{"id":"https://openalex.org/W2802288775","doi":"https://doi.org/10.1109/jssc.2018.2821121","title":"Margin Elimination Through Timing Error Detection in a Near-Threshold Enabled 32-bit Microcontroller in 40-nm CMOS","display_name":"Margin Elimination Through Timing Error Detection in a Near-Threshold Enabled 32-bit Microcontroller in 40-nm CMOS","publication_year":2018,"publication_date":"2018-04-19","ids":{"openalex":"https://openalex.org/W2802288775","doi":"https://doi.org/10.1109/jssc.2018.2821121","mag":"2802288775"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2018.2821121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2018.2821121","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010848178","display_name":"Hans Reyserhove","orcid":"https://orcid.org/0000-0002-5368-3533"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Hans Reyserhove","raw_affiliation_strings":["Department of Electrical Engineering, KU Leuven, Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076274517","display_name":"Wim Dehaene","orcid":"https://orcid.org/0000-0002-6792-7965"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dehaene","raw_affiliation_strings":["Department of Electrical Engineering, KU Leuven, Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5010848178"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":2.06,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.87504868,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"53","issue":"7","first_page":"2101","last_page":"2113"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7059796452522278},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.6446359157562256},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6352814435958862},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6159335374832153},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6129592061042786},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5394426584243774},{"id":"https://openalex.org/keywords/clock-rate","display_name":"Clock rate","score":0.48257771134376526},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4453507363796234},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4374430477619171},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37431013584136963},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22645071148872375},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17247527837753296},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1254044771194458}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7059796452522278},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.6446359157562256},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6352814435958862},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6159335374832153},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6129592061042786},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5394426584243774},{"id":"https://openalex.org/C178693496","wikidata":"https://www.wikidata.org/wiki/Q911691","display_name":"Clock rate","level":3,"score":0.48257771134376526},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4453507363796234},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4374430477619171},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37431013584136963},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22645071148872375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17247527837753296},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1254044771194458}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2018.2821121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2018.2821121","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/620481","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/620481/1/JSSC18_HR_WD_postprint.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Ieee Journal Of Solid-State Circuits, vol. 53 (7), Art.No. 7, (2101-2113)","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9200000166893005,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1541483005","https://openalex.org/W1901083236","https://openalex.org/W1984996269","https://openalex.org/W2015917466","https://openalex.org/W2017216250","https://openalex.org/W2025340565","https://openalex.org/W2077338724","https://openalex.org/W2082597509","https://openalex.org/W2093234107","https://openalex.org/W2094839871","https://openalex.org/W2095351656","https://openalex.org/W2102587899","https://openalex.org/W2106648230","https://openalex.org/W2112255682","https://openalex.org/W2114578223","https://openalex.org/W2137616964","https://openalex.org/W2152833313","https://openalex.org/W2156667996","https://openalex.org/W2174721295","https://openalex.org/W2178304595","https://openalex.org/W2525832288","https://openalex.org/W2554231239","https://openalex.org/W2609526441","https://openalex.org/W2761878354","https://openalex.org/W2769623465","https://openalex.org/W3144939025","https://openalex.org/W3145262500","https://openalex.org/W6673912491","https://openalex.org/W6746381392"],"related_works":["https://openalex.org/W4221123967","https://openalex.org/W2047736125","https://openalex.org/W2090290079","https://openalex.org/W2772234110","https://openalex.org/W2166386585","https://openalex.org/W1999298172","https://openalex.org/W2116895808","https://openalex.org/W2145822939","https://openalex.org/W2555708492","https://openalex.org/W2802288775"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,23,32,124],"near-threshold":[4],"operating":[5],"voltage":[6,95],"timing":[7,84],"error":[8,17,34,46,74,85],"detecting":[9],"32-bit":[10],"microcontroller":[11,65,72],"system.":[12],"The":[13,56,108,129],"lightweight":[14],"in":[15,53,60,67,81,123],"situ":[16],"detection":[18,30,86],"and":[19,31,88,116],"correction":[20,47],"technique":[21,57],"uses":[22],"soft-edge":[24,54],"flip-flop":[25,90],"combined":[26],"with":[27],"in-latch":[28],"transition":[29],"set-dominant":[33],"latch":[35],"to":[36,113],"detect":[37],"data":[38],"path":[39,78],"transitions":[40],"after":[41],"the":[42,71,103],"clock":[43],"edge.":[44],"Inherent":[45],"is":[48,58],"achieved":[49],"through":[50],"time":[51],"borrowing":[52],"flip-flops.":[55],"implemented":[59],"an":[61,82],"ARM":[62],"Cortex":[63],"M0":[64,109],"system":[66,110],"40-nm":[68],"CMOS,":[69],"rendering":[70],"\u201ctiming":[73],"aware.\u201d":[75],"Automatic":[76],"critical":[77],"analysis":[79],"results":[80],"optimized":[83],"window":[87],"sparse":[89],"replacement.":[91],"An":[92],"autonomous":[93],"dynamic":[94],"scaling":[96],"(DVS)":[97],"loop":[98],"facilitates":[99],"automatic":[100],"operation":[101,135],"at":[102,136],"point":[104],"of":[105],"first":[106],"failure.":[107],"operates":[111],"down":[112],"290":[114],"mV":[115],"achieves":[117],"11-18":[118],"pJ/cycle":[119],"core":[120],"energy":[121],"consumption":[122],"5-30":[125],"MHz":[126],"frequency":[127],"ranges.":[128],"architecture":[130],"profits":[131],"optimally":[132],"from":[133],"ULV":[134],"frequencies":[137],"<;10":[138],"MHz,":[139],"where":[140],"intra-die":[141],"variations":[142],"are":[143],"significant.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}