{"id":"https://openalex.org/W2805007705","doi":"https://doi.org/10.1109/jssc.2018.2831231","title":"An Ultra-High Input Impedance Analog Front End Using Self-Calibrated Positive Feedback","display_name":"An Ultra-High Input Impedance Analog Front End Using Self-Calibrated Positive Feedback","publication_year":2018,"publication_date":"2018-05-24","ids":{"openalex":"https://openalex.org/W2805007705","doi":"https://doi.org/10.1109/jssc.2018.2831231","mag":"2805007705"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2018.2831231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2018.2831231","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100746136","display_name":"Jinseok Lee","orcid":"https://orcid.org/0000-0003-4898-4865"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jinseok Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067509361","display_name":"Geon-Hwi Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Geon-Hwi Lee","raw_affiliation_strings":["SK Hynix, Icheon, South Korea"],"affiliations":[{"raw_affiliation_string":"SK Hynix, Icheon, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027218758","display_name":"Hyojun Kim","orcid":"https://orcid.org/0009-0008-5539-1017"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyojun Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040917581","display_name":"SeongHwan Cho","orcid":"https://orcid.org/0000-0001-7938-2694"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SeongHwan Cho","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100746136"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":2.6739,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.89955719,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"53","issue":"8","first_page":"2252","last_page":"2262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5995407700538635},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4782813489437103},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4703766703605652},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4401957094669342},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3988021910190582},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.36737245321273804},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.35629749298095703},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3373459279537201},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.32296812534332275},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.23981881141662598},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21783626079559326},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.2025989294052124},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10024181008338928},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.08823323249816895}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5995407700538635},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4782813489437103},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4703766703605652},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4401957094669342},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3988021910190582},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.36737245321273804},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35629749298095703},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3373459279537201},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.32296812534332275},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.23981881141662598},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21783626079559326},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.2025989294052124},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10024181008338928},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.08823323249816895}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2018.2831231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2018.2831231","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1050315043","display_name":null,"funder_award_id":"NRF-2016M3A7B4910637","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G6869998799","display_name":null,"funder_award_id":"NRF-2015R1A5A1036133","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1963910641","https://openalex.org/W1979679474","https://openalex.org/W1981625867","https://openalex.org/W2003444784","https://openalex.org/W2027087041","https://openalex.org/W2031972897","https://openalex.org/W2047490963","https://openalex.org/W2054043241","https://openalex.org/W2054295738","https://openalex.org/W2122617960","https://openalex.org/W2134351284","https://openalex.org/W2152776190","https://openalex.org/W2163222801","https://openalex.org/W2270130810","https://openalex.org/W2291728831","https://openalex.org/W2477175099","https://openalex.org/W2524158525","https://openalex.org/W2739770034","https://openalex.org/W2801295417","https://openalex.org/W4285719527","https://openalex.org/W6645160235","https://openalex.org/W6645424087","https://openalex.org/W6658479705","https://openalex.org/W6727207854","https://openalex.org/W6741829979"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2347585086","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W1527953837","https://openalex.org/W4386230336","https://openalex.org/W2042100038","https://openalex.org/W4306968100","https://openalex.org/W1966596465","https://openalex.org/W3086500945"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"circuit":[3],"techniques":[4],"for":[5,48],"ultra-high":[6],"input":[7,17,82],"impedance":[8,83],"analog":[9],"front":[10],"end":[11],"(AFE).":[12],"In":[13],"order":[14],"to":[15,96,111],"boost":[16],"impedance,":[18],"various":[19],"on-":[20],"and":[21,31,60],"off-chip":[22],"parasitic":[23],"capacitances":[24],"are":[25],"cancelled":[26],"using":[27,114],"an":[28,81],"active":[29,43],"shield":[30,44],"negative":[32,51],"capacitance":[33],"technique.":[34],"To":[35],"maximize":[36],"the":[37,56],"cancellation,":[38],"a":[39],"self-calibration":[40],"scheme":[41],"with":[42],"replica":[45],"is":[46,109],"proposed":[47,107],"positive":[49],"feedback-based":[50],"capacitance,":[52,98],"which":[53],"settles":[54],"at":[55,92],"boundary":[57],"between":[58],"stable":[59],"unstable":[61],"states":[62],"in":[63,70],"calibration":[64],"mode.":[65],"A":[66],"prototype":[67],"IC":[68],"fabricated":[69],"0.18-":[71],"<inline-formula":[72,86],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[73,87,117],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[74,88],"<tex-math":[75,89],"notation=\"LaTeX\">$\\mu":[76],"\\text{m}$":[77],"</tex-math></inline-formula>":[78,91],"CMOS":[79],"achieves":[80],"of":[84],"50":[85,93],"notation=\"LaTeX\">$\\text{G}\\Omega$":[90],"Hz,":[94],"equivalent":[95],"60-fF":[97],"while":[99],"consuming":[100],"289":[101],"nW":[102],"from":[103],"0.8-V":[104],"supply.":[105],"The":[106],"AFE":[108],"applied":[110],"heart-rate":[112],"monitoring":[113],"1-cm":[115],"<sup":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[118],"dry":[119],"electrodes":[120],"over":[121],"clothes":[122],"without":[123],"any":[124],"straps.":[125]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}