Seo","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1858-1416","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100743274","display_name":"Mi\u2010Young Kim","orcid":"https://orcid.org/0000-0002-1386-5164"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mi-Young Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002999177","display_name":"Minchul Shin","orcid":"https://orcid.org/0000-0002-4271-754X"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min-Chul Shin","raw_affiliation_strings":["SK Hynix, Icheon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SK Hynix, Icheon, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014452379","display_name":"Seokjoon Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seok-Joon Kang","raw_affiliation_strings":["SK Hynix, Icheon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SK Hynix, Icheon, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060922221","display_name":"Junghyuk Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Hyuk Yoon","raw_affiliation_strings":["SK Hynix, Icheon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SK Hynix, Icheon, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056966977","display_name":"Taek\u2010Seung Kim","orcid":"https://orcid.org/0000-0001-8137-0326"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taek-Seung Kim","raw_affiliation_strings":["SK Hynix, Icheon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SK Hynix, Icheon, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054097644","display_name":"Seung\u2010Tak Ryu","orcid":"https://orcid.org/0000-0002-6947-7785"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Tak Ryu","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6947-7785","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5100517234"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.2753,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.48276359,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"54","issue":"6","first_page":"1812","last_page":"1823"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-adc","display_name":"Flash ADC","score":0.6813750863075256},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.6055858135223389},{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.46148672699928284},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.44016867876052856},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43780073523521423},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4033244848251343},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3847132623195648},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34482577443122864},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32465410232543945},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31893038749694824},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24633485078811646},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2050972878932953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1957869529724121},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.13166198134422302},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.11370015144348145}],"concepts":[{"id":"https://openalex.org/C164862427","wikidata":"https://www.wikidata.org/wiki/Q2744647","display_name":"Flash ADC","level":4,"score":0.6813750863075256},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6055858135223389},{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.46148672699928284},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.44016867876052856},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43780073523521423},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4033244848251343},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3847132623195648},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34482577443122864},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32465410232543945},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31893038749694824},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24633485078811646},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2050972878932953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1957869529724121},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.13166198134422302},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.11370015144348145},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2019.2899720","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2019.2899720","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1557877754","https://openalex.org/W1906827922","https://openalex.org/W1944266867","https://openalex.org/W1969794630","https://openalex.org/W1982935918","https://openalex.org/W1990074482","https://openalex.org/W1999871211","https://openalex.org/W2010795939","https://openalex.org/W2013907282","https://openalex.org/W2070339839","https://openalex.org/W2082084678","https://openalex.org/W2119668988","https://openalex.org/W2147341731","https://openalex.org/W2217008673","https://openalex.org/W2291750097","https://openalex.org/W2526325768","https://openalex.org/W2527099873","https://openalex.org/W2623635728","https://openalex.org/W2743785353","https://openalex.org/W2745070442","https://openalex.org/W2766451573","https://openalex.org/W2789899229","https://openalex.org/W2793776854","https://openalex.org/W6640649388","https://openalex.org/W6677974574","https://openalex.org/W6696814378","https://openalex.org/W6727750276","https://openalex.org/W6748890629"],"related_works":["https://openalex.org/W2148068418","https://openalex.org/W1971435783","https://openalex.org/W2096628438","https://openalex.org/W2210184417","https://openalex.org/W1975543518","https://openalex.org/W2336251849","https://openalex.org/W2986596467","https://openalex.org/W2042323120","https://openalex.org/W2108851272","https://openalex.org/W1513369622"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,80,92,137],"reference-free":[4],"readout":[5,114,141],"method":[6,24],"for":[7,14,44,68,79],"the":[8,15,19,26,40,45,49,52,59,63,72,108],"phase-change":[9],"memory":[10],"(PCM)":[11],"that":[12],"compensates":[13],"temperature":[16,47],"drift":[17],"of":[18,51,58,65,75,85],"cell":[20],"resistance.":[21],"The":[22,56,88],"proposed":[23,89],"reconfigures":[25],"sense":[27],"amplifier":[28],"(SA)":[29],"array":[30],"into":[31],"flash":[32,61,66],"analog-to-digital":[33],"converters":[34],"(ADCs)":[35],"in":[36],"order":[37],"to":[38],"extract":[39],"optimum":[41],"decision":[42],"threshold":[43],"given":[46],"from":[48],"distribution":[50],"data":[53,69],"output":[54],"therefrom.":[55],"resolution":[57],"reconfigured":[60],"ADC,":[62],"number":[64,74],"ADCs":[67],"averaging,":[70],"and":[71,127],"required":[73],"samples":[76],"are":[77],"determined":[78],"target":[81],"bit":[82,93],"error":[83],"rate":[84],"1":[86],"ppm.":[87],"SA":[90],"drives":[91],"line":[94],"(BL)":[95],"rapidly":[96],"with":[97,140],"switchable":[98],"current":[99],"sources.":[100],"A":[101,112],"proof-of-concept":[102],"prototype":[103],"chip":[104],"is":[105],"fabricated":[106],"via":[107],"180-nm":[109],"CMOS":[110],"process.":[111],"single-channel":[113],"path":[115],"occupies":[116],"<inline-formula":[117,129],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[118,130],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[119,131],"<tex-math":[120,132],"notation=\"LaTeX\">$137":[121],"\\times":[122],"27\\,\\,\\mu":[123],"\\text{m}^{\\mathbf":[124],"{2}}$":[125],"</tex-math></inline-formula>":[126,135],"consumes":[128],"notation=\"LaTeX\">$305~\\mu":[133],"\\text{W}$":[134],"under":[136],"3.3-V":[138],"supply,":[139],"latency":[142],"less":[143],"than":[144],"100":[145],"ns.":[146]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-04-29T09:16:38.111599","created_date":"2025-10-10T00:00:00"}