{"id":"https://openalex.org/W2904824693","doi":"https://doi.org/10.1109/jssc.2018.2879942","title":"A 78.5-dB SNDR Radiation- and Metastability-Tolerant Two-Step Split SAR ADC Operating Up to 75 MS/s With 24.9-mW Power Consumption in 65-nm CMOS","display_name":"A 78.5-dB SNDR Radiation- and Metastability-Tolerant Two-Step Split SAR ADC Operating Up to 75 MS/s With 24.9-mW Power Consumption in 65-nm CMOS","publication_year":2018,"publication_date":"2018-12-07","ids":{"openalex":"https://openalex.org/W2904824693","doi":"https://doi.org/10.1109/jssc.2018.2879942","mag":"2904824693"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2018.2879942","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2018.2879942","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059841744","display_name":"Hongda Xu","orcid":"https://orcid.org/0000-0001-8039-967X"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hongda Xu","raw_affiliation_strings":["Texas Analog Center of Excellence, The University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-8039-967X","affiliations":[{"raw_affiliation_string":"Texas Analog Center of Excellence, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101628456","display_name":"Hai Huang","orcid":"https://orcid.org/0000-0003-2368-3775"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hai Huang","raw_affiliation_strings":["Texas Analog Center of Excellence, The University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":"https://orcid.org/0000-0003-2368-3775","affiliations":[{"raw_affiliation_string":"Texas Analog Center of Excellence, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087905293","display_name":"Yongda Cai","orcid":"https://orcid.org/0000-0002-3321-879X"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yongda Cai","raw_affiliation_strings":["Analog Device, Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Device, Milpitas, CA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101883285","display_name":"Ling Du","orcid":"https://orcid.org/0000-0002-7157-2861"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ling Du","raw_affiliation_strings":["Chengdu MECS Microelectronics Technology Co., Ltd., Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-7157-2861","affiliations":[{"raw_affiliation_string":"Chengdu MECS Microelectronics Technology Co., Ltd., Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103085835","display_name":"Yuan Zhou","orcid":"https://orcid.org/0000-0002-7148-9056"},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuan Zhou","raw_affiliation_strings":["Broadcom Inc., Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Broadcom Inc., Irvine, CA, USA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041665556","display_name":"Benwei Xu","orcid":"https://orcid.org/0000-0002-5879-8225"},"institutions":[{"id":"https://openalex.org/I4210153776","display_name":"Apple (United States)","ror":"https://ror.org/059hsda18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153776"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benwei Xu","raw_affiliation_strings":["Apple Inc., Cupertino, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5879-8225","affiliations":[{"raw_affiliation_string":"Apple Inc., Cupertino, CA, USA","institution_ids":["https://openalex.org/I4210153776"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013752771","display_name":"D. Gong","orcid":"https://orcid.org/0000-0002-4890-0900"},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Datao Gong","raw_affiliation_strings":["Physics Department, Southern Methodist University, Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics Department, Southern Methodist University, Dallas, TX, USA","institution_ids":["https://openalex.org/I178169726"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033838297","display_name":"J. Ye","orcid":"https://orcid.org/0000-0001-9274-707X"},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jingbo Ye","raw_affiliation_strings":["Physics Department, Southern Methodist University, Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics Department, Southern Methodist University, Dallas, TX, USA","institution_ids":["https://openalex.org/I178169726"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047697146","display_name":"Yun Chiu","orcid":"https://orcid.org/0000-0001-5239-4417"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yun Chiu","raw_affiliation_strings":["Texas Analog Center of Excellence, The University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Analog Center of Excellence, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5059841744"],"corresponding_institution_ids":["https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":1.3091,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.82186303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"54","issue":"2","first_page":"441","last_page":"451"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.7064339518547058},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.684226930141449},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6556726098060608},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.5209485292434692},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5151978135108948},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5102853775024414},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48751160502433777},{"id":"https://openalex.org/keywords/preamplifier","display_name":"Preamplifier","score":0.48164263367652893},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.44513213634490967},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4317575693130493},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3642948865890503},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.3632147014141083},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30338382720947266},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2276490330696106}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.7064339518547058},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.684226930141449},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6556726098060608},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.5209485292434692},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5151978135108948},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5102853775024414},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48751160502433777},{"id":"https://openalex.org/C14245642","wikidata":"https://www.wikidata.org/wiki/Q399804","display_name":"Preamplifier","level":4,"score":0.48164263367652893},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.44513213634490967},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4317575693130493},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3642948865890503},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.3632147014141083},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30338382720947266},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2276490330696106}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2018.2879942","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2018.2879942","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G8906503654","display_name":null,"funder_award_id":"258086","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320309370","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10"},{"id":"https://openalex.org/F4320321837","display_name":"Ministerio de Econom\u00eda y Competitividad","ror":"https://ror.org/034900433"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1499069039","https://openalex.org/W1974332486","https://openalex.org/W1980767874","https://openalex.org/W1995380717","https://openalex.org/W2008635708","https://openalex.org/W2009718492","https://openalex.org/W2050647397","https://openalex.org/W2061411267","https://openalex.org/W2071761885","https://openalex.org/W2081551815","https://openalex.org/W2091968018","https://openalex.org/W2098406858","https://openalex.org/W2124838096","https://openalex.org/W2128485160","https://openalex.org/W2135751681","https://openalex.org/W2141068710","https://openalex.org/W2143690596","https://openalex.org/W2144216554","https://openalex.org/W2163167175","https://openalex.org/W2171146006","https://openalex.org/W2179257059","https://openalex.org/W2346252403","https://openalex.org/W2520964342","https://openalex.org/W2592081355","https://openalex.org/W2592515961","https://openalex.org/W2744967592","https://openalex.org/W2749655596","https://openalex.org/W2765669248","https://openalex.org/W2779405485","https://openalex.org/W2793785159","https://openalex.org/W3103568513","https://openalex.org/W4211046286","https://openalex.org/W4232091795","https://openalex.org/W4388322949","https://openalex.org/W6743084057","https://openalex.org/W6749820237"],"related_works":["https://openalex.org/W2739351926","https://openalex.org/W2542593952","https://openalex.org/W4387941295","https://openalex.org/W2565946164","https://openalex.org/W2568520569","https://openalex.org/W3116897448","https://openalex.org/W913079732","https://openalex.org/W1980428113","https://openalex.org/W4307567705","https://openalex.org/W2783221760"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,18,25,81,97,111,133,140,200,205],"14-bit":[4],"radiation-":[5],"and":[6,24,114,139,154,162,175,188],"metastability-tolerant":[7],"two-step":[8],"split":[9,78],"successive-approximation":[10],"register":[11],"(SAR)":[12],"analog-to-digital":[13],"converter":[14,136],"(ADC)":[15],"that":[16],"achieves":[17],"78.5-dB":[19],"peak":[20,27],"signal-to-noise-and-distortion":[21],"ratio":[22],"(SNDR)":[23],"103-dB":[26],"spurious-free":[28],"dynamic":[29],"range":[30],"(SFDR)":[31],"at":[32],"35":[33],"MS/s.":[34],"The":[35],"prototype":[36],"operates":[37],"up":[38],"to":[39,66,96,99],"75":[40],"MS/s":[41],"with":[42,129,199],"less":[43],"than":[44],"25-mW":[45],"power":[46],"consumption.":[47],"To":[48],"tolerate":[49],"errors":[50],"originating":[51],"from":[52,62],"radiations":[53],"and/or":[54],"metastability,":[55],"multiple":[56],"redundancy":[57],"techniques":[58,86,109],"are":[59,195],"implemented":[60,196],"hierarchically":[61],"the":[63,67,71,74,77,93,119,167,170,180,184,189,209],"system":[64,72],"level":[65],"circuit":[68],"level.":[69],"At":[70],"level,":[73],"deployment":[75],"of":[76,169,216],"architecture":[79],"plus":[80],"few":[82],"additional":[83],"error":[84,104,127,144],"detection":[85,108,117,128,145],"not":[87],"only":[88],"identify":[89],"but":[90],"also":[91,158],"correct":[92],"errors,":[94],"leading":[95],"p":[98,100],"<sup":[101,219],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[102,220],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[103,221],"rate":[105],"reduction.":[106],"These":[107],"include":[110],"residue":[112,185],"over-":[113],"under":[115],"(OU)-flow":[116],"using":[118,132],"second-stage":[120],"digital":[121,177],"codes,":[122],"an":[123,213],"extra":[124],"bit":[125,142],"(EB)-cycle":[126],"LSB":[130],"repeating":[131],"larger":[134],"digital-to-analog":[135],"(DAC)":[137],"capacitor,":[138],"parity":[141],"(PB)":[143],"for":[146],"on-the-fly":[147],"SAR":[148],"data":[149],"latch":[150],"protection.":[151],"Sub-radix-2":[152],"DAC":[153],"reference":[155,193],"voltage":[156],"scaling":[157],"create":[159],"circuit-level":[160],"intra-":[161],"inter-stage":[163],"redundancy,":[164],"further":[165],"improving":[166],"robustness":[168],"conversion":[171],"process.":[172],"Preamplifier":[173],"sharing":[174],"offset":[176,181],"calibration":[178],"alleviate":[179],"problem":[182],"between":[183],"amplifier":[186],"(RA)":[187],"first-stage":[190],"comparator.":[191],"Two":[192],"buffers":[194],"on":[197],"chip":[198],"1.8-V":[201],"supply.":[202],"Fabricated":[203],"in":[204],"65-nm":[206],"CMOS":[207],"process,":[208],"ADC":[210],"core":[211],"occupies":[212],"active":[214],"area":[215],"0.342":[217],"mm":[218],".":[222]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}